| An Empirical Comparison of Model Validation Techniques for Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering (TSE) 43 (1), 1-18, 2017 | 228 | 2017 |
| Automated Parameter Optimization of Classification Techniques for Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto In Proceedings of The 38th International Conference on Software Engineering …, 2016 | 222 | 2016 |
| Who Should Review My Code? A File Location-Based Code-Reviewer Recommendation Approach for Modern Code Review P Thongtanunam, C Tantithamthavorn, RG Kula, N Yoshida, H Iida, ... In Proceedings of the 22nd IEEE International Conference on Software …, 2015 | 150 | 2015 |
| The Impact of Automated Parameter Optimization on Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering 45 (7), 683-711, 2018 | 90 | 2018 |
| The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models C Tantithamthavorn, S McIntosh, AE Hassan, A Ihara, K Matsumoto In Proceedings of The 37th International Conference on Software Engineering …, 2015 | 87 | 2015 |
| The Impact of Class Rebalancing Techniques on the Performance and Interpretation of Defect Prediction Models C Tantithamthavorn, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering, 2020 | 68 | 2020 |
| An Experience Report on Defect Modelling in Practice: Pitfalls and Challenges C Tantithamthavorn, AE Hassan In Proceedings of the International Conference on Software Engineering (ICSE …, 2018 | 57 | 2018 |
| Using Co-Change Histories to Improve Bug Localization Performance C Tantithamthavorn, A Ihara, K Matsumoto In Proceedings of the 14th IEEE/ACIS International Conference on Software …, 2013 | 38 | 2013 |
| Studying the dialogue between users and developers of free apps in the google play store S Hassan, C Tantithamthavorn, CP Bezemer, AE Hassan Empirical Software Engineering 23 (3), 1275-1312, 2018 | 36 | 2018 |
| Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction" C Tantithamthavorn, S McIntosh, AE Hassan, K Matsumoto IEEE Transactions on Software Engineering (TSE) 42 (11), 1092-1094, 2016 | 36 | 2016 |
| The Impact of Correlated Metrics on the Interpretation of Defect Models J Jiarpakdee, C Tantithamthavorn, AE Hassan IEEE Transactions on Software Engineering, 2019 | 31* | 2019 |
| Towards a better understanding of the impact of experimental components on defect prediction modelling C Tantithamthavorn Proceedings of the 38th International Conference on Software Engineering …, 2016 | 21 | 2016 |
| Mining A Change History to Quickly Identify Bug Locations: A Case Study of the Eclipse Project C Tantithamthavorn, R Teekavanich, A Ihara, K Matsumoto In Proceedings of the 24th IEEE International Symposium on Software …, 2013 | 21 | 2013 |
| A Study of Redundant Metrics in Defect Prediction Datasets J Jiarpakdee, C Tantithamthavorn, A Ihara, K Matsumoto Proceedings of the International Symposium on Software Reliability …, 2016 | 19 | 2016 |
| An Empirical Study of Model-Agnostic Techniques for Defect Prediction Models J Jiarpakdee, C Tantithamthavorn, HK Dam, J Grundy IEEE Transactions on Software Engineering, 2020 | 13 | 2020 |
| Autospearman: Automatically mitigating correlated software metrics for interpreting defect models J Jiarpakdee, C Tantithamthavorn, C Treude 2018 IEEE International Conference on Software Maintenance and Evolution …, 2018 | 13 | 2018 |
| Mining Software Defects: Should We Consider Affected Releases? S Yatish, J Jiarpakdee, P Thongtanunam, C Tantithamthavorn 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE …, 2019 | 12 | 2019 |
| ScottKnottESD: The Scott-Knott Effect Size Difference (ESD) Test C Tantithamthavorn https://cran.r-project.org/web/packages/ScottKnottESD/, 2018 | 11 | 2018 |
| Impact Analysis of Granularity Levels on Feature Location Technique C Tantithamthavorn, A Ihara, H Hata, K Matsumoto Requirements Engineering 432, 135-149, 2014 | 10 | 2014 |
| The impact of IR-based classifier configuration on the performance and the effort of method-level bug localization C Tantithamthavorn, SL Abebe, AE Hassan, A Ihara, K Matsumoto Information and Software Technology 102, 160-174, 2018 | 9 | 2018 |
Kenichi MatsumotoNAISTVerified email at is.naist.jp
