フォロー
Gun Hee Kim
Gun Hee Kim
Samsung Display
確認したメール アドレス: samsung.com
タイトル
引用先
引用先
Structural, electrical, and optical properties of p-type ZnO thin films with Ag dopant
HS Kang, BD Ahn, JH Kim, GH Kim, SH Lim, HW Chang, SY Lee
Applied Physics Letters 88 (20), 2006
3282006
Effect of indium composition ratio on solution-processed nanocrystalline InGaZnO thin film transistors
GH Kim, B Du Ahn, HS Shin, WH Jeong, HJ Kim, HJ Kim
Applied Physics Letters 94 (23), 2009
2472009
Formation mechanism of solution-processed nanocrystalline InGaZnO thin film as active channel layer in thin-film transistor
GH Kim, HS Shin, B Du Ahn, KH Kim, WJ Park, HJ Kim
Journal of the Electrochemical society 156 (1), H7, 2008
2452008
Inkjet-printed InGaZnO thin film transistor
GH Kim, HS Kim, HS Shin, B Du Ahn, KH Kim, HJ Kim
Thin solid films 517 (14), 4007-4010, 2009
2072009
Investigation of the effects of Mg incorporation into InZnO for high-performance and high-stability solution-processed thin film transistors
GH Kim, WH Jeong, B Du Ahn, HS Shin, HJ Kim, HJ Kim, MK Ryu, ...
Applied Physics Letters 96 (16), 2010
1762010
Synthesis and analysis of Ag-doped ZnO
BD Ahn, HS Kang, JH Kim, GH Kim, HW Chang, SY Lee
Journal of Applied Physics 100 (9), 2006
1742006
Investigation on doping dependency of solution-processed Ga-doped ZnO thin film transistor
WJ Park, HS Shin, BD Ahn, GH Kim, SM Lee, KH Kim, HJ Kim
Applied Physics Letters 93 (8), 2008
1612008
Investigating addition effect of hafnium in InZnO thin film transistors using a solution process
WH Jeong, GH Kim, HS Shin, B Du Ahn, HJ Kim, MK Ryu, KB Park, ...
Applied Physics Letters 96 (9), 2010
1532010
Investigation on the p-type formation mechanism of arsenic doped p-type ZnO thin film
HS Kang, GH Kim, DL Kim, HW Chang, BD Ahn, SY Lee
Applied Physics Letters 89 (18), 2006
1402006
Electrical, structural, and optical properties of ITO thin films prepared at room temperature by pulsed laser deposition
JH Kim, KA Jeon, GH Kim, SY Lee
Applied surface science 252 (13), 4834-4837, 2006
1392006
Electrical characteristics of solution‐processed InGaZnO thin film transistors depending on Ga concentration
GH Kim, WH Jeong, HJ Kim
physica status solidi (a) 207 (7), 1677-1679, 2010
982010
High electrical performance of wet-processed indium zinc oxide thin-film transistors
KB Park, JB Seon, GH Kim, M Yang, B Koo, HJ Kim, MK Ryu, SY Lee
IEEE electron device letters 31 (4), 311-313, 2010
852010
The effect of La in InZnO systems for solution-processed amorphous oxide thin-film transistors
DN Kim, DL Kim, GH Kim, SJ Kim, YS Rim, WH Jeong, HJ Kim
Applied Physics Letters 97 (19), 2010
742010
A novel amorphous InGaZnO thin film transistor structure without source/drain layer deposition
B Du Ahn, HS Shin, GH Kim, JS Park, HJ Kim
Japanese journal of applied physics 48 (3S2), 03B019, 2009
652009
Investigation on doping behavior of copper in ZnO thin film
GH Kim, DL Kim, B Du Ahn, SY Lee, HJ Kim
Microelectronics journal 40 (2), 272-275, 2009
652009
Characteristics of gravure printed InGaZnO thin films as an active channel layer in thin film transistors
Y Choi, GH Kim, WH Jeong, HJ Kim, BD Chin, JW Yu
Thin Solid Films 518 (22), 6249-6252, 2010
642010
Carrier-suppressing effect of scandium in InZnO systems for solution-processed thin film transistors
Y Choi, GH Kim, WH Jeong, JH Bae, HJ Kim, JM Hong, JW Yu
Applied Physics Letters 97 (16), 2010
632010
Electrical properties of yttrium–indium–zinc-oxide thin film transistors fabricated using the sol–gel process and various yttrium compositions
HS Shin, GH Kim, WH Jeong, B Du Ahn, HJ Kim
Japanese journal of applied physics 49 (3S), 03CB01, 2010
522010
Density-of-states modeling of solution-processed InGaZnO thin-film transistors
CE Kim, EN Cho, P Moon, GH Kim, DL Kim, HJ Kim, I Yun
IEEE Electron Device Letters 31 (10), 1131-1133, 2010
472010
Effects of Hf incorporation in solution-processed Hf-InZnO TFTs
WH Jeong, GH Kim, DL Kim, HS Shin, HJ Kim, MK Ryu, KB Park, JB Seon, ...
Thin Solid Films 519 (17), 5740-5743, 2011
442011
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論文 1–20