| Pafl: Probabilistic automaton-based fault localization for recurrent neural networks Y Ishimoto, M Kondo, N Ubayashi, Y Kamei Information and Software Technology 155, 107117, 2023 | 7 | 2023 |
| Do visual issue reports help developers fix bugs? a preliminary study of using videos and images to report issues on GitHub H Kuramoto, M Kondo, Y Kashiwa, Y Ishimoto, K Shindo, Y Kamei, ... Proceedings of the 30th IEEE/ACM International Conference on Program …, 2022 | 6 | 2022 |
| Uncertainty-aware Metamorphic Testing for Robust Object Detection Models J Wang, Y Ishimoto, M Kondo, Y Kamei, N Ubayashi 2023 IEEE 23rd International Conference on Software Quality, Reliability …, 2023 | | 2023 |
| An Initial Analysis of Repair and Side-effect Prediction for Neural Networks Y Ishimoto, K Matsui, M Kondo, N Ubayashi, Y Kamei 2023 IEEE/ACM 2nd International Conference on AI Engineering–Software …, 2023 | | 2023 |
| Fault Localization for RNNs Based on Probabilistic Automata and n-grams Y Ishimoto, M Kondo, N Ubayashi, Y Kamei IEICE Technical Report; IEICE Tech. Rep. 122 (138), 55-60, 2022 | | 2022 |
| The investigation of the usage of videos and images for bug reports in GitHub H Kuramoto, Y Ishimoto, K Shindo, M Kondo, Y Kashiwa, Y Kamei, ... IEICE Technical Report; IEICE Tech. Rep., 0 | | |
