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Won-Joo (Ryan) Yun
Won-Joo (Ryan) Yun
Corporate VP, Samsung Electronics
Verified email at samsung.com
Title
Cited by
Cited by
Year
A 1.2 V 20 nm 307 GB/s HBM DRAM with at-speed wafer-level IO test scheme and adaptive refresh considering temperature distribution
K Sohn, WJ Yun, R Oh, CS Oh, SY Seo, MS Park, DH Shin, WC Jung, ...
IEEE Journal of Solid-State Circuits 52 (1), 250-260, 2016
952016
18.2 A 1.2 V 20nm 307GB/s HBM DRAM with at-speed wafer-level I/O test scheme and adaptive refresh considering temperature distribution
K Sohn, WJ Yun, R Oh, CS Oh, SY Seo, MS Park, DH Shin, WC Jung, ...
2016 IEEE International Solid-State Circuits Conference (ISSCC), 316-317, 2016
952016
A 3.57 Gb/s/pin Low Jitter All-Digital DLL With Dual DCC Circuit for GDDR3 DRAM in 54-nm CMOS Technology
WJ Yun, HW Lee, D Shin, S Kim
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 19 (9 …, 2011
422011
A 0.1-to-1.5 GHz 4.2 mW all-digital DLL with dual duty-cycle correction circuit and update gear circuit for DRAM in 66nm CMOS technology
WJ Yun, HW Lee, D Shin, SD Kang, JY Yang, HO Lee, DU Lee, S Sim, ...
2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008
412008
DLL circuit and method of controlling the same
DS Shin, H Lee, WJ Yun
US Patent 7,598,783, 2009
372009
DLL circuit having duty cycle correction and method of controlling the same
WJ Yun, HW Lee
US Patent 7,821,310, 2010
322010
Electronic device having a delay locked loop, and memory device having the same
WJ Yun, S Yong
US Patent 9,654,093, 2017
262017
A 7Gb/s/link non-contact memory module for multi-drop bus system using energy-equipartitioned coupled transmission line
WJ Yun, S Nakano, W Mizuhara, A Kosuge, N Miura, H Ishikuro, T Kuroda
2012 IEEE International Solid-State Circuits Conference, 52-54, 2012
252012
Memory device for performing calibration operation
LEE Hyunui, WJ Yun, YU Hye-Seung, ID Song
US Patent 9,870,808, 2018
232018
Delay-locked loop apparatus and delay-locked method
WJ Yun, HW Lee
US Patent 7,560,963, 2009
232009
Delay locked loop apparatus
HWL Won-Joo Yun
US Patent 8,120,397, 2012
20*2012
Data output strobe signal generating circuit and semiconductor memory apparatus having the same
WJ Yun, H Lee
US Patent 7,633,324, 2009
202009
Delay locked loop apparatus
WJ Yun, HW Lee
US Patent 7,830,186, 2010
192010
Semiconductor memory apparatus
HW Lee, WJ Yun
US Patent 7,800,422, 2010
182010
A 1.26 mW/Gbps 8 locking cycles versatile all-digital CDR with TDC combined DLL
Y Urano, WJ Yun, T Kuroda, H Ishikuro
2013 IEEE International Symposium on Circuits and Systems (ISCAS), 1576-1579, 2013
162013
Power-down mode control apparatus and DLL circuit having the same
DSS H.-W. Lee, Won-Joo Yun
US Patent 7,868,673, 2011
16*2011
Semiconductor memory apparatus with a delay locked loop circuit
WJ Yun, H Lee
US Patent 7,605,623, 2009
162009
17.7 A digital DLL with hybrid DCC using 2-step duty error extraction and 180° phase aligner for 2.67 Gb/S/pin 16Gb 4-H stack DDR4 SDRAM with TSVs
WJ Yun, I Song, H Jeoung, H Choi, SH Lee, JB Kim, CW Kim, JH Choi, ...
2015 IEEE International Solid-State Circuits Conference-(ISSCC) Digest of …, 2015
142015
DLL circuit and method of controlling the same
WJ Yun, H Lee
US Patent 7,755,405, 2010
142010
Multi-slew-rate output driver and optimized impedance-calibration circuit for 66nm 3.0 Gb/s/pin DRAM interface
DU Lee, SD Kang, NK Park, HW Lee, YK Choi, JW Lee, SW Kwack, ...
2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008
142008
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