Melanie Ooi
Melanie Ooi
Associate Professor, University of Waikato
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Real-time Malaysian sign language translation using colour segmentation and neural network
R Akmeliawati, MPL Ooi, YC Kuang
2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 1-6, 2007
Low-cost microcontroller-based hover control design of a quadcopter
BTM Leong, SM Low, MPL Ooi
Procedia Engineering 41, 458-464, 2012
Reducing burn-in time through high-voltage stress test and Weibull statistical analysis
MF Zakaria, ZA Kassim, MPL Ooi, S Demidenko
IEEE Design & Test of computers 23 (2), 88-98, 2006
Multivariate alternating decision trees
HK Sok, MPL Ooi, YC Kuang, S Demidenko
Pattern Recognition 50, 195-209, 2016
Shortening burn-in test: Application of HVST and Weibull statistical analysis
MPL Ooi, ZA Kassim, SN Demidenko
IEEE Transactions on instrumentation and measurement 56 (3), 990-999, 2007
Defect cluster recognition system for fabricated semiconductor wafers
MPL Ooi, HK Sok, YC Kuang, S Demidenko, C Chan
Engineering Applications of Artificial Intelligence 26 (3), 1029-1043, 2013
Choice of rainfall inputs for event-based rainfall-runoff modeling in a catchment with multiple rainfall stations using data-driven techniques
TK Chang, A Talei, S Alaghmand, MPL Ooi
Journal of Hydrology 545, 100-108, 2017
Hardware implementation for face detection on Xilinx Virtex-II FPGA using the reversible component transformation colour space
Third IEEE International Workshop on Electronic Design, Test and …, 2006
Standard uncertainty evaluation of multivariate polynomial
YC Kuang, A Rajan, MPL Ooi, TC Ong
Measurement 58, 483-494, 2014
Analytical standard uncertainty evaluation using Mellin transform
A Rajan, MPL Ooi, YC Kuang, SN Demidenko
IEEE Access 3, 209-222, 2015
Getting more from the semiconductor test: Data mining with defect-cluster extraction
MPL Ooi, EKJ Joo, YC Kuang, S Demidenko, L Kleeman, CWK Chan
IEEE Transactions on Instrumentation and Measurement 60 (10), 3300-3317, 2011
Benchmark test distributions for expanded uncertainty evaluation algorithms
A Rajan, YC Kuang, MPL Ooi, SN Demidenko
IEEE Transactions on Instrumentation and Measurement 65 (5), 1022-1034, 2015
The fourth industrial revolution-Industry 4.0 and IoT [Trends in Future I&M]
F Griffiths, M Ooi
IEEE Instrumentation & Measurement Magazine 21 (6), 29-43, 2018
Reliability-based design optimisation of technical systems: Analytical response surface moments method
A Rajan, MPL Ooi, YC Kuang, SN Demidenko
The Journal of Engineering 2017 (3), 36-46, 2017
Statistical measures of two dimensional point set uniformity
MS Ong, YC Kuang, MPL Ooi
Computational Statistics & Data Analysis 56 (6), 2159-2181, 2012
Automated visual inspection system for mass production of hard disk drive media
ZS Chow, MPL Ooi, YC Kuang, S Demidenko
Procedia Engineering 41, 450-457, 2012
Evaluating the performance of different classification algorithms for fabricated semiconductor wafers
JW Cheng, MPL Ooi, C Chan, YC Kuang, S Demidenko
2010 Fifth IEEE International Symposium on Electronic Design, Test …, 2010
Towards real-time sign language analysis via markerless gesture tracking
R Akmeliawati, F Dadgostar, S Demidenko, N Gamage, YC Kuang, ...
2009 IEEE Instrumentation and Measurement Technology Conference, 1200-1204, 2009
A simulation-based probabilistic framework for lithium-ion battery modelling
A Rajan, V Vijayaraghavan, MPL Ooi, A Garg, YC Kuang
Measurement 115, 87-94, 2018
Sparse alternating decision tree
HK Sok, MPL Ooi, YC Kuang
Pattern Recognition Letters 60, 57-64, 2015
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