Contrast-enhanced fusion of multisensor images using subband-decomposed multiscale retinex JH Jang, Y Bae, JB Ra IEEE Transactions on Image Processing 21 (8), 3479-3490, 2012 | 94 | 2012 |
Automatic road extraction from remote sensing images based on a normalized second derivative map Y Bae, WH Lee, Y Choi, YW Jeon, JB Ra IEEE Geoscience and remote sensing letters 12 (9), 1858-1862, 2015 | 37 | 2015 |
Gamut-adaptive correction in color image processing Y Bae, JH Jang, JB Ra 2010 IEEE International Conference on Image Processing, 3597-3600, 2010 | 14 | 2010 |
Optical spectrum augmentation for machine learning powered spectroscopic ellipsometry I Kim, S Gwak, Y Bae, T Jo Optics Express 30 (10), 16909-16920, 2022 | 5 | 2022 |
Machine learning aided profile measurement in high-aspect-ratio nanostructures I Kim, Y Bae, S Gwak, E Kum, T Jo Modeling Aspects in Optical Metrology VIII 11783, 64-71, 2021 | 5 | 2021 |
Multi-sensor image fusion using subband decomposed multiscale retinex JH Jang, Y Bae, JB Ra 2009 16th IEEE International Conference on Image Processing (ICIP), 2177-2180, 2009 | 5 | 2009 |
Fixed Pattern Noise Reduction in Infrared Videos Based on Joint Correction of Gain and Offset SM Kim, YS Bae, JH Jang, JB Ra Journal of the Institute of Electronics Engineers of Korea SP 49 (2), 35-44, 2012 | 4 | 2012 |
Scene-based nonuniformity correction in infrared videos Y Bae, J Lee, JH Lee, JB Ra Visual Information Processing XXI 8399, 137-145, 2012 | 3 | 2012 |
Machine learning aided process control: critical dimension uniformity control of etching process in 1z nm DRAM T Jo, I Choi, D Choi, Y Bae, S Byoun, I Kim, S Lee, C Choi, E Kum, Y Kang, ... Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021 | 1 | 2021 |
Error detection in digital elevation model using a camera image YW Jeon, Y Bae, JB Ra 2013 IEEE International Geoscience and Remote Sensing Symposium-IGARSS, 2517 …, 2013 | 1 | 2013 |
RCWA acceleration for channel-hole structures with a neural network H Ahn, Y Bae, J Song, N Kim, J Ahn, S Jo, W Kim, M Lee Modeling Aspects in Optical Metrology IX 12619, 126-136, 2023 | | 2023 |
Method of training deep learning model for predicting pattern characteristics and method of manufacturing semiconductor device BAE Yoonsung, G Seungho, K Kim, S Byoun, G Song, Y Shin, K Yun, ... US Patent App. 17/245,173, 2022 | | 2022 |
Automatic road extraction from remote sensing images based on a Hessian matrix Y Bae, JH Jang, JB Ra Visual Information Processing XXI 8399, 122-129, 2012 | | 2012 |
Region-based non-rigid registration framework for human body images WH Nam, IJ Ahn, Y Bae, JH Kim, JB Ra International Forum on Medical imaging in Asia, 2012 | | 2012 |
Example-based colorization for gray-scale natural images with gamut-adaptive clipping YS Bae 한국과학기술원, 2010 | | 2010 |