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Jie Feng
Jie Feng
在 wisc.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
First principles design of dye molecules with ullazine donor for dye sensitized solar cells
J Feng, Y Jiao, W Ma, MK Nazeeruddin, M Grätzel, S Meng
The Journal of Physical Chemistry C 117 (8), 3772-3778, 2013
2012013
Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks
C Zhang, J Feng, LR DaCosta, PM Voyles
Ultramicroscopy 210, 112921, 2020
332020
Local Dielectric Breakdown Path along cAxis Planar Boundaries in Cr2O3 Thin Films
C Sun, Z Song, A Rath, M Street, W Echtenkamp, J Feng, C Binek, ...
Advanced Materials Interfaces 4 (20), 1700172, 2017
232017
Bis (pyrazol1yl) methane as NonChromophoric Ancillary Ligand for Charged BisCyclometalated Iridium (III) Complexes
S Meng, I Jung, J Feng, R Scopelliti, D Di Censo, M Grätzel, ...
European Journal of Inorganic Chemistry 2012 (19), 3209-3215, 2012
182012
Reduced interface spin polarization by antiferromagnetically coupled Mn segregated to the /GaAs (001) interface
A Rath, C Sivakumar, C Sun, SJ Patel, JS Jeong, J Feng, G Stecklein, ...
Physical Review B 97 (4), 045304, 2018
142018
Fast approximate STEM image simulations from a machine learning model
AH Combs, JJ Maldonis, J Feng, Z Xu, PM Voyles, D Morgan
Advanced Structural and Chemical Imaging 5, 1-10, 2019
92019
Three-dimensional imaging of single La vacancies in LaMnO3
J Feng, AV Kvit, C Zhang, D Morgan, PM Voyles
Microscopy and Microanalysis 22 (S3), 902-903, 2016
52016
Optimizing nonrigid registration for scanning transmission electron microscopy image series
C Zhang, J Feng, AB Yankovich, A Kvit, B Berkels, PM Voyles
Microscopy and Microanalysis 27 (1), 90-98, 2021
42021
Imaging of Single La Vacancies in LaMnO
J Feng, AV Kvit, C Zhang, J Hoffman, A Bhattacharya, D Morgan, ...
arXiv preprint arXiv:1711.06308, 2017
42017
Bayesian statistical model for imaging of single La vacancies in LaMnO3
J Feng, AV Kvit, C Zhang, D Morgan, PM Voyles
Microscopy and Microanalysis 23 (S1), 1572-1573, 2017
32017
High-precision stress mapping and defect characterization of thin films of LaMnO3grown on DyScO3substrate.
AV Kvit, J Feng, C Zhang, D Morgan, PM Voyles
Microscopy and Microanalysis 22 (S3), 1526-1527, 2016
22016
Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy
J Feng, AV Kvit, AB Yankovich, C Zhang, D Morgan, PM Voyles
Microscopy and Microanalysis 21 (S3), 1887-1888, 2015
22015
Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals
J Feng
The University of Wisconsin-Madison, 2018
12018
Applications of High Precision STEM Imaging to Structurally Complex Materials
J Feng, C Zhang, D Zhou, Z Xu, D Morgan, PM Voyles
Microscopy and Microanalysis 23 (S1), 418-419, 2017
12017
Exposing New Atomicscale Information about Materials by Improving the Quality and Quantifiability of Aberrationcorrected STEM Data
A Yankovich, T Pingel, J Feng, A Kvit, T Slater, S Haigh, D Morgan, ...
European Microscopy Congress 2016: Proceedings, 495-496, 2016
12016
Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3
AV Kvit, J Feng, AB Yankovich, D Morgan, PM Voyles
Microscopy and Microanalysis 21 (S3), 2413-2414, 2015
12015
Dielectric breakdown along c-axis boundaries in magnetoelectric O2O3 for spintronic devices
C Sun, Z Song, M Street, W Echtenkamp, J Feng, C Binek, D Morgan, ...
Microscopy and Microanalysis 23 (S1), 1442-1443, 2017
2017
Revealing new atomic-scale information about materials by improving the quality and quantifiability of aberration-corrected STEM data
AB Yankovich, J Feng, A Kvit, T Slater, S Haigh, D Morgan, PM Voyles
Microscopy and Microanalysis 21 (S3), 2409-2410, 2015
2015
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