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Masahiro Hori
Masahiro Hori
Verified email at shizuoka.ac.jp
Title
Cited by
Cited by
Year
Anderson–Mott transition in arrays of a few dopant atoms in a silicon transistor
E Prati, M Hori, F Guagliardo, G Ferrari, T Shinada
Nature nanotechnology 7 (7), 443-447, 2012
1262012
A reliable method for the counting and control of single ions for single-dopant controlled devices
T Shinada, T Kurosawa, H Nakayama, Y Zhu, M Hori, I Ohdomari
Nanotechnology 19 (34), 345202, 2008
622008
Band transport across a chain of dopant sites in silicon over micron distances and high temperatures
E Prati, K Kumagai, M Hori, T Shinada
Scientific reports 6 (1), 19704, 2016
522016
Single-electron quantization at room temperature in a-few-donor quantum dot in silicon nano-transistors
A Samanta, M Muruganathan, M Hori, Y Ono, H Mizuta, M Tabe, D Moraru
Applied Physics Letters 110 (9), 2017
342017
Charge Pumping Under Spin Resonance in Metal-Oxide-Semiconductor Transistors
M Hori, Y Ono
Physical Review Applied 11 (6), 064064, 2019
242019
Analysis of electron capture process in charge pumping sequence using time domain measurements
M Hori, T Watanabe, T Tsuchiya, Y Ono
Applied Physics Letters 105 (26), 2014
222014
Quantum transport in deterministically implanted single-donors in Si FETs
T Shinada, M Hori, F Guagliardo, G Ferrari, A Komatubara, K Kumagai, ...
2011 International Electron Devices Meeting, 30.4. 1-30.4. 4, 2011
222011
Performance enhancement of semiconductor devices by control of discrete dopant distribution
M Hori, T Shinada, K Taira, N Shimamoto, T Tanii, T Endo, I Ohdomari
Nanotechnology 20 (36), 365205, 2009
192009
Impact of a few dopant positions controlled by deterministic single-ion doping on the transconductance of field-effect transistors
M Hori, T Shinada, Y Ono, A Komatsubara, K Kumagai, T Tanii, T Endoh, ...
Applied Physics Letters 99 (6), 2011
172011
Direct observation of electron emission and recombination processes by time domain measurements of charge pumping current
M Hori, T Watanabe, T Tsuchiya, Y Ono
Applied Physics Letters 106 (4), 2015
152015
Enhancing single-ion detection efficiency by applying substrate bias voltage for deterministic single-ion doping
M Hori, T Shinada, K Taira, A Komatsubara, Y Ono, T Tanii, T Endoh, ...
Applied physics express 4 (4), 046501, 2011
132011
Single-charge band-to-band tunneling via multiple-dopant clusters in nanoscale Si Esaki diodes
G Prabhudesai, M Muruganathan, H Mizuta, M Hori, Y Ono, M Tabe, ...
Applied Physics Letters 114 (24), 2019
112019
Time-domain charge pumping on silicon-on-insulator MOS devices
T Watanabe, M Hori, T Tsuchiya, A Fujiwara, Y Ono
Japanese Journal of Applied Physics 56 (1), 011303, 2016
112016
Improvement of charge-pumping electrically detected magnetic resonance and its application to silicon metal–oxide–semiconductor field-effect transistor
M Hori, T Tsuchiya, Y Ono
Applied Physics Express 10 (1), 015701, 2016
102016
Coulomb-blockade transport in selectively-doped Si nano-transistors
A Afiff, A Samanta, A Udhiarto, H Sudibyo, M Hori, Y Ono, M Tabe, ...
Applied Physics Express 12 (8), 085004, 2019
82019
Electron aspirator using electron–electron scattering in nanoscale silicon
H Firdaus, T Watanabe, M Hori, D Moraru, Y Takahashi, A Fujiwara, ...
Nature Communications 9 (1), 4813, 2018
82018
Evaluation of accuracy of charge pumping current in time domain
T Watanabe, M Hori, T Saruwatari, T Tsuchiya, Y Ono
IEICE Transactions on Electronics 98 (5), 390-394, 2015
82015
Electrical activation and electron spin resonance measurements of arsenic implanted in silicon
M Hori, M Uematsu, A Fujiwara, Y Ono
Applied Physics Letters 106 (14), 2015
82015
Reduction of threshold voltage fluctuation in field-effect transistors by controlling individual dopant position
M Hori, K Taira, A Komatsubara, K Kumagai, Y Ono, T Tanii, T Endoh, ...
Applied Physics Letters 101 (1), 2012
82012
Single ion implantation of Ge donor impurity in silicon transistors
E Prati, Y Chiba, M Yano, K Kumagai, M Hori, G Ferrari, T Shinada, ...
2015 Silicon Nanoelectronics Workshop (SNW), 1-2, 2015
62015
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