| Ferromagnetic dislocations in antiferromagnetic NiO I Sugiyama, N Shibata, Z Wang, S Kobayashi, T Yamamoto, Y Ikuhara Nature nanotechnology 8 (4), 266-270, 2013 | 169 | 2013 |
| Atomic structures and oxygen dynamics of CeO2 grain boundaries B Feng, I Sugiyama, H Hojo, H Ohta, N Shibata, Y Ikuhara Scientific reports 6 (1), 20288, 2016 | 84 | 2016 |
| Formation of (W, V) Cx layers at the WC/Co interfaces in the VC-doped WC–Co cemented carbide I Sugiyama, Y Mizumukai, T Taniuchi, K Okada, F Shirase, T Tanase, ... International Journal of Refractory Metals and Hard Materials 30 (1), 185-187, 2012 | 48 | 2012 |
| Three-dimensional morphology of (W, V) Cx in VC-doped WC–Co hard metals I Sugiyama, Y Mizumukai, T Taniuchi, K Okada, F Shirase, T Tanase, ... Scripta Materialia 69 (6), 473-476, 2013 | 35 | 2013 |
| Carbon content dependence of grain growth mode in VC-doped WC–Co hardmetals I Sugiyama, Y Mizumukai, T Taniuchi, K Okada, F Shirase, T Tanase, ... International Journal of Refractory Metals and Hard Materials 52, 245-251, 2015 | 23 | 2015 |
| Blunt corners of WC grains induced by lowering carbon content in WC–12mass% Co cemented carbides I Sugiyama, M Goto, T Taniuchi, F Shirase, T Tanase, K Okada, Y Ikuhara, ... Journal of materials science 46 (12), 4413-4419, 2011 | 18 | 2011 |
| Relative Li-ion mobility mapping in Li0. 33La0. 56TiO3 polycrystalline by electron backscatter diffraction and electrochemical strain microscopy S Sasano, R Ishikawa, I Sugiyama, T Higashi, T Kimura, YH Ikuhara, ... Applied Physics Express 10 (6), 061102, 2017 | 17 | 2017 |
| Fabrication of atomically abrupt interfaces of single-phase TiH2 and Al2O3 R Shimizu, Y Sasahara, H Oguchi, K Yamamoto, I Sugiyama, S Shiraki, ... APL Materials 5 (8), 2017 | 16 | 2017 |
| A nonvolatile memory device with very low power consumption based on the switching of a standard electrode potential I Sugiyama, R Shimizu, T Suzuki, K Yamamoto, H Kawasoko, S Shiraki, ... APL Materials 5 (4), 2017 | 14 | 2017 |
| Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiO I Sugiyama, Y Kim, S Jesse, E Strelcov, A Kumar, A Tselev, EK Rahani, ... Scientific Reports 4 (1), 6725, 2014 | 12 | 2014 |
| Transparent conductive polymer composites obtained via electrostatically assembled carbon nanotubes–poly (methyl methacrylate) composite particles WK Tan, Y Matsubara, A Yokoi, G Kawamura, A Matsuda, I Sugiyama, ... Advanced Powder Technology 33 (4), 103528, 2022 | 11 | 2022 |
| Pulsed laser deposition of oxide thin films by the fifth harmonic of a Nd: Y3Al5O12 (Nd: YAG) laser R Shimizu, I Sugiyama, N Nakamura, S Kobayashi, T Hitosugi AIP Advances 8 (9), 2018 | 6 | 2018 |
| Room-temperature dilute ferromagnetic dislocations in R Ishikawa, Y Shimbo, I Sugiyama, NR Lugg, N Shibata, Y Ikuhara Physical Review B 96 (2), 024440, 2017 | 6 | 2017 |
| Low-energy-consumption three-valued memory device inspired by solid-state batteries Y Watanabe, S Kobayashi, I Sugiyama, K Nishio, W Liu, S Watanabe, ... ACS applied materials & interfaces 11 (48), 45150-45154, 2019 | 5 | 2019 |
| Self-assembly of very-low height/width aspect-ratio Li3Ni2NbO6 disks embedded in Li3NbO4 epitaxial films H Kawasoko, R Shimizu, Y Takagi, K Yamamoto, I Sugiyama, S Shiraki, ... Thin Solid Films 621, 202-206, 2017 | 1 | 2017 |
| Stacking faults in an O2-type cobalt-free lithium-rich layered oxide: mechanisms of the ion exchange reaction and lithium electrochemical (de) intercalation V Saïbi, L Castro, I Sugiyama, S Belin, C Delmas, M Guignard Chemistry of Materials 35 (20), 8540-8550, 2023 | | 2023 |
| Ferromagnetic spin ordering at the dislocations in antiferromagnetic oxide I Sugiyama, N Shibata, Z Wang, T Yamamoto, Y Ikuhara AMTC letters 4, 164-165, 2014 | | 2014 |
| Magnetic property of dislocations in antiferromagnetic NiO single crystalline thin film I Sugiyama, S Kobayashi, N Shibata, Y Ikuhara, T Yamamoto AMTC letters 3, 32-33, 2012 | | 2012 |
| WC/Co Interface Structure in Cemented Carbides doped with VC, NbC and ZrC T Yamamoto, I Sugiyama, Y Yamanaka, T Taniuchi, F Shirase, T Tanase, ... AMTC letters 2, 56-57, 2010 | | 2010 |
Ikuhara YUniverfsity of Tokyo確認したメール アドレス: sigma.t.u-tokyo.ac.jp
