Peter Kury-Thien
Peter Kury-Thien
Projektleiter, Siemens Energy
確認したメール アドレス: uni-due.de
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引用先
引用先
Interplay of surface morphology, strain relief, and surface stress during surfactant mediated epitaxy of Ge on Si
P Zahl, P Kury, MH von Hoegen
Applied Physics A 69 (5), 481-488, 1999
381999
Compact and transferable threefold evaporator for molecular beam epitaxy in ultrahigh vacuum
P Kury, R Hild, D Thien, HL Günter, FJ Meyer zu Heringdorf, MH Hoegen
Review of scientific instruments 76 (8), 083906, 2005
362005
Surfactant-mediated epitaxy of Ge on Si (111): Beyond the surface
T Schmidt, R Kröger, T Clausen, J Falta, A Janzen, M Kammler, P Kury, ...
Applied Physics Letters 86 (11), 111910, 2005
352005
Less strain energy despite fewer misfit dislocations: The impact of ordering
T Schmidt, R Kröger, JI Flege, T Clausen, J Falta, A Janzen, P Zahl, ...
Physical review letters 96 (6), 066101, 2006
232006
Strain relief during Ge hut cluster formation on Si (001) studied by high-resolution LEED and surface-stress-induced optical deflection
M Horn-von Hoegen, BH Müller, T Grabosch, P Kury
Physical Review B 70 (23), 235313, 2004
172004
Disorder-mediated ordering by self-interfactant effect in organic thin film growth of pentacene on silicon
P Kury, KR Roos, D Thien, S Möllenbeck, D Wall, M Horn-von Hoegen, ...
Organic electronics 9 (4), 461-465, 2008
122008
Impact of thermal dependence of elastic constants on surface stress measurements
P Kury, M Horn-von Hoegen
Review of scientific instruments 75 (5), 1357-1358, 2004
122004
SSIOD: The next generation
P Kury, T Grabosch, M Horn-von Hoegen
Review of scientific instruments 76 (2), 023903, 2005
112005
Domain sensitive contrast in photoelectron emission microscopy
D Thien, P Kury, M Horn-von Hoegen, FJM zu Heringdorf, J van Heys, ...
Physical review letters 99 (19), 196102, 2007
92007
Absence of surface stress change during pentacene thin film growth on the Si (111)-(7× 7) surface: a buried reconstruction interface
P Kury, KR Roos, M Horn-von Hoegen, FJM zu Heringdorf
New Journal of Physics 10 (2), 023037, 2008
72008
Precise calibration for surface stress induced optical deflection measurements
P Kury, P Zahl, MH Hoegen
Review of scientific instruments 75 (6), 2211-2212, 2004
52004
Direct observation of reconstruction induced changes of surface stress for Sb on Si (111)
P Kury, P Zahl, M Horn-von Hoegen
Analytical and bioanalytical chemistry 379 (4), 582-587, 2004
42004
Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
P Kury, P Zahl, M Horn-von Hoegen, C Voges, H Frischat, HL Günter, ...
Review of scientific instruments 75 (11), 4911-4915, 2004
32004
Verspannungseffekte bei der Epitaxie organischer Halbleiter: Pentazen-Si (111)
P Kury
Shaker, 2008
12008
Characterizing single crystal surfaces using high resolution electron diffraction
D Thien, FJM zu Heringdorf, P Kury, M Horn-von Hoegen
Analytical and bioanalytical chemistry 379 (4), 588-593, 2004
12004
Experimental determination of surface stress of H/Si (001)
P Kury, M Horn-von Hoegen, J Heys, E Pehlke
2005
3-dim. reciprocal space mapping of a quasi periodic misfit dislocation array
M Kammler, T Schmidt, P Zahl, P Kury, J Falta, M Horn-von Hoegen
WinSPA HTML Help V1. 01
P Kury
Strain Fields of Periodic Dislocation Networks of SME grown Ge on Si (111)
M Kammler, J Falta, P Kury, BH Muller, T Schmidt, M Horn-von Hoegen
XRD studies on the structure of thin pentacene films on Si (111)
C Deiter, P Kury, T Weisemoeller, HH Pieper, F Bertram, ...
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論文 1–20