Giovanna Mura
Giovanna Mura
DIEE University of Cagliari
確認したメール アドレス: diee.unica.it
タイトル引用先
A review on the physical mechanisms that limit the reliability of GaN-based LEDs
M Meneghini, A Tazzoli, G Mura, G Meneghesso, E Zanoni
IEEE Transactions on Electron Devices 57 (1), 108-118, 2009
2402009
Accelerated life test of high brightness light emitting diodes
L Trevisanello, M Meneghini, G Mura, M Vanzi, M Pavesi, G Meneghesso, ...
IEEE Transactions on Device and Materials Reliability 8 (2), 304-311, 2008
1732008
Failure analysis-assisted FMEA
G Cassanelli, G Mura, F Fantini, M Vanzi, B Plano
Microelectronics Reliability 46 (9-11), 1795-1799, 2006
1022006
High temperature electro-optical degradation of InGaN/GaN HBLEDs
M Meneghini, L Trevisanello, C Sanna, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 47 (9-11), 1625-1629, 2007
952007
Are soft breakdown and hard breakdown of ultrathin gate oxides actually different failure mechanisms?
J Suñé, G Mura, E Miranda
IEEE Electron Device Letters 21 (4), 167-169, 2000
862000
Reliability of visible GaN LEDs in plastic package
G Meneghesso, S Levada, E Zanoni, G Scamarcio, G Mura, S Podda, ...
Microelectronics Reliability 43 (9-11), 1737-1742, 2003
672003
Failure Modes and Mechanisms of DC‐Aged GaN LEDs
G Meneghesso, S Levada, E Zanoni, S Podda, G Mura, M Vanzi, ...
physica status solidi (a) 194 (2), 389-392, 2002
652002
Thermal stability analysis of high brightness LED during high temperature and electrical aging
LR Trevisanello, M Meneghini, G Mura, C Sanna, S Buso, G Spiazzi, ...
Seventh International Conference on Solid State Lighting 6669, 666913, 2007
552007
Phosphors for LED-based light sources: Thermal properties and reliability issues
M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (9-10), 2164-2167, 2012
522012
Chip and package-related degradation of high power white LEDs
M Meneghini, M Dal Lago, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (5), 804-812, 2012
402012
Reliability predictions in electronic industrial applications
G Cassanelli, G Mura, F Cesaretti, M Vanzi, F Fantini
Microelectronics Reliability 45 (9-11), 1321-1326, 2005
272005
Sulfur-contamination of high power white LED
G Mura, G Cassanelli, F Fantini, M Vanzi
Microelectronics Reliability 48 (8-9), 1208-1211, 2008
252008
Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis
M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014
222014
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence
M Meneghini, S Carraro, G Meneghesso, N Trivellin, G Mura, F Rossi, ...
Applied Physics Letters 103 (23), 233506, 2013
172013
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis
G Mura, M Vanzi
Microelectronics Reliability 50 (4), 471-478, 2010
162010
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi
E Musu, G Mura, G Ligios, F Delogu
Journal of Alloys and Compounds 576, 80-85, 2013
152013
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology
L Sponton, L Cerati, G Croce, G Mura, S Podda, M Vanzi, G Meneghesso
152002
High brightness InGaN LEDs degradation at high injection current bias
S Levada, M Meneghini, E Zanoni, S Buso, G Spiazzi, G Meneghesso, ...
2006 IEEE International Reliability Physics Symposium Proceedings, 615-616, 2006
132006
Failure analysis of high power white LEDs
G Cassanelli, G Mura, F Fantini, M Vanzi
2008 26th International Conference on Microelectronics, 255-257, 2008
122008
The role of the optical trans-characteristics in laser diode analysis
G Mura, M Vanzi, G Marcello, R Cao
Microelectronics Reliability 53 (9-11), 1538-1542, 2013
102013
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