Simona Podda
Simona Podda
確認したメール アドレス: crs4.it
タイトル引用先
Reliability of visible GaN LEDs in plastic package
G Meneghesso, S Levada, E Zanoni, G Scamarcio, G Mura, S Podda, ...
Microelectronics Reliability 43 (9-11), 1737-1742, 2003
672003
Failure Modes and Mechanisms of DC‐Aged GaN LEDs
G Meneghesso, S Levada, E Zanoni, S Podda, G Mura, M Vanzi, ...
physica status solidi (a) 194 (2), 389-392, 2002
652002
High brightness GaN LEDs degradation during dc and pulsed stress
M Meneghini, S Podda, A Morelli, R Pintus, L Trevisanello, ...
Microelectronics Reliability 46 (9-11), 1720-1724, 2006
562006
An automatic alignment procedure for a four-source photometric stereo technique applied to scanning electron microscopy
R Pintus, S Podda, M Vanzi
IEEE Transactions on Instrumentation and Measurement 57 (5), 989-996, 2008
282008
Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions
M Meneghini, L Trevisanello, S Podda, S Buso, G Spiazzi, G Meneghesso, ...
Sixth International Conference on Solid State Lighting 6337, 63370R, 2006
262006
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs
G Meneghesso, S Podda, M Vanzi
232001
Microscopic biomineralization processes and Zn bioavailability: a synchrotron-based investigation of Pistacia lentiscus L. roots
G De Giudici, D Medas, C Meneghini, MA Casu, A Gianoncelli, A Iadecola, ...
Environmental science and pollution research 22 (24), 19352-19361, 2015
152015
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology
L Sponton, L Cerati, G Croce, G Mura, S Podda, M Vanzi, G Meneghesso
152002
High brightness InGaN LEDs degradation at high injection current bias
S Levada, M Meneghini, E Zanoni, S Buso, G Spiazzi, G Meneghesso, ...
2006 IEEE International Reliability Physics Symposium Proceedings, 615-616, 2006
132006
Quantitative 3D reconstruction from BS imaging
R Pintus, S Podda, F Mighela, M Vanzi
122004
Image alignment for 3D reconstruction in a SEM
R Pintus, S Podda, M Vanzi
Microelectronics Reliability 45 (9-11), 1581-1584, 2005
52005
XEBIC at the Dual Beam
M Vanzi, S Podda, E Musu, R Cao
Microelectronics Reliability 53 (9-11), 1399-1402, 2013
32013
Improvements in automated photometric stereo 3D SEM
R Pintus, S Podda, M Vanzi
Microscopy and Microanalysis 14 (S2), 608-609, 2008
22008
3D Sculptures from SEM images
R Pintus, S Podda, M Vanzi
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen …, 2008
22008
Failure analysis of RuO2 thick film chip resistors
S Podda, M Vanzi, G Cassanelli, F Fantini
22004
Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation
D Medas, G Cappai, G De Giudici, M Piredda, S Podda
Greenhouse Gases: Science and Technology 7 (4), 692-705, 2017
12017
CyTest–An innovative open-source platform for training and testing in cythopathology
L Lianas, ME Piras, E Musu, S Podda, F Frexia, E Ovcin, G Bussolati, ...
Procedia-Social and Behavioral Sciences 228, 674-681, 2016
12016
Implementation of TV-rate EBIC at a Dual BEam
M Vanzi, S Podda, F Tatti
10th Multinational Congress on Microscopy 2011 (MCM), 71-72, 2011
12011
An automated lifetest equipment for optical emitters
M Giglio, G Martines, G Mura, S Podda, M Vanzi
Microelectronics Reliability 42 (9-11), 1311-1315, 2002
12002
Backside failure analysis of GaAs ICs after ESD tests
G Meneghesso, A Cocco, G Mura, S Podda, M Vanzi
Microelectronics Reliability 42 (9-11), 1293-1298, 2002
12002
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