David J Frank
David J Frank
IBM Watson Research Center
確認したメール アドレス: us.ibm.com
タイトル
引用先
引用先
Device scaling limits of Si MOSFETs and their application dependencies
DJ Frank, RH Dennard, E Nowak, PM Solomon, Y Taur, HSP Wong
Proceedings of the IEEE 89 (3), 259-288, 2001
15942001
CMOS scaling into the nanometer regime
Y Taur, D Buchanan, W Chen, DJ Frank, KE Ismail, SH Lo, G Sai-Halasz, ...
Proceedings of the IEEE 85 (4), 486-504, 1997
11131997
Three-dimensional integrated circuits
AW Topol, DC La Tulipe, L Shi, DJ Frank, K Bernstein, SE Steen, A Kumar, ...
IBM Journal of Research and Development 50 (4.5), 491-506, 2006
7742006
High-performance CMOS variability in the 65-nm regime and beyond
K Bernstein, DJ Frank, AE Gattiker, W Haensch, BL Ji, SR Nassif, ...
IBM journal of research and development 50 (4.5), 433-449, 2006
6372006
Nanoscale cmos
HSP Wong, DJ Frank, PM Solomon, CHJ Wann, JJ Welser
Proceedings of the IEEE 87 (4), 537-570, 1999
6221999
Quasi-one-dimensional electron states in a split-gate GaAs/AlGaAs heterostructure
SE Laux, DJ Frank, F Stern
Surface Science 196 (1), 101-106, 1988
4451988
Device design considerations for double-gate, ground-plane, and single-gated ultra-thin SOI MOSFET's at the 25 nm channel length generation
HSP Wong, DJ Frank, PM Solomon
International Electron Devices Meeting 1998. Technical Digest (Cat. No …, 1998
4001998
Monte Carlo simulation of a 30 nm dual-gate MOSFET: How short can Si go?
DJ Frank, SE Laux, MV Fischetti
Electron Devices Meeting, 1992. IEDM'92. Technical Digest., International …, 1992
3931992
25 nm CMOS design considerations
Y Taur, CH Wann, DJ Frank
International Electron Devices Meeting 1998. Technical Digest (Cat. No …, 1998
3491998
Generalized scale length for two-dimensional effects in MOSFETs
DJ Frank, Y Taur, HSP Wong
Electron Device Letters, IEEE 19 (10), 385-387, 1998
3461998
Highly efficient algorithm for percolative transport studies in two dimensions
DJ Frank, CJ Lobb
Physical Review B 37 (1), 302, 1988
3001988
Power-constrained CMOS scaling limits
DJ Frank
IBM Journal of Research and Development 46 (2.3), 235-244, 2002
2662002
EMPIRICAL FIT TO BAND DISCONTINUITIES AND BARRIER HEIGHTS IN III-V ALLOY SYSTEMS-REPLY
S TIWARI, DJ FRANK
APPLIED PHYSICS LETTERS 61 (18), 2244-2244, 1992
255*1992
Empirical fit to band discontinuities and barrier heights in III–V alloy systems
S Tiwari, DJ Frank
Applied physics letters 60 (5), 630-632, 1992
2551992
Monte Carlo modeling of threshold variation due to dopant fluctuations
DJ Frank, Y Taur, M Ieong, HSP Wong
1999 Symposium on VLSI Circuits. Digest of Papers (IEEE Cat. No. 99CH36326 …, 1999
2181999
Enabling SOI-based assembly technology for three-dimensional (3D) integrated circuits (ICs)
AW Topol, DC La Tulipe, L Shi, SM Alam, DJ Frank, SE Steen, J Vichiconti, ...
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest …, 2005
2162005
New phenomena in coupled transport between 2D and 3D electron-gas layers
PM Solomon, PJ Price, DJ Frank, DC La Tulipe
Physical review letters 63 (22), 2508, 1989
2111989
Toward High-performance digital logic technology with carbon nanotubes
GS Tulevski, AD Franklin, D Frank, JM Lobez, Q Cao, H Park, A Afzali, ...
ACS nano 8 (9), 8730-8745, 2014
2032014
Switching of ferroelectric polarization in epitaxial BaTiO3 films on silicon without a conducting bottom electrode
C Dubourdieu, J Bruley, TM Arruda, A Posadas, J Jordan-Sweet, ...
Nature nanotechnology 8 (10), 748, 2013
2032013
Practical strategies for power-efficient computing technologies
L Chang, DJ Frank, RK Montoye, SJ Koester, BL Ji, PW Coteus, ...
Proceedings of the IEEE 98 (2), 215-236, 2010
2012010
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