Matteo Dal Lago
Matteo Dal Lago
Digimax srl
確認したメール アドレス: digimax.it
タイトル引用先
Phosphors for LED-based light sources: Thermal properties and reliability issues
M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (9-10), 2164-2167, 2012
522012
Thermally activated degradation of remote phosphors for application in LED lighting
M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni
IEEE Transactions on Device and Materials Reliability 13 (1), 316-318, 2012
442012
Chip and package-related degradation of high power white LEDs
M Meneghini, M Dal Lago, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (5), 804-812, 2012
402012
Degradation mechanisms of high-power LEDs for lighting applications: An overview
M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni
IEEE Transactions on Industry Applications 50 (1), 78-85, 2013
342013
Degradation mechanisms of high-power white LEDs activated by current and temperature
M Dal Lago, M Meneghini, N Trivellin, G Meneghesso, E Zanoni
Microelectronics Reliability 51 (9-11), 1742-1746, 2011
192011
Failure causes and mechanisms of retrofit LED lamps
C De Santi, M Dal Lago, M Buffolo, D Monti, M Meneghini, G Meneghesso, ...
Microelectronics Reliability 55 (9-10), 1765-1769, 2015
152015
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress
M Meneghini, M Dal Lago, L Rodighiero, N Trivellin, E Zanoni, ...
Microelectronics Reliability 52 (8), 1621-1626, 2012
132012
“Hot-plugging” of LED modules: Electrical characterization and device degradation
M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 53 (9-11), 1524-1528, 2013
62013
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms
M Dal Lago, M Meneghini, C De Santi, M Barbato, N Trivellin, ...
Microelectronics Reliability 54 (9-10), 2138-2141, 2014
52014
GaN-based LEDs: State of the art and reliability-limiting mechanisms
E Zanoni, M Meneghini, N Trivellin, M Dal Lago, G Meneghesso
2014 15th International Conference on Thermal, Mechanical and Mulit-Physics …, 2014
52014
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements
M Meneghini, S Vaccari, M Dal Lago, S Marconi, M Barbato, N Trivellin, ...
Microelectronics Reliability 54 (6-7), 1143-1149, 2014
32014
Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting
N Trivellin, M Meneghini, M Ferretti, D Barbisan, M Dal Lago, ...
2015 IEEE 1st International Forum on Research and Technologies for Society …, 2015
22015
Characterization and endurance study of aluminate/silicate/garnet/nitride phosphors for high-performance SSL
N Trivellin, M Meneghini, M Dal Lago, D Barbisan, M Ferretti, ...
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2013
12013
A study on the reverse-bias and ESD instabilities of InGaN-based green LEDs
M Meneghini, A Tazzoli, N Trivellin, E Ranzato, M Dal Lago, B Hahn, ...
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2010
12010
Notice of Removal Analysis of the mechanisms limiting the reliability of retrofit LED lamps
C De Santi, M Dal Lago, M Buffolo, M Meneghini, G Meneghesso, ...
2015 IEEE 1st International Forum on Research and Technologies for Society …, 2015
2015
Reliabiltiy of devices and technologies for solid-state lighting
M Dal Lago
Università degli Studi di Padova, 2015
2015
Thermal, optical, and electrical engineering of an innovative tunable white LED light engine
N Trivellin, M Meneghini, M Ferretti, D Barbisan, M Dal Lago, ...
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2014
2014
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements
M Matteo, V Simone, M Dal Lago, M Stefano, B Marco, T Nicola, G Alessio, ...
2014
2013 Index IEEE Transactions on Device and Materials Reliability Vol. 13
C Ababei, PA Agyakwa, R Akkerman, MA Alam, A Alian, CG Almudever, ...
IEEE Transactions on Device and Materials Reliability 13 (4), 537, 2013
2013
Innovative methodology for testing the reliability of LED based systems
N Trivellin, M Meneghini, M Dal Lago, G Meneghesso, E Zanoni
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2012
2012
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