| Large-gap magnetic topological heterostructure formed by subsurface incorporation of a ferromagnetic layer T Hirahara, SV Eremeev, T Shirasawa, Y Okuyama, T Kubo, R Nakanishi, ... Nano letters 17 (6), 3493-3500, 2017 | 176 | 2017 |
| Atomic and Electronic Structure of Ultrathin Bi(111) Films Grown on Substrates: Evidence for a Strain-Induced Topological Phase Transition T Hirahara, N Fukui, T Shirasawa, M Yamada, M Aitani, H Miyazaki, ... Physical review letters 109 (22), 227401, 2012 | 175 | 2012 |
| A weak topological insulator state in quasi-one-dimensional bismuth iodide R Noguchi, T Takahashi, K Kuroda, M Ochi, T Shirasawa, M Sakano, ... Nature 566 (7745), 518-522, 2019 | 171 | 2019 |
| Evidence for a higher-order topological insulator in a three-dimensional material built from van der Waals stacking of bismuth-halide chains R Noguchi, M Kobayashi, Z Jiang, K Kuroda, T Takahashi, Z Xu, D Lee, ... Nature Materials 20 (4), 473-479, 2021 | 140 | 2021 |
| Determination of atomic positions in silicene on Ag (111) by low-energy electron diffraction K Kawahara, T Shirasawa, R Arafune, CL Lin, T Takahashi, M Kawai, ... Surface science 623, 25-28, 2014 | 120 | 2014 |
| Structure determination of multilayer silicene grown on Ag (111) films by electron diffraction: Evidence for Ag segregation at the surface T Shirai, T Shirasawa, T Hirahara, N Fukui, T Takahashi, S Hasegawa Physical Review B 89 (24), 241403, 2014 | 103 | 2014 |
| Epitaxial Silicon Oxynitride Layer on a Surface T Shirasawa, K Hayashi, S Mizuno, S Tanaka, K Nakatsuji, F Komori, ... Physical review letters 98 (13), 136105, 2007 | 78 | 2007 |
| Atomically well-ordered structure at solid electrolyte and electrode interface reduces the interfacial resistance S Shiraki, T Shirasawa, T Suzuki, H Kawasoko, R Shimizu, T Hitosugi ACS applied materials & interfaces 10 (48), 41732-41737, 2018 | 75 | 2018 |
| Fabrication of a novel magnetic topological heterostructure and temperature evolution of its massive Dirac cone T Hirahara, MM Otrokov, TT Sasaki, K Sumida, Y Tomohiro, S Kusaka, ... Nature communications 11 (1), 4821, 2020 | 63 | 2020 |
| Surface relaxation of topological insulators: Influence on the electronic structure N Fukui, T Hirahara, T Shirasawa, T Takahashi, K Kobayashi, ... Physical Review B—Condensed Matter and Materials Physics 85 (11), 115426, 2012 | 55 | 2012 |
| Re-investigation of the Bi-induced Si (111)-(3× 3) surfaces by low-energy electron diffraction T Kuzumaki, T Shirasawa, S Mizuno, N Ueno, H Tochihara, K Sakamoto Surface science 604 (11-12), 1044-1048, 2010 | 47 | 2010 |
| Multibeam x-ray optical system for high-speed tomography W Voegeli, K Kajiwara, H Kudo, T Shirasawa, X Liang, W Yashiro Optica 7 (5), 514-517, 2020 | 39 | 2020 |
| Structure and transport properties of Cu-doped films T Shirasawa, M Sugiki, T Hirahara, M Aitani, T Shirai, S Hasegawa, ... Physical Review B 89 (19), 195311, 2014 | 37 | 2014 |
| Quick measurement of crystal truncation rod profiles in simultaneous multi-wavelength dispersive mode T Matsushita, T Takahashi, T Shirasawa, E Arakawa, H Toyokawa, H Tajiri Journal of Applied Physics 110 (10), 2011 | 34 | 2011 |
| Interface of a Bi(001) film on imaged by surface x-ray diffraction T Shirasawa, M Ohyama, W Voegeli, T Takahashi Physical Review B—Condensed Matter and Materials Physics 84 (7), 075411, 2011 | 34 | 2011 |
| Structural analysis of the c (4× 2) reconstruction in Si (0 0 1) and Ge (0 0 1) surfaces by low-energy electron diffraction T Shirasawa, S Mizuno, H Tochihara Surface science 600 (4), 815-819, 2006 | 31 | 2006 |
| Electron-Beam-Induced Disordering of the Surface Structure T Shirasawa, S Mizuno, H Tochihara Physical review letters 94 (19), 195502, 2005 | 31 | 2005 |
| Structure determination of surfaces at and electron beam effect below studied by low-energy electron diffraction S Mizuno, T Shirasawa, Y Shiraishi, H Tochihara Physical Review B—Condensed Matter and Materials Physics 69 (24), 241306, 2004 | 31 | 2004 |
| Triangular lattice atomic layer of Sn (1× 1) at graphene/SiC (0001) interface S Hayashi, A Visikovskiy, T Kajiwara, T Iimori, T Shirasawa, K Nakastuji, ... Applied Physics Express 11 (1), 015202, 2017 | 29 | 2017 |
| Atomic structure of “multilayer silicene” grown on Ag (111): Dynamical low energy electron diffraction analysis K Kawahara, T Shirasawa, CL Lin, R Nagao, N Tsukahara, T Takahashi, ... Surface Science 651, 70-75, 2016 | 28 | 2016 |
