| Joint learning of the embedding of words and entities for named entity disambiguation I Yamada, H Shindo, H Takeda, Y Takefuji arXiv preprint arXiv:1601.01343, 2016 | 218 | 2016 |
| Bayesian symbol-refined tree substitution grammars for syntactic parsing H Shindo, Y Miyao, A Fujino, M Nagata Proceedings of the 50th Annual Meeting of the Association for Computational …, 2012 | 67 | 2012 |
| Learning distributed representations of texts and entities from knowledge base I Yamada, H Shindo, H Takeda, Y Takefuji Transactions of the Association for Computational Linguistics 5, 397-411, 2017 | 63 | 2017 |
| Pattern matching method and pattern matching program H Shindo, A Sugiyama, T Sutani, H Morokuma, H Komuro US Patent 7,889,909, 2011 | 57 | 2011 |
| Interpretable adversarial perturbation in input embedding space for text M Sato, J Suzuki, H Shindo, Y Matsumoto arXiv preprint arXiv:1805.02917, 2018 | 53 | 2018 |
| A span selection model for semantic role labeling H Ouchi, H Shindo, Y Matsumoto arXiv preprint arXiv:1810.02245, 2018 | 46 | 2018 |
| Japanese text normalization with encoder-decoder model T Ikeda, H Shindo, Y Matsumoto Proceedings of the 2nd Workshop on Noisy User-generated Text (WNUT), 129-137, 2016 | 26 | 2016 |
| High-precision contouring from SEM image in 32-nm lithography and beyond H Shindo, A Sugiyama, H Komuro, Y Hojo, R Matsuoka, JL Sturtevant, ... Design for Manufacturability through Design-Process Integration III 7275, 72751F, 2009 | 25 | 2009 |
| Joint transition-based dependency parsing and disfluency detection for automatic speech recognition texts M Yoshikawa, H Shindo, Y Matsumoto Proceedings of the 2016 Conference on Empirical Methods in Natural Language …, 2016 | 24 | 2016 |
| Wikipedia2vec: An efficient toolkit for learning and visualizing the embeddings of words and entities from wikipedia I Yamada, A Asai, J Sakuma, H Shindo, H Takeda, Y Takefuji, ... arXiv preprint arXiv:1812.06280, 2018 | 23 | 2018 |
| Segment-level neural conditional random fields for named entity recognition M Sano, H Shindo, I Yamada, Y Matsumoto Proceedings of the Eighth International Joint Conference on Natural Language …, 2017 | 22 | 2017 |
| Neural modeling of multi-predicate interactions for Japanese predicate argument structure analysis H Ouchi, H Shindo, Y Matsumoto Proceedings of the 55th Annual Meeting of the Association for Computational …, 2017 | 21 | 2017 |
| Pattern inspecting and measuring device and program T Minakawa, T Hiroi, T Yoshida, T Ninomiya, T Yamamoto, H Shindo, ... US Patent 9,858,659, 2018 | 19 | 2018 |
| Joint case argument identification for Japanese predicate argument structure analysis H Ouchi, H Shindo, K Duh, Y Matsumoto Proceedings of the 53rd Annual Meeting of the Association for Computational …, 2015 | 19 | 2015 |
| A CD-gap-free contour extraction technique for OPC model calibration T Shibahara, T Minakawa, M Oikawa, H Shindo, H Sugahara, Y Hojyo Metrology, Inspection, and Process Control for Microlithography XXV 7971, 79710O, 2011 | 19 | 2011 |
| High-accuracy OPC-modeling by using advanced CD-SEM based contours in the next-generation lithography D Hibino, H Shindo, Y Abe, Y Hojyo, G Fenger, T Do, I Kusnadi, ... Metrology, Inspection, and Process Control for Microlithography XXIV 7638 …, 2010 | 18 | 2010 |
| Joint prediction of morphosyntactic categories for fine-grained arabic part-of-speech tagging exploiting tag dictionary information G Inoue, H Shindo, Y Matsumoto Proceedings of the 21st Conference on Computational Natural Language …, 2017 | 17 | 2017 |
| Measurement technology to quantify 2D pattern shape in sub-2x nm advanced lithography D Fuchimoto, H Sakai, H Shindo, M Izawa, H Sugahara, ... Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013 | 15 | 2013 |
| System and method of image processing, and scanning electron microscope A Sugiyama, H Shindo US Patent 8,094,920, 2012 | 14 | 2012 |
| High-accuracy optical proximity correction modeling using advanced critical dimension scanning electron microscope-based contours in next-generation lithography D Hibino, H Shindo, Y Abe, Y Hojyo, GL Fenger, T Do, I Kusnadi, ... Journal of Micro/Nanolithography, MEMS, and MOEMS 10 (1), 013012, 2011 | 14 | 2011 |
