Detection of subsurface cavity structures using contact-resonance atomic force microscopy C Ma, Y Chen, W Arnold, J Chu Journal of Applied Physics 121 (15), 154301, 2017 | 40 | 2017 |
Nanoscale ultrasonic subsurface imaging with atomic force microscopy C Ma, W Arnold Journal of Applied Physics 128 (18), 180901, 2020 | 28 | 2020 |
Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale C Ma, W Wang, Y Chen, W Arnold, J Chu Journal of Applied Physics 126 (12), 124302, 2019 | 21 | 2019 |
Subsurface imaging of flexible circuits via contact resonance atomic force microscopy W Wang, C Ma, Y Chen, L Zheng, H Liu, J Chu Beilstein Journal of Nanotechnology 10 (1), 1636-1647, 2019 | 19 | 2019 |
16 nm-resolution lithography using ultra-small-gap bowtie apertures Y Chen, J Qin, J Chen, L Zhang, C Ma, J Chu, X Xu, L Wang Nanotechnology 28 (5), 055302, 2016 | 18 | 2016 |
Visualizing subsurface defects in graphite by acoustic atomic force microscopy T Wang, C Ma, W Hu, Y Chen, J Chu Microscopy research and technique 80 (1), 66-74, 2017 | 14 | 2017 |
Effects of temperature and humidity on atomic force microscopy dimensional measurement T Wang, C Ma, Y Chen, J Chu, W Huang Microscopy research and technique 78 (7), 562-568, 2015 | 14 | 2015 |
Thermal noise in contact atomic force microscopy C Ma, C Zhou, J Peng, Y Chen, W Arnold, J Chu Journal of Applied Physics 129 (23), 234303, 2021 | 13 | 2021 |
Image contrast reversals in contact resonance atomic force microscopy C Ma, Y Chen, T Wang AIP Advances 5 (2), 027116, 2015 | 13 | 2015 |
Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy Y Hou, G Wang, C Ma, Z Feng, Y Chen, T Filleter Materials Characterization 193, 112313, 2022 | 12 | 2022 |
Stick-to-sliding transition in contact-resonance atomic force microscopy C Ma, V Pfahl, Z Wang, Y Chen, J Chu, MK Phani, A Kumar, W Arnold, ... Applied Physics Letters 113 (8), 083102, 2018 | 12 | 2018 |
Measuring stiffness and residual stress of thin films by contact resonance atomic force microscopy C Ma, Y Chen, J Chen, J Chu Applied Physics Express 9 (11), 116601, 2016 | 12 | 2016 |
Binary coded cantilevers for enhancing multi-harmonic atomic force microscopy Y Hou, C Ma, W Wang, Y Chen Sensors and Actuators A: Physical 300, 111668, 2019 | 11 | 2019 |
Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation W Huang, C Ma, Y Chen Optical Engineering 53 (12), 124103, 2014 | 10 | 2014 |
A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever Y Hou, C Ma, W Wang, Y Chen Nano Research 14 (11), 3848-3853, 2021 | 8 | 2021 |
Universal aspects of sonolubrication in amorphous and crystalline materials V Pfahl, C Ma, W Arnold, K Samwer Journal of Applied Physics 123 (3), 035301, 2018 | 7 | 2018 |
Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy Y Chen, T Luo, C Ma, W Huang, S Gao Microscopy and Microanalysis 20 (6), 1682-1691, 2014 | 6 | 2014 |
Time-dependent pinning of nanoblisters confined by two-dimensional sheets. Part 1: scaling law and hydrostatic pressure C Ma, Y Chen, J Chu Langmuir 39 (2), 701-708, 2023 | 5 | 2023 |
Time-dependent pinning of nanoblisters confined by two-dimensional sheets. Part 2: contact line pinning C Ma, Y Chen, J Chu Langmuir 39 (2), 709-716, 2023 | 5 | 2023 |
Atomic force microscopy force‐distance curves with small amplitude ultrasonic modulation C Ma, Y Chen, T Wang, J Chu Scanning 37 (4), 284-293, 2015 | 5 | 2015 |