Krzysztof (Krys) Kamieniecki
Krzysztof (Krys) Kamieniecki
Technical Fellow, Passport Systems, Inc.
確認したメール アドレス: kamieniecki.com
タイトル
引用先
引用先
Method and apparatus for simulating a surface photo-voltage in a substrate
E Kamieniecki, KE Kamieniecki, JL Sauer, J Butkiewicz
US Patent 6,388,455, 2002
422002
Network algorithms for detection of radiation sources
NSV Rao, S Sen, NJ Prins, DA Cooper, RJ Ledoux, JB Costales, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2015
292015
Spectral segmentation for optimized sensitivity and computation in advanced radiation detectors
DA Cooper, JB Costales, KE Kamieniecki, AV Klimenko, RJ Ledoux, ...
US Patent App. 10/132,943, 2018
17*2018
Intelligent radiation sensor system (irss) advanced technology demonstrator (atd)
DA Cooper, RJ Ledoux, K Kamieniecki, SE Korbly, J Thompson, ...
2012 IEEE Conference on Technologies for Homeland Security (HST), 511-516, 2012
162012
Integration of inertial measurement data for improved localization and tracking of radiation sources
DA Cooper, RJ Ledoux, K Kamieniecki, SE Korbly, J Thompson, ...
2013 IEEE International Conference on Technologies for Homeland Security …, 2013
32013
Advanced algorithm development for detection, tracking, and identification of vehicle-borne radiation sources in a multi-sensor, distributed testbed
DA Cooper, RJ Ledoux, K Kamieniecki, SE Korbly, J Costales, R Niyazov, ...
2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC …, 2015
22015
Injection of simulated sources in a system of networked sensors
DA Cooper, JB Costales, KE Kamieniecki, RJ Ledoux, JK Thompson, ...
US Patent 10,579,747, 2020
12020
Methods and systems for detecting a material source using a server and networked sensors
DA Cooper, JB Costales, KE Kamieniecki, RJ Ledoux, JK Thompson, ...
US Patent 10,212,231, 2019
2019
Spectral segmentation for optimized sensitivity and computation in advanced radiation detectors
DA Cooper, JB Costales, KE Kamieniecki, AV Klimenko, RJ Ledoux, ...
US Patent 10,132,943, 2018
2018
Apparatus and method for handling and testing of wafers
E Kamieniecki, J Sauer, J Fleming, K Kamieniecki, C LeMay
US Patent App. 09/915,200, 2002
2002
SUPPLEMENT NO. 6: APRIL 2013
JA Martinez-Lorenzo, Y Rodriguez-Vaqueiro, C Rappaport, OR Lopez, ...
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