Christoph T. Koch

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Peter A. van AkenProf. Dr.確認したメールアドレス: fkf.mpg.de
Wilfried SigleMax Planck Institute for Solid State Research, Stuttgart確認したメールアドレス: fkf.mpg.de
Benedikt HaasHumboldt-Universität zu Berlin確認したメールアドレス: physik.hu-berlin.de
Wouter Van den BroekStaff scientist, Humboldt-Universität zu Berlin確認したメールアドレス: physik.hu-berlin.de
Alberto EljarratZeiss SMT GmbH確認したメールアドレス: physik.hu-berlin.de
Vesna SrotMax Planck Institute for Solid State Research, Stuttgart, Germany確認したメールアドレス: fkf.mpg.de
Daniel Abou-RasHelmholtz-Zentrum Berlin für Materialien und Energie GmbH確認したメールアドレス: helmholtz-berlin.de
Burak OzdolEngineer確認したメールアドレス: wdc.com
Nahid TalebiInstitut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel確認したメールアドレス: physik.uni-kiel.de
Sang Ho OhDepartment of Energy Engineering, Korea Institute of Energy Technology (KENTECH), Professor確認したメールアドレス: kentech.ac.kr
Jaysen NelayahUniversité Paris Cité確認したメールアドレス: u-paris.fr
Ralf VogelgesangUniversity of Oldenburg, Germany確認したメールアドレス: nanoopt.org
Thomas UnoldHelmholtz-Zentrum Berlin確認したメールアドレス: helmholtz-berlin.de
Sebastian SchmidtHelmholtz-Zentrum Berlin für Materialien und Energie確認したメールアドレス: helmholtz-berlin.de
Kyung SongKorea Institute of Materials Science確認したメールアドレス: kims.re.kr
Rafal E. Dunin-BorkowskiForschungszentrum Jülich確認したメールアドレス: fz-juelich.de
Chris BoothroydNanyang Technological University確認したメールアドレス: ntu.edu.sg
Prof. Dr. habil. Oana Cojocaru-MirédinAlbert-Ludwigs-University of Freiburg確認したメールアドレス: inatech.uni-freiburg.de
Feng Wang確認したメールアドレス: physik.hu-berlin.de
Jürgen P. RabeProfessor of Physics & Director IRIS Adlershof, Humboldt-Universität zu Berlin確認したメールアドレス: physik.hu-berlin.de

フォロー

Christoph T. Koch

Department of Physics, Humboldt University of Berlin

確認したメールアドレス: hu-berlin.de - ホームページ

Physics electron diffraction microscopy materials science


タイトル引用回数順公開年順タイトル順	引用先引用先	年
Determination of core structure periodicity and point defect density along dislocations CT Koch Arizona State University, 2002	513	2002
Band-gap measurements of direct and indirect semiconductors using monochromated electrons L Gu, V Srot, W Sigle, C Koch, P van Aken, F Scholz, SB Thapa, ... Physical Review B—Condensed Matter and Materials Physics 75 (19), 195214, 2007	151	2007
FAIR data enabling new horizons for materials research M Scheffler, M Aeschlimann, M Albrecht, T Bereau, HJ Bungartz, C Felser, ... Nature 604 (7907), 635-642, 2022	131	2022
A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electrons CT Koch Ultramicroscopy 108 (2), 141-150, 2008	117	2008
Confined and chemically flexible grain boundaries in polycrystalline compound semiconductors D Abou‐Ras, SS Schmidt, R Caballero, T Unold, HW Schock, CT Koch, ... Advanced Energy Materials 2 (8), 992-998, 2012	111	2012
Resonant wedge-plasmon modes in single-crystalline gold nanoplatelets L Gu, W Sigle, CT Koch, B Ögüt, PA Van Aken, N Talebi, R Vogelgesang, ... Physical Review B—Condensed Matter and Materials Physics 83 (19), 195433, 2011	108	2011
Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging J Nelayah, L Gu, W Sigle, CT Koch, I Pastoriza-Santos, LM Liz-Marzán, ... Optics letters 34 (7), 1003-1005, 2009	102	2009
An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices CT Koch, VB Özdöl, PA van Aken Applied Physics Letters 96 (9), 2010	100	2010
Intergranular glassy films: An overview A Subramaniam, CT Koch, RM Cannon, M Rühle Materials Science and Engineering: A 422 (1-2), 3-18, 2006	95	2006
SESAM: exploring the frontiers of electron microscopy CT Koch, W Sigle, R Höschen, M Rühle, E Essers, G Benner, M Matijevic Microscopy and Microanalysis 12 (6), 506-514, 2006	94	2006
Off-axis and inline electron holography: A quantitative comparison CT Koch, A Lubk Ultramicroscopy 110 (5), 460-471, 2010	80	2010
Off-axis and inline electron holography: Experimental comparison T Latychevskaia, P Formanek, CT Koch, A Lubk Ultramicroscopy 110 (5), 472-482, 2010	77	2010
Towards full-resolution inline electron holography CT Koch Micron 63, 69-75, 2014	75	2014
Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface Y Kauffmann, SH Oh, CT Koch, A Hashibon, C Scheu, M Rühle, ... Acta materialia 59 (11), 4378-4386, 2011	75	2011
Method for Retrieval of the Three-Dimensional Object Potential by Inversion<? format?> of Dynamical Electron Scattering W Van den Broek, CT Koch Physical review letters 109 (24), 245502, 2012	70	2012
Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties D Abou-Ras, CT Koch, V Küstner, PA Van Aken, U Jahn, MA Contreras, ... Thin Solid Films 517 (7), 2545-2549, 2009	67	2009
Hybridized metal slit eigenmodes as an illustration of Babinet’s principle B Ogut, R Vogelgesang, W Sigle, N Talebi, CT Koch, PA van Aken Acs Nano 5 (8), 6701-6706, 2011	66	2011
Atomic scale confirmation of ferroelectric polarization inversion in wurtzite-type AlScN N Wolff, S Fichtner, B Haas, MR Islam, F Niekiel, M Kessel, O Ambacher, ... Journal of Applied Physics 129 (3), 2021	60	2021
The structure of grain boundaries in strontium titanate: theory, simulation, and electron microscopy S von Alfthan, NA Benedek, L Chen, A Chua, D Cockayne, KJ Dudeck, ... Annual review of materials research 40 (1), 557-599, 2010	60	2010
Aberration-compensated large-angle rocking-beam electron diffraction CT Koch Ultramicroscopy 111 (7), 828-840, 2011	59	2011

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