| Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si PM Voyles, DA Muller, JL Grazul, PH Citrin, HJL Gossmann Nature 416 (6883), 826-829, 2002 | 531 | 2002 |
| H2V3O8 Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity Q Pang, C Sun, Y Yu, K Zhao, Z Zhang, PM Voyles, G Chen, Y Wei, ... Advanced Energy Materials 8 (19), 1800144, 2018 | 464 | 2018 |
| Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts AB Yankovich, B Berkels, W Dahmen, P Binev, SI Sanchez, SA Bradley, ... Nature communications 5 (1), 4155, 2014 | 312 | 2014 |
| Imaging individual atoms inside crystals with ADF-STEM PM Voyles, JL Grazul, DA Muller Ultramicroscopy 96 (3-4), 251-273, 2003 | 288 | 2003 |
| Stabilization of copper catalysts for liquidphase reactions by atomic layer deposition BJ O'Neill, DHK Jackson, AJ Crisci, CA Farberow, F Shi, AC AlbaRubio, ... Angewandte Chemie 125 (51), 14053-14057, 2013 | 233 | 2013 |
| Morphology and crystallization kinetics in thin films grown by atomic layer deposition MY Ho, H Gong, GD Wilk, BW Busch, ML Green, PM Voyles, DA Muller, ... Journal of Applied Physics 93 (3), 1477-1481, 2003 | 222 | 2003 |
| Nanoscale Structure and Structural Relaxation in Bulk Metallic Glass J Hwang, ZH Melgarejo, YE Kalay, I Kalay, MJ Kramer, DS Stone, ... Physical review letters 108 (19), 195505, 2012 | 211 | 2012 |
| Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2 A Matsumoto, H Kumakura, H Kitaguchi, BJ Senkowicz, MC Jewell, ... Applied physics letters 89 (13), 2006 | 176 | 2006 |
| Fluctuation microscopy in the STEM PM Voyles, DA Muller Ultramicroscopy 93 (2), 147-159, 2002 | 164 | 2002 |
| Highperformance, quantum dot nanocomposites for nonlinear optical and optical gain applications MA Petruska, AV Malko, PM Voyles, VI Klimov Advanced Materials 15 (78), 610-613, 2003 | 153 | 2003 |
| Atom pair persistence in disordered materials from fluctuation microscopy JM Gibson, MMJ Treacy, PM Voyles Ultramicroscopy 83 (3-4), 169-178, 2000 | 153 | 2000 |
| Total reaction and 2n-removal cross sections of 20–60A MeV , , and on Si RE Warner, RA Patty, PM Voyles, A Nadasen, FD Becchetti, JA Brown, ... Physical Review C 54 (4), 1700, 1996 | 151 | 1996 |
| Tm3Fe5O12/Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications A Quindeau, CO Avci, W Liu, C Sun, M Mann, AS Tang, MC Onbasli, ... Advanced Electronic Materials 3 (1), 1600376, 2017 | 145 | 2017 |
| Fast flexible electronics with strained silicon nanomembranes H Zhou, JH Seo, DM Paskiewicz, Y Zhu, GK Celler, PM Voyles, W Zhou, ... Scientific reports 3 (1), 1291, 2013 | 142 | 2013 |
| Quantitative measurement of density in a shear band of metallic glass monitored along its propagation direction V Schmidt, H Rösner, M Peterlechner, G Wilde, PM Voyles Physical review letters 115 (3), 035501, 2015 | 132 | 2015 |
| Fluctuation microscopy: a probe of atomic correlations in disordered materials PM Voyles, JM Gibson, MMJ Treacy Microscopy 49 (2), 259-266, 2000 | 132 | 2000 |
| Influence of film composition in quaternary Heusler alloy Co2 (Mn, Fe) Si thin films on tunnelling magnetoresistance of Co2 (Mn, Fe) Si/MgO-based magnetic tunnel junctions H Liu, T Kawami, K Moges, T Uemura, M Yamamoto, F Shi, PM Voyles Journal of Physics D: Applied Physics 48 (16), 164001, 2015 | 130 | 2015 |
| Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy WG Stratton, J Hamann, JH Perepezko, PM Voyles, X Mao, SV Khare Applied Physics Letters 86 (14), 2005 | 130 | 2005 |
| Structure and physical properties of paracrystalline atomistic models of amorphous silicon PM Voyles, N Zotov, SM Nakhmanson, DA Drabold, JM Gibson, ... Journal of Applied Physics 90 (9), 4437-4451, 2001 | 123 | 2001 |
| Medium-range order in amorphous silicon measured by fluctuation electron microscopy PM Voyles, JR Abelson Solar energy materials and solar cells 78 (1-4), 85-113, 2003 | 118 | 2003 |
