Hiroyuki Shindo
Hiroyuki Shindo
確認したメール アドレス: is.naist.jp
タイトル
引用先
引用先
Joint learning of the embedding of words and entities for named entity disambiguation
I Yamada, H Shindo, H Takeda, Y Takefuji
arXiv preprint arXiv:1601.01343, 2016
2322016
Bayesian symbol-refined tree substitution grammars for syntactic parsing
H Shindo, Y Miyao, A Fujino, M Nagata
Proceedings of the 50th Annual Meeting of the Association for Computational …, 2012
672012
Learning distributed representations of texts and entities from knowledge base
I Yamada, H Shindo, H Takeda, Y Takefuji
Transactions of the Association for Computational Linguistics 5, 397-411, 2017
662017
Interpretable adversarial perturbation in input embedding space for text
M Sato, J Suzuki, H Shindo, Y Matsumoto
arXiv preprint arXiv:1805.02917, 2018
582018
Pattern matching method and pattern matching program
H Shindo, A Sugiyama, T Sutani, H Morokuma, H Komuro
US Patent 7,889,909, 2011
572011
A span selection model for semantic role labeling
H Ouchi, H Shindo, Y Matsumoto
arXiv preprint arXiv:1810.02245, 2018
472018
Wikipedia2vec: An efficient toolkit for learning and visualizing the embeddings of words and entities from wikipedia
I Yamada, A Asai, J Sakuma, H Shindo, H Takeda, Y Takefuji, ...
arXiv preprint arXiv:1812.06280, 2018
282018
Japanese text normalization with encoder-decoder model
T Ikeda, H Shindo, Y Matsumoto
Proceedings of the 2nd Workshop on Noisy User-generated Text (WNUT), 129-137, 2016
272016
Joint transition-based dependency parsing and disfluency detection for automatic speech recognition texts
M Yoshikawa, H Shindo, Y Matsumoto
Proceedings of the 2016 Conference on Empirical Methods in Natural Language …, 2016
252016
High-precision contouring from SEM image in 32-nm lithography and beyond
H Shindo, A Sugiyama, H Komuro, Y Hojo, R Matsuoka, JL Sturtevant, ...
Design for Manufacturability through Design-Process Integration III 7275, 72751F, 2009
252009
Segment-level neural conditional random fields for named entity recognition
M Sano, H Shindo, I Yamada, Y Matsumoto
Proceedings of the Eighth International Joint Conference on Natural Language …, 2017
232017
Neural modeling of multi-predicate interactions for Japanese predicate argument structure analysis
H Ouchi, H Shindo, Y Matsumoto
Proceedings of the 55th Annual Meeting of the Association for Computational …, 2017
212017
Pattern inspecting and measuring device and program
T Minakawa, T Hiroi, T Yoshida, T Ninomiya, T Yamamoto, H Shindo, ...
US Patent 9,858,659, 2018
192018
Joint case argument identification for Japanese predicate argument structure analysis
H Ouchi, H Shindo, K Duh, Y Matsumoto
Proceedings of the 53rd Annual Meeting of the Association for Computational …, 2015
192015
A CD-gap-free contour extraction technique for OPC model calibration
T Shibahara, T Minakawa, M Oikawa, H Shindo, H Sugahara, Y Hojyo
Metrology, Inspection, and Process Control for Microlithography XXV 7971, 79710O, 2011
192011
High-accuracy OPC-modeling by using advanced CD-SEM based contours in the next-generation lithography
D Hibino, H Shindo, Y Abe, Y Hojyo, G Fenger, T Do, I Kusnadi, ...
Metrology, Inspection, and Process Control for Microlithography XXIV 7638 …, 2010
182010
Joint prediction of morphosyntactic categories for fine-grained arabic part-of-speech tagging exploiting tag dictionary information
G Inoue, H Shindo, Y Matsumoto
Proceedings of the 21st Conference on Computational Natural Language …, 2017
172017
Measurement technology to quantify 2D pattern shape in sub-2x nm advanced lithography
D Fuchimoto, H Sakai, H Shindo, M Izawa, H Sugahara, ...
Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013
152013
System and method of image processing, and scanning electron microscope
A Sugiyama, H Shindo
US Patent 8,094,920, 2012
142012
High-accuracy optical proximity correction modeling using advanced critical dimension scanning electron microscope-based contours in next-generation lithography
D Hibino, H Shindo, Y Abe, Y Hojyo, GL Fenger, T Do, I Kusnadi, ...
Journal of Micro/Nanolithography, MEMS, and MOEMS 10 (1), 013012, 2011
142011
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