フォロー
Christoph T. Koch
Christoph T. Koch
Department of Physics, Humboldt University of Berlin
確認したメール アドレス: hu-berlin.de - ホームページ
タイトル
引用先
引用先
Determination of core structure periodicity and point defect density along dislocations
CT Koch
Arizona State University, 2002
5032002
Band-gap measurements of direct and indirect semiconductors using monochromated electrons
L Gu, V Srot, W Sigle, C Koch, P van Aken, F Scholz, SB Thapa, ...
Physical Review B 75 (19), 195214, 2007
1502007
FAIR data enabling new horizons for materials research
M Scheffler, M Aeschlimann, M Albrecht, T Bereau, HJ Bungartz, C Felser, ...
Nature 604 (7907), 635-642, 2022
1192022
A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electrons
CT Koch
Ultramicroscopy 108 (2), 141-150, 2008
1172008
Confined and chemically flexible grain boundaries in polycrystalline compound semiconductors
D Abou‐Ras, SS Schmidt, R Caballero, T Unold, HW Schock, CT Koch, ...
Advanced Energy Materials 2 (8), 992-998, 2012
1092012
Resonant wedge-plasmon modes in single-crystalline gold nanoplatelets
L Gu, W Sigle, CT Koch, B Ögüt, PA Van Aken, N Talebi, R Vogelgesang, ...
Physical Review B 83 (19), 195433, 2011
1062011
Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging
J Nelayah, L Gu, W Sigle, CT Koch, I Pastoriza-Santos, LM Liz-Marzán, ...
Optics letters 34 (7), 1003-1005, 2009
1022009
An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices
CT Koch, VB Özdöl, PA van Aken
Applied Physics Letters 96 (9), 2010
1002010
Intergranular glassy films: An overview
A Subramaniam, CT Koch, RM Cannon, M Rühle
Materials Science and Engineering: A 422 (1-2), 3-18, 2006
972006
SESAM: exploring the frontiers of electron microscopy
CT Koch, W Sigle, R Höschen, M Rühle, E Essers, G Benner, M Matijevic
Microscopy and Microanalysis 12 (6), 506-514, 2006
932006
Off-axis and inline electron holography: A quantitative comparison
CT Koch, A Lubk
Ultramicroscopy 110 (5), 460-471, 2010
802010
Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface
Y Kauffmann, SH Oh, CT Koch, A Hashibon, C Scheu, M Rühle, ...
Acta materialia 59 (11), 4378-4386, 2011
752011
Towards full-resolution inline electron holography
CT Koch
Micron 63, 69-75, 2014
742014
Off-axis and inline electron holography: Experimental comparison
T Latychevskaia, P Formanek, CT Koch, A Lubk
Ultramicroscopy 110 (5), 472-482, 2010
742010
Method for retrieval of the three-dimensional object potential by inversion of dynamical electron scattering
W Van den Broek, CT Koch
Physical review letters 109 (24), 245502, 2012
702012
Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties
D Abou-Ras, CT Koch, V Küstner, PA Van Aken, U Jahn, MA Contreras, ...
Thin Solid Films 517 (7), 2545-2549, 2009
682009
Hybridized metal slit eigenmodes as an illustration of Babinet’s principle
B Ogut, R Vogelgesang, W Sigle, N Talebi, CT Koch, PA van Aken
Acs Nano 5 (8), 6701-6706, 2011
672011
The structure of grain boundaries in strontium titanate: theory, simulation, and electron microscopy
S von Alfthan, NA Benedek, L Chen, A Chua, D Cockayne, KJ Dudeck, ...
Annual review of materials research 40, 557-599, 2010
602010
Aberration-compensated large-angle rocking-beam electron diffraction
CT Koch
Ultramicroscopy 111 (7), 828-840, 2011
592011
Electron energy losses in Ag nanoholes—from localized surface plasmon resonances to rings of fire
W Sigle, J Nelayah, CT Koch, PA van Aken
Optics letters 34 (14), 2150-2152, 2009
582009
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論文 1–20