フォロー
Mohamed Baker Alawieh
Mohamed Baker Alawieh
確認したメール アドレス: synopsys.com - ホームページ
タイトル
引用先
引用先
Algorithm and hardware implementation for visual perception system in autonomous vehicle: A survey
W Shi, MB Alawieh, X Li, H Yu
Integration 59, 148-156, 2017
1872017
LithoGAN: End-to-end lithography modeling with generative adversarial networks
W Ye, MB Alawieh, Y Lin, DZ Pan
Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019
942019
High-definition routing congestion prediction for large-scale FPGAs
MB Alawieh, W Li, Y Lin, L Singhal, MA Iyer, DZ Pan
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 26-31, 2020
652020
Wafer map defect patterns classification using deep selective learning
MB Alawieh, D Boning, DZ Pan
2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020
522020
Powernet: SOI lateral power device breakdown prediction with deep neural networks
J Chen, MB Alawieh, Y Lin, M Zhang, J Zhang, Y Guo, DZ Pan
IEEE Access 8, 25372-25382, 2020
472020
GAN-SRAF: Sub-resolution assist feature generation using conditional generative adversarial networks
MB Alawieh, Y Lin, Z Zhang, M Li, Q Huang, DZ Pan
Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019
372019
Using machine learning to optimize selection of elderly patients for endovascular thrombectomy
A Alawieh, F Zaraket, MB Alawieh, AR Chatterjee, A Spiotta
Journal of NeuroInterventional Surgery 11 (8), 847-851, 2019
362019
TEMPO: Fast Mask Topography Effect Modeling with Deep Learning
W Ye, MB Alawieh, Y Watanabe, S Nojima, Y Lin, DZ Pan
Proceedings of the 2020 International Symposium on Physical Design, 2020
302020
Machine Learning for Yield Learning and Optimization
Y Lin, MB Alawieh, W Ye, DZ Pan
International Test Conference, 2018
262018
Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning
MB Alawieh, F Wang, X Li
IEEE Transactions on Computer Aided Design, 2017
262017
Litho-GPA: Gaussian process assurance for lithography hotspot detection
W Ye, MB Alawieh, M Li, Y Lin, DZ Pan
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 54-59, 2019
222019
Automatic selection of structure parameters of silicon on insulator lateral power device using Bayesian optimization
J Chen, MB Alawieh, Y Lin, M Zhang, J Zhang, Y Guo, DZ Pan
IEEE Electron Device Letters 41 (9), 1288-1291, 2020
202020
GAN-SRAF: subresolution assist feature generation using generative adversarial networks
MB Alawieh, Y Lin, Z Zhang, M Li, Q Huang, DZ Pan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
172020
DREAMPlaceFPGA: An open-source analytical placer for large scale heterogeneous FPGAs using deep-learning toolkit
RS Rajarathnam, MB Alawieh, Z Jiang, M Iyer, DZ Pan
2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 300-306, 2022
162022
Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning
MB Alawieh, F Wang, X Li
Proceedings of the 54th Annual Design Automation Conference 2017, 9, 2017
162017
Efficient statistical validation of machine learning systems for autonomous driving
W Shi, MB Alawieh, X Li, H Yu, N Arechiga, N Tomatsu
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2016
162016
Lithography hotspot detection using a double inception module architecture
J Chen, Y Lin, Y Guo, M Zhang, MB Alawieh, DZ Pan
Journal of Micro/Nanolithography, MEMS, and MOEMS 18 (1), 013507-013507, 2019
152019
Efficient hierarchical performance modeling for analog and mixed-signal circuits via bayesian co-learning
MB Alawieh, F Wang, X Li
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
142018
Generative Learning in VLSI Design for Manufacturability: Current Status and Future Directions
MB Alawieh, Y Lin, W Ye, DZ Pan
Journal of Microelectronic Manufacturing, 2019
122019
Efficient analog circuit optimization using sparse regression and error margining
MB Alawieh, F Wang, R Kanj, X Li, R Joshi
2016 17th International Symposium on Quality Electronic Design (ISQED), 410-415, 2016
112016
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