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Sunmi Kim
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Year
Effects of substrate temperature on copper (II) phthalocyanine thin films
E Jungyoon, S Kim, E Lim, K Lee, D Cha, B Friedman
Applied Surface Science 205 (1-4), 274-279, 2003
1452003
Scanning laser THz imaging system
H Murakami, K Serita, Y Maekawa, S Fujiwara, E Matsuda, S Kim, ...
Journal of Physics D: Applied Physics 47 (37), 374007, 2014
612014
Enhanced coherence of all-nitride superconducting qubits epitaxially grown on silicon substrate
S Kim, Hirotaka Terai, Taro Yamashita, ...
Communications Materials 2 (98), 1-7, 2021
562021
Transmission-type laser THz emission microscope using a solid immersion lens
S Kim, H Murakami, M Tonouchi
IEEE Journal of Selected Topics in Quantum Electronics 14 (2), 498-504, 2008
482008
Study on electrical properties of CdS films prepared by chemical pyrolysis deposition
D Cha, S Kim, NK Huang
Materials Science and Engineering: B 106 (1), 63-68, 2004
422004
Near-field radiative nanothermal imaging of nonuniform Joule heating in narrow metal wires
Q Weng, KT Lin, K Yoshida, H Nema, S Komiyama, S Kim, K Hirakawa, ...
Nano Letters 18 (7), 4220-4225, 2018
382018
Backside observation of large-scale integrated circuits with multilayered interconnections using laser terahertz emission microscope
M Yamashita, C Otani, K Kawase, T Matsumoto, K Nikawa, S Kim, ...
Applied Physics Letters 94 (19), 2009
382009
Fiske steps studied by flux-flow resistance oscillation in a narrow stack of junctions
SM Kim, HB Wang, T Hatano, S Urayama, S Kawakami, M Nagao, ...
Physical Review B 72 (14), 140504, 2005
372005
Laser terahertz emission microscope
H Murakami, N Uchida, R Inoue, S Kim, T Kiwa, M Tonouchi
Proceedings of the IEEE 95 (8), 1646-1657, 2007
362007
π phase shifter based on NbN-based ferromagnetic Josephson junction on a silicon substrate
T. Yamashita, S. Kim, H. Kato, W. Qiu, K. Semba, A. Fujimaki, H. Terai
Scientific reports 10, 13687, 2020
292020
Terahertz oscillation in submicron sized intrinsic Josephson junctions
HB Wang, S Urayama, SM Kim, S Arisawa, T Hatano, BY Zhu
Applied physics letters 89 (25), 2006
292006
Two-color detection with charge sensitive infrared phototransistors
S Kim, S Komiyama, T Ueda, T Satoh, Y Kajihara
Applied Physics Letters 107 (18), 2015
272015
THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis
M Yamashita, C Otani, T Matsumoto, Y Midoh, K Miura, K Nakamae, ...
Optics Express 19 (11), 10864-10873, 2011
272011
A high signal-to-noise ratio passive near-field microscope equipped with a helium-free cryostat
KT Lin, S Komiyama, S Kim, K Kawamura, Y Kajihara
Review of Scientific Instruments 88 (1), 2017
242017
Nondestructive high spatial resolution imaging with a 60 GHz near-field scanning millimeter-wave microscope
M Kim, J Kim, H Kim, S Kim, J Yang, H Yoo, S Kim, K Lee, B Friedman
Review of scientific instruments 75 (3), 684-688, 2004
242004
Periodic oscillations of Josephson-vortex flow resistance in oxygen-deficient
M Nagao, S Urayama, SM Kim, HB Wang, KS Yun, Y Takano, T Hatano, ...
Physical Review B 74 (5), 054502, 2006
212006
Shapiro steps observed in annular intrinsic Josephson junctions at low microwave frequencies
HB Wang, SM Kim, S Urayama, M Nagao, T Hatano, S Arisawa, ...
Applied physics letters 88 (6), 2006
192006
Laser THz emission microscope as a novel tool for LSI failure analysis
M Yamashita, C Otani, S Kim, H Murakami, M Tonouchi, T Matsumoto, ...
Microelectronics Reliability 49 (9-11), 1116-1126, 2009
182009
Periodic oscillations, peak-splitting and phase transitions of Josephson vortex flow resistance in
BY Zhu, HB Wang, SM Kim, S Urayama, T Hatano, X Hu
Physical Review B 72 (17), 174514, 2005
182005
Semiconductor inspection device and inspection method
T Matsumoto, Y Aoki, M Tonouchi, H Murakami, S Kim, M Yamashita, ...
US Patent App. 13/061,363, 2011
172011
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Articles 1–20