フォロー
Gerardo T Martinez
Gerardo T Martinez
Imec, Leuven, Belgium
確認したメール アドレス: imec.be
タイトル
引用先
引用先
Procedure to count atoms with trustworthy single-atom sensitivity
S Van Aert, A De Backer, GT Martinez, B Goris, S Bals, G Van Tendeloo, ...
Physical Review B 87 (6), 064107, 2013
1602013
Electron ptychographic microscopy for three-dimensional imaging
S Gao, P Wang, F Zhang, GT Martinez, PD Nellist, X Pan, AI Kirkland
Nature Communications 8 (1), 163, 2017
1252017
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations
A De Backer, GT Martinez, A Rosenauer, S Van Aert
Ultramicroscopy 134, 23-33, 2013
1182013
Correction of non-linear thickness effects in HAADF STEM electron tomography
W Van den Broek, A Rosenauer, B Goris, GT Martinez, S Bals, S Van Aert, ...
Ultramicroscopy 116, 8-12, 2012
1002012
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy
GT Martinez, A Rosenauer, A De Backer, J Verbeeck, S Van Aert
Ultramicroscopy 137, 12-19, 2014
972014
Incommensurate Modulation and Luminescence in the CaGd2(1–x)Eu2x(MoO4)4(1–y)(WO4)4y (0 ≤ x ≤ 1, 0 ≤ y ≤ 1) Red Phosphors
VA Morozov, A Bertha, KW Meert, S Van Rompaey, D Batuk, GT Martinez, ...
Chemistry of Materials 25 (21), 4387-4395, 2013
952013
Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution
H Yang, I MacLaren, L Jones, GT Martinez, M Simson, M Huth, H Ryll, ...
Ultramicroscopy 180, 173-179, 2017
942017
Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography
JG Lozano, GT Martinez, L Jin, PD Nellist, PG Bruce
Nano Letters 18 (11), 6850-6855, 2018
682018
Direct observation of luminescent silver clusters confined in faujasite zeolites
T Altantzis, E Coutino-Gonzalez, W Baekelant, GT Martinez, ...
ACS nano 10 (8), 7604-7611, 2016
672016
First Monolithic Integration of 3D Complementary FET (CFET) on 300mm Wafers
S Subramanian, M Hosseini, T Chiarella, S Sarkar, P Schuddinck, ...
2020 IEEE Symposium on VLSI Technology, 1-2, 2020
632020
Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy
KHW van den Bos, A De Backer, GT Martinez, N Winckelmans, S Bals, ...
Physical review letters 116 (24), 246101, 2016
622016
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
A De Backer, GT Martinez, KE MacArthur, L Jones, A Béché, PD Nellist, ...
Ultramicroscopy 151, 56-61, 2015
602015
High dose efficiency atomic resolution imaging via electron ptychography
TJ Pennycook, GT Martinez, PD Nellist, JC Meyer
Ultramicroscopy 196, 131-135, 2019
542019
Forksheet FETs for Advanced CMOS Scaling: Forksheet-Nanosheet Co-Integration and Dual Work Function Metal Gates at 17nm NP Space
H Mertens, R Ritzenthaler, Y Oniki, B Briggs, BT Chan, A Hikavyy, T Hopf, ...
2021 Symposium on VLSI Technology, 1-2, 2021
482021
Interstitial Boron Atoms in the Palladium Lattice of an Industrial Type of Nanocatalyst: Properties and Structural Modifications
T Chen, I Ellis, TJN Hooper, E Liberti, L Ye, BTW Lo, C O’Leary, ...
Journal of the American Chemical Society 141 (50), 19616-19624, 2019
482019
Contrast transfer and noise considerations in focused-probe electron ptychography
CM O’Leary, GT Martinez, E Liberti, MJ Humphry, AI Kirkland, PD Nellist
Ultramicroscopy, 113189, 2020
462020
Quantitative STEM normalisation: the importance of the electron flux
GT Martinez, L Jones, A De Backer, A Béché, J Verbeeck, S Van Aert, ...
Ultramicroscopy 159, 46-58, 2015
422015
Site occupation of Nb atoms in ternary Ni–Ti–Nb shape memory alloys
H Shi, J Frenzel, GT Martinez, S Van Rompaey, A Bakulin, S Kulkova, ...
Acta materialia 74, 85-95, 2014
422014
Atomic resolution mapping of phonon excitations in STEM-EELS experiments
R Egoavil, N Gauquelin, GT Martinez, S Van Aert, G Van Tendeloo, ...
Ultramicroscopy 147, 1-7, 2014
402014
Advanced electron crystallography through model-based imaging
S Van Aert, A De Backer, GT Martinez, AJ den Dekker, D Van Dyck, ...
IUCrJ 3 (1), 71-83, 2016
382016
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