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Arthur Beckers
Arthur Beckers
Verified email at esat.kuleuven.be - Homepage
Title
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Year
An In-Depth and Black-Box Characterization of the Effects of Laser Pulses on ATmega328P
DSV Kumar, A Beckers, J Balasch, B Gierlichs, I Verbauwhede
International Conference on Smart Card Research and Advanced Applications …, 2018
162018
EM Information Security Threats Against RO-Based TRNGs: The Frequency Injection Attack Based on IEMI and EM Information Leakage
S Osuka, D Fujimoto, Y Hayashi, N Homma, A Beckers, J Balasch, ...
IEEE Transactions on Electromagnetic Compatibility 61 (4), 1122-1128, 2018
152018
Design and implementation of a waveform-matching based triggering system
A Beckers, J Balasch, B Gierlichs, I Verbauwhede
International Workshop on Constructive Side-Channel Analysis and Secure …, 2016
142016
Detection of IEMI fault injection using voltage monitor constructed with fully digital circuit
D Fujimoto, Y Hayashi, A Beckers, J Balasch, B Gierlichs, I Verbauwhede
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
92018
Characterization of EM faults on ATmega328P
A Beckers, J Balasch, B Gierlichs, I Verbauwhede, S Osuka, M Kinugawa, ...
International Symposium on Electromagnetic Compatibility. IEEE, 2019
82019
Fault Analysis of the ChaCha and Salsa Families of Stream Ciphers
A Beckers, B Gierlichs, I Verbauwhede
International Conference on Smart Card Research and Advanced Applications …, 2017
72017
Design Considerations for EM Pulse Fault Injection
A Beckers, M Kinugawa, Y Hayashi, D Fujimoto, J Balasch, B Gierlichs, ...
5*
Comparison of two setups for contactless power measurements for side-channel analysis
A Beckers, B Gierlichs, J Balasch, I Verbauwhede
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
32018
Teaching HW/SW codesign with a Zynq ARM/FPGA SoC
J Balasch, A Beckers, D Božilov, SS Roy, F Turan, I Verbauwhede
2018 12th European Workshop on Microelectronics Education (EWME), 63-66, 2018
22018
Fundamental study on non-invasive frequency injection attack against RO-based TRNG
S Osuka, D Fujimoto, Y Hayashi, N Homma, A Beckers, J Balasch, ...
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
12018
Design and Evaluation of a Spark Gap Based EM-fault Injection Setup
A Beckers, M Kinugawa, Y Hayashi, J Balasch, I Verbauwhede
1*
Detection of IEMI against IoT Devices Using Voltage Monitor Constructed by Fully Digital Circuit
D Fujimoto, Y Hayashi, A Beckers, J Balasch, B Gierlichs, I Verbauwhede
International Symposium on Electromagnetic Compatibility, 1-6, 2018
2018
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