| IGZO synaptic thin-film transistors with embedded AlO x charge-trapping layers Y Lee, H Jo, K Kim, H Yoo, H Baek, DR Lee, H Oh Applied Physics Express 15 (6), 061005, 2022 | 10 | 2022 |
| Probabilistic parameter estimation using a Gaussian mixture density network: application to X-ray reflectivity data curve fitting KT Kim, DR Lee Journal of Applied Crystallography 54 (6), 1572-1579, 2021 | 8 | 2021 |
| Structural Chirality of Polar Skyrmions Probed by Resonant Elastic X-Ray Scattering MR McCarter, KT Kim, VA Stoica, S Das, C Klewe, EP Donoway, DM Burn, ... Physical review letters 129 (24), 247601, 2022 | 6 | 2022 |
| Chiral structures of electric polarization vectors quantified by X-ray resonant scattering KT Kim, MR McCarter, VA Stoica, S Das, C Klewe, EP Donoway, DM Burn, ... Nature communications 13 (1), 1769, 2022 | 6 | 2022 |
| X-ray reflectivity data analysis using Bayesian inference: The study of induced Pt magnetization in Pt/Co/Pt KT Kim, DO Kim, JY Kee, I Seo, Y Choi, JW Choi, DR Lee Current Applied Physics 30, 46-52, 2021 | 5 | 2021 |
| Origin of circular dichroism in resonant elastic x-ray scattering from magnetic and polar chiral structures KT Kim, JY Kee, MR McCarter, G Van Der Laan, VA Stoica, JW Freeland, ... Physical Review B 106 (3), 035116, 2022 | 3 | 2022 |
| Structural measurement of electron-phonon coupling and electronic thermal transport across a metal-semiconductor interface SL W.Jo, J.Kee, K.Kim,E.C.Landhl, G.Longbons, D.A.Walko, H.Wen, D.R.Lee Scientific Reports, 2022 | 3 | 2022 |
| Experimental verification of polar structures in ultrathin BaTiO_ {3} layers using resonant x-ray reflectivity KT Kim, YJ Shinb, SJ Kang, R Kim, M Kim, TW Noh, Y Choi, SH Chang, ... arXiv preprint arXiv:2207.07819, 2022 | | 2022 |
