| Single-pulse femtosecond laser ablation of monocrystalline silicon: A modeling and experimental study C Chen, F Zhang, Y Zhang, X Xiong, BF Ju, H Cui, YL Chen Applied Surface Science 576, 151722, 2022 | 23 | 2022 |
| A new method for evaluation of the pitch deviation of a linear scale grating by an optical angle sensor L Quan, Y Shimizu, X Xiong, H Matsukuma, W Gao Precision Engineering 67, 1-13, 2021 | 21 | 2021 |
| Evaluation of the pitch deviation of a linear scale based on a self-calibration method with a Fizeau interferometer X Xiong, H Matsukuma, Y Shimizu, W Gao Measurement Science and Technology 31 (9), 094002, 2020 | 13 | 2020 |
| Self-calibration of Fizeau interferometer and planar scale gratings in Littrow setup X Chen, Y Shimizu, X Xiong, Y Chen, W Gao Optics Express 25 (18), 21567-21582, 2017 | 11 | 2017 |
| Voxelated meniscus-confined electrodeposition of 3D metallic microstructures Y Wang, X Xiong, BF Ju, YL Chen International Journal of Machine Tools and Manufacture 174, 103850, 2022 | 10 | 2022 |
| Uncertainty evaluation for measurements of pitch deviation and out-of-flatness of planar scale gratings by a Fizeau interferometer in Littrow configuration X Xiong, Y Shimizu, X Chen, H Matsukuma, W Gao Applied Sciences 8 (12), 2539, 2018 | 10 | 2018 |
| 3D printing of multi-metallic microstructures by meniscus-confined electrodeposition Y Wang, X Xiong, BF Ju, YL Chen Review of Scientific Instruments 93 (2), 2022 | 8 | 2022 |
| Self-calibration of a variable-line-spacing grating for an absolute optical encoder with a Fizeau interferometer X Xiong, L Quan, Y Shimizu, H Matsukuma, W Gao Measurement Science and Technology 32 (6), 064005, 2021 | 7 | 2021 |
| A self-calibration stitching method for pitch deviation evaluation of a long-range linear scale by using a fizeau interferometer X Xiong, Y Shimizu, H Matsukuma, W Gao Sensors 21 (21), 7412, 2021 | 5 | 2021 |
| Towards obtaining high-quality surfaces with nanometric finish by femtosecond laser ablation: A case study on coppers C Chen, CK Ng, F Zhang, X Xiong, BF Ju, Y Zhang, HN Hansen, YL Chen Optics & Laser Technology 155, 108382, 2022 | 4 | 2022 |
| Implementation and verification of a dual-probe measurement system for geometric form evaluation of a ring-type cylinder X Xiong, P Hu, W Zhang, BF Ju, YL Chen Precision Engineering 74, 290-302, 2022 | 4 | 2022 |
| Self-Calibration of a Large-Scale Variable-Line-Spacing Grating for an Absolute Optical Encoder by Differencing Spatially Shifted Phase Maps from a Fizeau Interferometer X Xiong, C Yin, L Quan, R Sato, H Matsukuma, Y Shimizu, H Tamiya, ... Sensors 22 (23), 9348, 2022 | 3 | 2022 |
| A fiber-based chromatic dispersion probe for simultaneous measurement of dual-axis absolute and relative displacement R Zhao, C Chen, X Xiong, YL Chen, BF Ju Sensors 22 (24), 9906, 2022 | 2 | 2022 |
| A study of cutting tool wear prediction utilizing generalized regression neural network with improved fruit fly optimization L Kang, X Xiong, L Yi, Y Guo 2018 Prognostics and system health management conference (PHM-Chongqing), 1-7, 2018 | 2 | 2018 |
| Accurate inner profile measurement of a high aspect ratio aspheric workpiece using a two-probe measuring system P Hu, X Xiong, WH Zhang, BF Ju, YL Chen Applied Sciences 12 (13), 6628, 2022 | 1 | 2022 |
| Fast evaluation of a linear scale for a linear encoder with a Fizeau interferometer and stitching technique X Xiong, H Matsukuma, X Chen, Y Shimizu, W Gao 2018 IEEE International Conference on Advanced Manufacturing (ICAM), 220-222, 2018 | 1 | 2018 |
| An enhanced chromatic dispersion probe for simultaneous measurement of dual-axis absolute and relative displacement with nanometric resolutions R Zhao, C Chen, X Xiong, YL Chen, BF Ju Measurement Science and Technology 35 (2), 025006, 2023 | | 2023 |
| A Fiber-Based Chromatic Dispersion Probe for Simultaneous Measurement of X-Axis and Z-Axis Displacements with Nanometric Resolutions R Zhao, C Chen, X Xiong, YL Chen, BF Ju Sensors 23 (1), 51, 2022 | | 2022 |
| Study of the Self-calibration Technique with Fizeau Interferometer and a Planar Scale Grating X XIONG, H MATSUKUMA, Y SHIMIZU, W GAO The Proceedings of Conference of Tohoku Branch 2020.55, 131_paper, 2020 | | 2020 |
| STUDY ON THE STITCHIING TECHNIQUE FOR FAST EVALUATION OF THE LINEAR SCALE USINGA FIZEAU INTERFEROMETER X XIONG, H MATSUKUMA, Y SHIMIZU, W GAO The Proceedings of Conference of Tohoku Branch 2019.54, 145, 2019 | | 2019 |
