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Co-authors
- Zheng LiuProfessor, Nanyang Technological UniversityVerified email at ntu.edu.sg
- Shoujun ZhengBeijing Institute of Technology, School of PhysicsVerified email at bit.edu.cn
- Fucai LiuUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
- WEI FUInstitute of Materials Research and Science, A*STARVerified email at imre.a-star.edu.sg
- Jin chuanhongZhejiang UniversityVerified email at zju.edu.cn
- Chung-Che HuangUniversity of SouthamptonVerified email at orc.soton.ac.uk
- Pooi See LeeProfessor, Nanyang Technological UniversityVerified email at ntu.edu.sg
- Hong Jin Fan (范红金)Nanyang Technological UniversityVerified email at ntu.edu.sg
- Jun ZHANG (张俊)Institute of Semiconductors CAS, University of Chinese Academy of Sciences, BeijingVerified email at semi.ac.cn
- Qihua XiongTsinghua UniversityVerified email at tsinghua.edu.cn
- Zhi-Heng LohNanyang Technological UniversityVerified email at ntu.edu.sg
- Hong Li (Colin)Nanyang Technological UniversityVerified email at ntu.edu.sg
- Jer-Lai KuoIAMS, Academia SinicaVerified email at pub.iams.sinica.edu.tw
- Wei Sun LeongMassachusetts Institute of Technology;Verified email at mit.edu
- Xiao GongNational University of SingaporeVerified email at nus.edu.sg
- Chuan Beng TAYAssociate Professor, Singapore Institute of TechnologyVerified email at singaporetech.edu.sg
- Dr. Bablu MukherjeeMicron Technology | NAND Design RuleVerified email at micron.com
- Kwadwo Konadu Ansah-AntwiAlset Integrated Energy Hong Kong LtdVerified email at sunetrike.com
- Tang Jiao HuangA*STARVerified email at hq.a-star.edu.sg
- Dan HewakProfessor of Optoelectronics, University of Southampton