フォロー
Maciej Matys
Maciej Matys
Fujitsu Laboratories ltd., Atsugi, Kanagawa
確認したメール アドレス: fujitsu.com
タイトル
引用先
引用先
On the origin of interface states at oxide/III-nitride heterojunction interfaces
M Matys, B Adamowicz, A Domanowska, A Michalewicz, R Stoklas, ...
Journal of Applied Physics 120 (22), 2016
462016
Mechanism of yellow luminescence in GaN at room temperature
M Matys, B Adamowicz
Journal of Applied Physics 121 (6), 2017
292017
Determination of the deep donor-like interface state density distribution in metal/Al2O3/n-GaN structures from the photocapacitance–light intensity measurement
M Matys, B Adamowicz, T Hashizume
Applied Physics Letters 101 (23), 2012
272012
Mg-implanted bevel edge termination structure for GaN power device applications
M Matys, T Ishida, KP Nam, H Sakurai, T Narita, T Uesugi, M Bockowski, ...
Applied Physics Letters 118 (9), 2021
262021
Design and demonstration of nearly-ideal edge termination for GaN pn junction using Mg-implanted field limiting rings
M Matys, T Ishida, KP Nam, H Sakurai, K Kataoka, T Narita, T Uesugi, ...
Applied Physics Express 14 (7), 074002, 2021
242021
Origin of positive fixed charge at insulator/AlGaN interfaces and its control by AlGaN composition
M Matys, R Stoklas, M Blaho, B Adamowicz
Applied physics letters 110 (24), 2017
232017
Characterization of capture cross sections of interface states in dielectric/III-nitride heterojunction structures
M Matys, R Stoklas, J Kuzmik, B Adamowicz, Z Yatabe, T Hashizume
Journal of Applied Physics 119 (20), 2016
202016
Influence of oxygen-plasma treatment on AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO2 by atomic layer deposition: leakage current and …
R Stoklas, D Gregušová, M Blaho, K Fröhlich, J Novák, M Matys, Z Yatabe, ...
Semiconductor Science and Technology 32 (4), 045018, 2017
192017
Disorder induced gap states as a cause of threshold voltage instabilities in Al2O3/AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors
M Matys, S Kaneki, K Nishiguchi, B Adamowicz, T Hashizume
Journal of Applied Physics 122 (22), 2017
182017
Direct measurement of donor-like interface state density and energy distribution at insulator/AlGaN interface in metal/Al2O3/AlGaN/GaN by photocapacitance method
M Matys, B Adamowicz, Y Hori, T Hashizume
Applied Physics Letters 103 (2), 2013
172013
Improvement of channel property of GaN vertical trench MOSFET by compensating nitrogen vacancies with nitrogen plasma treatment
T Ishida, KP Nam, M Matys, T Uesugi, J Suda, T Kachi
Applied Physics Express 13 (12), 124003, 2020
162020
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures
A Domanowska, M Miczek, R Ucka, M Matys, B Adamowicz, J Żywicki, ...
Applied surface science 258 (21), 8354-8359, 2012
152012
Process engineering of GaN power devices via selective-area p-type doping with ion implantation and ultra-high-pressure annealing
T Kachi, T Narita, H Sakurai, M Matys, K Kataoka, K Hirukawa, K Sumida, ...
Journal of Applied Physics 132 (13), 2022
142022
Mg-implanted vertical GaN junction barrier Schottky rectifiers with low on resistance, low turn-on voltage, and nearly ideal nondestructive breakdown voltage
M Matys, K Kitagawa, T Narita, T Uesugi, J Suda, T Kachi
Applied Physics Letters 121 (20), 2022
102022
Enhancement of channel electric field in AlGaN/GaN multi-nanochannel high electron mobility transistors
M Matys, K Nishiguchi, B Adamowicz, J Kuzmik, T Hashizume
Journal of Applied Physics 124 (22), 2018
82018
Evidence of reduced interface states in Al2O3/AlGaN MIS structures via insertion of ex situ regrown AlGaN layer
A Baratov, S Kawabata, S Urano, I Nagase, M Ishiguro, S Maeda, ...
Applied Physics Express 15 (10), 104002, 2022
72022
The Impact of Bulk Defects, Surface States, and Excitons on Yellow and Ultraviolet Photoluminescence in GaN
M Matys, M Miczek, B Adamowicz, Z Żytkiewicz, E Kamińska, ...
Acta Physica Polonica A 120 (6A), 2011
72011
High-temperature ultraviolet detection based on surface photovoltage effect in SiN passivated n-GaN films
M Matys, B Adamowicz, ZR Zytkiewicz, A Taube, R Kruszka, A Piotrowska
Applied physics letters 109 (5), 2016
62016
Two-dimensional modeling of surface photovoltage in metal/insulator/n-GaN structure with cylindrical symmetry
M Matys, P Powroznik, D Kupka, B Adamowicz
Optica Applicata 43 (1), 2013
22013
All-optical transistor using deep-level defects in nitride semiconductors for room temperature optical computing
M Matys, A Domanowska, A Michalewicz, B Adamowicz, T Kachi
AIP Advances 10 (10), 2020
12020
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