フォロー
Chengfu Ma (马成福)
タイトル
引用先
引用先
Detection of subsurface cavity structures using contact-resonance atomic force microscopy
C Ma, Y Chen, W Arnold, J Chu
Journal of Applied Physics 121 (15), 154301, 2017
372017
Nanoscale ultrasonic subsurface imaging with atomic force microscopy
C Ma, W Arnold
Journal of Applied Physics 128 (18), 180901, 2020
222020
Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale
C Ma, W Wang, Y Chen, W Arnold, J Chu
Journal of Applied Physics 126 (12), 124302, 2019
172019
Subsurface imaging of flexible circuits via contact resonance atomic force microscopy
W Wang, C Ma, Y Chen, L Zheng, H Liu, J Chu
Beilstein Journal of Nanotechnology 10 (1), 1636-1647, 2019
172019
16 nm-resolution lithography using ultra-small-gap bowtie apertures
Y Chen, J Qin, J Chen, L Zhang, C Ma, J Chu, X Xu, L Wang
Nanotechnology 28 (5), 055302, 2016
172016
Visualizing subsurface defects in graphite by acoustic atomic force microscopy
T Wang, C Ma, W Hu, Y Chen, J Chu
Microscopy research and technique 80 (1), 66-74, 2017
142017
Image contrast reversals in contact resonance atomic force microscopy
C Ma, Y Chen, T Wang
AIP Advances 5 (2), 027116, 2015
132015
Binary coded cantilevers for enhancing multi-harmonic atomic force microscopy
Y Hou, C Ma, W Wang, Y Chen
Sensors and Actuators A: Physical 300, 111668, 2019
112019
Measuring stiffness and residual stress of thin films by contact resonance atomic force microscopy
C Ma, Y Chen, J Chen, J Chu
Applied Physics Express 9 (11), 116601, 2016
102016
Effects of temperature and humidity on atomic force microscopy dimensional measurement
T Wang, C Ma, Y Chen, J Chu, W Huang
Microscopy research and technique 78 (7), 562-568, 2015
92015
Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation
W Huang, C Ma, Y Chen
Optical Engineering 53 (12), 124103, 2014
92014
A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever
Y Hou, C Ma, W Wang, Y Chen
Nano Research 14 (11), 3848-3853, 2021
82021
Thermal noise in contact atomic force microscopy
C Ma, C Zhou, J Peng, Y Chen, W Arnold, J Chu
Journal of Applied Physics 129 (23), 234303, 2021
72021
Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy
Y Hou, G Wang, C Ma, Z Feng, Y Chen, T Filleter
Materials Characterization 193, 112313, 2022
62022
Universal aspects of sonolubrication in amorphous and crystalline materials
V Pfahl, C Ma, W Arnold, K Samwer
Journal of Applied Physics 123 (3), 035301, 2018
62018
Time-dependent pinning of nanoblisters confined by two-dimensional sheets. Part 2: contact line pinning
C Ma, Y Chen, J Chu
Langmuir 39 (2), 709-716, 2023
52023
Stick-to-sliding transition in contact-resonance atomic force microscopy
C Ma, V Pfahl, Z Wang, Y Chen, J Chu, MK Phani, A Kumar, W Arnold, ...
Applied Physics Letters 113 (8), 083102, 2018
52018
Atomic force microscopy force‐distance curves with small amplitude ultrasonic modulation
C Ma, Y Chen, T Wang, J Chu
Scanning 37 (4), 284-293, 2015
52015
Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy
Y Chen, T Luo, C Ma, W Huang, S Gao
Microscopy and Microanalysis 20 (6), 1682-1691, 2014
52014
Time-dependent pinning of nanoblisters confined by two-dimensional sheets. Part 1: scaling law and hydrostatic pressure
C Ma, Y Chen, J Chu
Langmuir 39 (2), 701-708, 2023
42023
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論文 1–20