| Review of solution-processed oxide thin-film transistors SJ Kim, S Yoon, HJ Kim Japanese Journal of Applied Physics 53 (2S), 02BA02, 2014 | 311 | 2014 |
| Large ferroelectric polarization of TiN/Hf0. 5Zr0. 5O2/TiN capacitors due to stress-induced crystallization at low thermal budget SJ Kim, D Narayan, JG Lee, J Mohan, JS Lee, J Lee, HS Kim, YC Byun, ... Applied Physics Letters 111 (24), 2017 | 309 | 2017 |
| Ferroelectric Hf0.5Zr0.5O2 Thin Films: A Review of Recent Advances SJ Kim, J Mohan, SR Summerfelt, J Kim JOM 71 (1), 246-255, 2019 | 300 | 2019 |
| Effect of film thickness on the ferroelectric and dielectric properties of low-temperature (400° C) Hf0. 5Zr0. 5O2 films SJ Kim, J Mohan, J Lee, JS Lee, AT Lucero, CD Young, L Colombo, ... Applied Physics Letters 112 (17), 2018 | 146 | 2018 |
| Activation of sputter-processed indium–gallium–zinc oxide films by simultaneous ultraviolet and thermal treatments YJ Tak, B Du Ahn, SP Park, SJ Kim, AR Song, KB Chung, HJ Kim Scientific reports 6 (1), 21869, 2016 | 91 | 2016 |
| The effect of La in InZnO systems for solution-processed amorphous oxide thin-film transistors DN Kim, DL Kim, GH Kim, SJ Kim, YS Rim, WH Jeong, HJ Kim Applied Physics Letters 97 (19), 2010 | 81 | 2010 |
| Approaches to label-free flexible DNA biosensors using low-temperature solution-processed InZnO thin-film transistors J Jung, SJ Kim, KW Lee, DH Yoon, Y Kim, HY Kwak, SR Dugasani, ... Biosensors and Bioelectronics 55, 99-105, 2014 | 71 | 2014 |
| Low-voltage operation and high endurance of 5-nm ferroelectric Hf0. 5Zr0. 5O2 capacitors SJ Kim, J Mohan, HS Kim, J Lee, CD Young, L Colombo, SR Summerfelt, ... Applied Physics Letters 113 (18), 2018 | 69 | 2018 |
| Boosting Visible Light Absorption of Metal-Oxide-Based Phototransistors via Heterogeneous In–Ga–Zn–O and CH3NH3PbI3 Films YJ Tak, DJ Kim, WG Kim, JH Lee, SJ Kim, JH Kim, HJ Kim ACS applied materials & interfaces 10 (15), 12854-12861, 2018 | 62 | 2018 |
| Low-cost label-free electrical detection of artificial DNA nanostructures using solution-processed oxide thin-film transistors SJ Kim, J Jung, KW Lee, DH Yoon, TS Jung, SR Dugasani, SH Park, ... ACS applied materials & interfaces 5 (21), 10715-10720, 2013 | 61 | 2013 |
| Low-temperature solution-processed ZrO2 gate insulators for thin-film transistors using high-pressure annealing SJ Kim, DH Yoon, YS Rim, HJ Kim Electrochemical and Solid State Letters 14 (11), E35, 2011 | 56 | 2011 |
| Solution-processed indium oxide electron transporting layers for high-performance and photo-stable perovskite and organic solar cells S Yoon, SJ Kim, HS Kim, JS Park, IK Han, JW Jung, M Park Nanoscale 9 (42), 16305-16312, 2017 | 45 | 2017 |
| A Comprehensive Study on the Effect of TiN Top and Bottom Electrodes on Atomic Layer Deposited Ferroelectric Hf0. 5Zr0. 5O2 Thin Films SJ Kim, J Mohan, HS Kim, SM Hwang, N Kim, YC Jung, A Sahota, K Kim, ... Materials 13 (13), 2968, 2020 | 41 | 2020 |
| A solution-processed quaternary oxide system obtained at low-temperature using a vertical diffusion technique S Yoon, SJ Kim, YJ Tak, HJ Kim Scientific reports 7 (1), 43216, 2017 | 39 | 2017 |
| Hole transport enhancing effects of polar solvents on poly (3, 4-ethylenedioxythiophene): poly (styrene sulfonic acid) for organic solar cells JS Yang, SH Oh, DL Kim, SJ Kim, HJ Kim ACS applied materials & interfaces 4 (10), 5394-5398, 2012 | 39 | 2012 |
| Low‐Thermal‐Budget Fluorite‐Structure Ferroelectrics for Future Electronic Device Applications HJ Kim, Y An, YC Jung, J Mohan, JG Yoo, YI Kim, H Hernandez-Arriaga, ... physica status solidi (RRL)–Rapid Research Letters 15 (5), 2100028, 2021 | 36 | 2021 |
| Multifunctional, Room-Temperature Processable, Heterogeneous Organic Passivation Layer for Oxide Semiconductor Thin-Film Transistors YJ Tak, ST Keene, BH Kang, WG Kim, SJ Kim, A Salleo, HJ Kim ACS Applied Materials & Interfaces 12 (2), 2615-2624, 2019 | 34 | 2019 |
| Investigation of the Physical Properties of Plasma Enhanced Atomic Layer Deposited Silicon Nitride as Etch Stopper HS Kim, X Meng, SJ Kim, AT Lucero, L Cheng, YC Byun, JS Lee, ... ACS applied materials & interfaces 10 (51), 44825-44833, 2018 | 33 | 2018 |
| Stress-Induced Crystallization of Thin Hf1–XZrXO2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic … SJ Kim, J Mohan, JS Lee, HS Kim, J Lee, CD Young, L Colombo, ... ACS applied materials & interfaces 11 (5), 5208-5214, 2019 | 32 | 2019 |
| Electrical responses of artificial DNA nanostructures on solution-processed In-Ga-Zn-O thin-film transistors with multistacked active layers J Jung, SJ Kim, DH Yoon, B Kim, SH Park, HJ Kim ACS applied materials & interfaces 5 (1), 98-102, 2013 | 32 | 2013 |
Hyun Jae KimYonsei University確認したメール アドレス: yonsei.ac.kr
