Ying-Jen Chen
Cited by
Cited by
A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
CF Chien, SC Hsu, YJ Chen
International Journal of Production Research 51 (8), 2324-2338, 2013
Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0
M Khakifirooz, CF Chien, YJ Chen
Applied Soft Computing 68, 990-999, 2018
Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller
CF Chien, YJ Chen, CY Hsu, HK Wang
IEEE Transactions on Automation Science and Engineering 11 (2), 473-484, 2014
Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing
YJ Chen, CY Fan, KH Chang
Computers & Industrial Engineering 99, 465-473, 2016
A Novel Approach to Hedge and Compensate the Critical Dimension Variation of the Developed-and-Etched Circuit Patterns for Yield Enhancement in Semiconductor Manufacturing
CF Chien, YJ Chen, CY Hsu
Computers & Operations Research, 2014
An empirical study of demand forecasting of non-volatile memory for smart production of semiconductor manufacturing
YJ Chen, CF Chien
International Journal of Production Research 56 (13), 4629-4643, 2018
Method of defect image classification through integrating image analysis and data mining
K Chang, C Chien, Y Chen
US Patent 9,082,009, 2015
Feature extraction for defect classification and yield enhancement in color filter and micro-lens manufacturing: An empirical study
YJ Chen, TH Lin, KH Chang, CF Chien
Journal of Industrial and Production Engineering 30 (8), 510-517, 2013
AI and big data analytics for wafer fab energy saving and chiller optimization to empower intelligent manufacturing
CF Chien, YJ Chen, YT Han, MK Hsieh, CM Lee, T Shih, MY Wu, ...
2018 e-Manufacturing & Design Collaboration Symposium (eMDC), 1-4, 2018
Big data analytics for modeling WAT parameter variation induced by process tool in semiconductor manufacturing and empirical study
CF Chien, YJ Chen, JZ Wu
2016 Winter Simulation Conference (WSC), 2512-2522, 2016
Method of dispatching semiconductor batch production
C Chien, C Hsu, Y Chen
US Patent 9,513,626, 2016
Manufacturing intelligence and smart production for industry 3.5 and empirical study of decision-based virtual metrology for controlling overlay errors
CF Chien, YJ Chen
2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 1-4, 2016
Big data analytic for multivariate fault detection and classification in semiconductor manufacturing
YJ Chen, BC Wang, JZ Wu, YC Wu, CF Chien
2017 13th IEEE Conference on Automation Science and Engineering (CASE), 731-736, 2017
Modeling collinear WATs for parametric yield enhancement in semiconductor manufacturing
CF Chien, PC Lee, R Dou, YJ Chen, CC Chen
2017 13th IEEE Conference on Automation Science and Engineering (CASE), 739-743, 2017
Advanced Process Control for Semiconductor Yield Enhancement and Manufacturing Intelligence
YJ Chen, CY Hsu, CF Chien
Proceedings of 12th Asia Pacific Industrial Engineering & Management Systems …, 2011
清華大學工業工程與工程管理學系學位論文, 1-102, 2013
Manufacturing intelligence for determining machine subgroups to enhance yield in semiconductor manufacturning
CF Chien, YJ Chen, CY Hsu, YH Yeh
Proceedings of the 2011 Winter Simulation Conference (WSC), 1893-1902, 2011
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