Follow
Vasileios Tenentes
Vasileios Tenentes
Associate Professor, University of Ioannina
Verified email at arm.com
Title
Cited by
Cited by
Year
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
Natural Hazards and Earth System Science 14 (1), 143-153, 2014
862014
Aging Benefits in Nanometer CMOS Designs
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017
412017
Reliable power gating with NBTI aging benefits
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016
302016
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008
302008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
282010
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
232017
Defect aware x-filling for low-power scan testing
S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
232010
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating
D Rossi, V Tenentes, S Khursheed, B Al-Hashimi
20th IEEE European Test Symposium (ETS 2015), 2015
202015
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories
D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi
IEEE international on-Line testing symposium (IOLTS'15), 2015
192015
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets
X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011
182011
High-quality statistical test compression with narrow ATE interface
V Tenentes, X Kavousianos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
162013
Exploiting aging benefits for the design of reliable drowsy cache memories
D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018
132018
BTI aware thermal management for reliable DVFS designs
H Chahal, V Tenentes, D Rossi, BM Al-Hashimi
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016
132016
High quality testing of grid style power gating
V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang
2014 IEEE 23rd Asian Test Symposium, 186-191, 2014
102014
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
Natural Hazards Earth Systems Science Discussion 1, 4777-4800, 2013
102013
Low power test-compression for high test-quality and low test-data volume
V Tenentes, X Kavousianos
2011 Asian Test Symposium, 46-53, 2011
102011
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
V Tenentes, X Kavousianos
2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 747-754, 2011
102011
Recycled IC detection through aging sensor
D Rossi, V Tenentes, S Khursheed, SM Reddy
2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018
92018
MeV ion event observed at 0950 UT on 4 May 1998 at a quasi‐perpendicular bow shock region: New observations and an alternative interpretation on its origin
GC Anagnostopoulos, V Tenentes, ES Vassiliadis
Journal of Geophysical Research: Space Physics 114 (A9), 2009
82009
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology
B Halak, V Tenentes, D Rossi
Microelectronics Reliability 67, 74-81, 2016
72016
The system can't perform the operation now. Try again later.
Articles 1–20