フォロー
Joohwi Lee
Joohwi Lee
Toyota Central R&D Lab., Inc.
確認したメール アドレス: mosk.tytlabs.co.jp
タイトル
引用先
引用先
Prediction model of band gap for inorganic compounds by combination of density functional theory calculations and machine learning techniques
J Lee, A Seko, K Shitara, K Nakayama, I Tanaka
Physical Review B 93 (11), 115104, 2016
3482016
Free-electron creation at the 60° twin boundary in Bi2Te3
KC Kim, J Lee, BK Kim, WY Choi, HJ Chang, SO Won, B Kwon, SK Kim, ...
Nature communications 7, 12449, 2016
722016
Transfer learning for materials informatics using crystal graph convolutional neural network
J Lee, R Asahi
Computational Materials Science 190, 110314, 2021
522021
Improved growth and electrical properties of atomic-layer-deposited metal-oxide film by discrete feeding method of metal precursor
TJ Park, JH Kim, JH Jang, UK Kim, SY Lee, J Lee, HS Jung, CS Hwang
Chemistry of Materials 23 (7), 1654-1658, 2011
362011
Growth, quantitative growth analysis, and applications of graphene on γ-Al2O3 catalysts
J Park, J Lee, JH Choi, DK Hwang, YW Song
Scientific reports 5, 11839, 2015
322015
Theoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films
J Lee, DY Cho, J Jung, U Ki Kim, S Ho Rha, C Seong Hwang, JH Choi
Applied Physics Letters 102 (24), 242111, 2013
292013
Study on the defects in metal–organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysis
UK Kim, SH Rha, JH Kim, YJ Chung, J Jung, ES Hwang, J Lee, TJ Park, ...
Journal of Materials Chemistry C 1 (40), 6695-6702, 2013
272013
Thermodynamic stability of various phases of zinc tin oxides from ab initio calculations
J Lee, SC Lee, CS Hwang, JH Choi
Journal of Materials Chemistry C 1 (39), 6364-6374, 2013
272013
Improvement in the performance of tin oxide thin-film transistors by alumina doping
MS Huh, BS Yang, S Oh, J Lee, K Yoon, JK Jeong, CS Hwang, HJ Kim
Electrochemical and Solid-State Letters 12 (10), H385-H387, 2009
242009
Improved electrical properties of tin-oxide films by using ultralow-pressure sputtering process
MS Huh, BS Yang, J Lee, J Heo, SJ Han, K Yoon, SH Yang, CS Hwang, ...
Thin Solid Films 518 (4), 1170-1173, 2009
222009
Electrical and bias temperature instability characteristics of n-type field-effect transistors using HfO x N y gate dielectrics
HS Jung, HK Kim, JH Kim, SJ Won, DY Cho, J Lee, SY Lee, CS Hwang, ...
Journal of The Electrochemical Society 157 (5), G121-G126, 2010
212010
Effect of oxygen vacancy on the structural and electronic characteristics of crystalline Zn 2 SnO 4
J Lee, Y Kang, CS Hwang, S Han, SC Lee, JH Choi
Journal of Materials Chemistry C 2 (39), 8381-8387, 2014
202014
The Impact of Carbon Concentration on the Crystalline Phase and Dielectric Constant of Atomic Layer Deposited HfO2 Films on Ge Substrate
HS Jung, SH Jeon, HK Kim, IH Yu, SY Lee, J Lee, YJ Chung, DY Cho, ...
ECS Journal of Solid State Science and Technology 1 (2), N33-N37, 2012
192012
Properties of atomic layer deposited HfO2 films on Ge substrates depending on process temperatures
HS Jung, HK Kim, IH Yu, SY Lee, J Lee, J Park, JH Jang, SH Jeon, ...
Journal of The Electrochemical Society 159 (4), G33-G39, 2012
192012
Discovery of zirconium dioxides for the design of better oxygen-ion conductors using efficient algorithms beyond data mining
J Lee, N Ohba, R Asahi
RSC Advances 8 (45), 25534-25545, 2018
182018
Design Rules for High Oxygen-Ion Conductivity in Garnet-Type Oxides
J Lee, N Ohba, R Asahi
Chemistry of Materials 32 (4), 1358-1370, 2020
162020
First-principles screening of structural properties of intermetallic compounds on martensitic transformation
J Lee, Y Ikeda, I Tanaka
npj Computational Materials 3 (1), 52, 2017
162017
Effects of Annealing Environment on Interfacial Reactions and Electrical Properties of Ultrathin SrTiO3 on Si
TJ Park, JH Kim, JH Jang, J Lee, SW Lee, SY Lee, HS Jung, CS Hwang
Journal of The Electrochemical Society 156 (9), G129-G133, 2009
162009
Enhancement of Initial Growth of ZnO Films on Layer-Structured Bi2Te3 by Atomic Layer Deposition
KC Kim, CJ Cho, J Lee, HJ Kim, DS Jeong, SH Baek, JS Kim, SK Kim
Chemistry of Materials 26 (22), 6448-6453, 2014
152014
Reduction of Charge Trapping in Film on Ge Substrates by Atomic Layer Deposition of Various Passivating Interfacial Layers
HS Jung, IH Yu, HK Kim, SY Lee, J Lee, Y Choi, YJ Chung, NI Lee, ...
IEEE Transactions on Electron Devices 59 (9), 2350-2356, 2012
152012
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論文 1–20