Chia-Yu Hsu
Chia-Yu Hsu
Department of Industrial Engineering and Management, National Taipei University of Technology
Verified email at mail.ntut.edu.tw
Title
Cited by
Cited by
Year
Semiconductor fault detection and classification for yield enhancement and manufacturing intelligence
CF Chien, CY Hsu, PN Chen
Flexible Services and Manufacturing Journal 25 (3), 367-388, 2013
922013
Manufacturing intelligence to forecast and reduce semiconductor cycle time
CF Chien, CY Hsu, CW Hsiao
Journal of Intelligent Manufacturing 23 (6), 2281-2294, 2012
742012
Development of a cloud-based service framework for energy conservation in a sustainable intelligent transportation system
CY Hsu, CS Yang, LC Yu, CF Lin, HH Yao, DY Chen, KR Lai, PC Chang
International Journal of Production Economics 164, 454-461, 2015
612015
A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing
CF Chien, CY Hsu
Journal of Intelligent Manufacturing 17 (4), 429-439, 2006
492006
UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing
CF Chien, CY Hsu
Journal of Intelligent Manufacturing 22 (3), 399-412, 2011
472011
Overall wafer effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
CF Chien, CY Hsu, KH Chang
Computers & Industrial Engineering 65 (1), 117-127, 2013
462013
Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller
CF Chien, YJ Chen, CY Hsu, HK Wang
IEEE Transactions on Automation Science and Engineering 11 (2), 473-484, 2013
382013
A genetic algorithm for the multi-objective optimization of mixed-model assembly line based on the mental workload
X Zhao, CY Hsu, PC Chang, L Li
Engineering Applications of Artificial Intelligence 47, 140-146, 2016
312016
Agent-based fuzzy constraint-directed negotiation mechanism for distributed job shop scheduling
CY Hsu, BR Kao, KR Lai
Engineering Applications of Artificial Intelligence 53, 140-154, 2016
292016
Data mining for optimizing IC feature designs to enhance overall wafer effectiveness
CF Chien, CY Hsu
IEEE Transactions on Semiconductor Manufacturing 27 (1), 71-82, 2013
272013
A novel approach to hedge and compensate the critical dimension variation of the developed-and-etched circuit patterns for yield enhancement in semiconductor manufacturing
CF Chien, YJ Chen, CY Hsu
Computers & Operations Research 53, 309-318, 2015
242015
A linkage mining in block-based evolutionary algorithm for permutation flowshop scheduling problem
CY Hsu, PC Chang, MH Chen
Computers & Industrial Engineering 83, 159-171, 2015
222015
An agent-based fuzzy constraint-directed negotiation model for solving supply chain planning and scheduling problems
CY Hsu, BR Kao, L Li, KR Lai
Applied Soft Computing 48, 703-715, 2016
212016
Manufacturing intelligence and innovation for digital manufacturing and operational excellence
CF Chien, M Gen, Y Shi, CY Hsu
Journal of Intelligent Manufacturing 25 (5), 845-847, 2014
162014
Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing
CY Hsu, CF Chien, PN Chen
Journal of the Chinese Institute of Industrial Engineers 29 (5), 303-313, 2012
162012
Critical success factors for improving decision quality on collaborative design in the IC supply chain
JZ Wu, CY Hsu
品質學報 16 (2), 95-108, 2009
152009
Similarity matching of wafer bin maps for manufacturing intelligence to empower Industry 3.5 for semiconductor manufacturing
CY Hsu, WJ Chen, JC Chien
Computers & Industrial Engineering 142, 106358, 2020
142020
Data-driven approach for fault detection and diagnostic in semiconductor manufacturing
SKS Fan, CY Hsu, DM Tsai, F He, CC Cheng
IEEE Transactions on Automation Science and Engineering 17 (4), 1925-1936, 2020
132020
A back-propagation neural network with a distributed lag model for semiconductor vendor-managed inventory
CY Hsu, SC Lin, CF Chien
Journal of Industrial and Production Engineering 32 (3), 149-161, 2015
132015
A Review on Fault Detection and Process Diagnostics in Industrial Processes
YJ Park, SKS Fan, CY Hsu
Processes 8 (9), 1123, 2020
122020
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