| Control of microcantilevers in dynamic force microscopy using time delayed feedback K Yamasue, T Hikihara Review of scientific instruments 77 (5), 2006 | 60 | 2006 |
| Controlling chaos in dynamic-mode atomic force microscope K Yamasue, K Kobayashi, H Yamada, K Matsushige, T Hikihara Physics Letters A 373 (35), 3140-3144, 2009 | 52 | 2009 |
| Interfacial charge states in graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry K Yamasue, H Fukidome, K Funakubo, M Suemitsu, Y Cho Physical Review Letters 114 (22), 226103, 2015 | 35 | 2015 |
| Two-dimensional defect mapping of the interface J Woerle, BC Johnson, C Bongiorno, K Yamasue, G Ferro, D Dutta, ... Physical Review Materials 3 (8), 084602, 2019 | 30 | 2019 |
| Domain of attraction for stabilized orbits in time delayed feedback controlled Duffing systems K Yamasue, T Hikihara Physical Review E 69 (5), 056209, 2004 | 29 | 2004 |
| Scanning nonlinear dielectric potentiometry K Yamasue, Y Cho Review of Scientific Instruments 86 (9), 2015 | 23 | 2015 |
| Lateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants N Chinone, K Yamasue, Y Hiranaga, K Honda, Y Cho Applied Physics Letters 101 (21), 2012 | 15 | 2012 |
| Persistence of chaos in a time-delayed-feedback controlled Duffing system K Yamasue, T Hikihara Physical Review E 73 (3), 036209, 2006 | 14 | 2006 |
| Atomic dipole moment distribution on a hydrogen-adsorbed Si (111)-(7× 7) surface observed by noncontact scanning nonlinear dielectric microscopy D Mizuno, K Yamasue, Y Cho Applied Physics Letters 103 (10), 2013 | 13 | 2013 |
| Improved study of electric dipoles on the Si (100)-2× 1 surface by non-contact scanning nonlinear dielectric microscopy M Suzuki, K Yamasue, M Abe, Y Sugimoto, Y Cho Applied Physics Letters 105 (10), 2014 | 11 | 2014 |
| Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy K Yamasue, Y Cho Appl. Phys. Lett. 112 (24), 243102, 2018 | 9 | 2018 |
| Simultaneous measurement of tunneling current and atomic dipole moment on Si (111)-(7× 7) surface by noncontact scanning nonlinear dielectric microscopy K Yamasue, Y Cho Journal of Applied Physics 113 (1), 2013 | 9 | 2013 |
| A numerical study on suspension of molecules by microcantilever probe T Hikihara, K Yamasue The Fifth International Symposium on Linear Drives for Industry Applications …, 2005 | 8 | 2005 |
| Influence of non-uniform interface defect clustering on field-effect mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation K Yamasue, Y Yamagishi, Y Cho Materials science forum 1004, 627-634, 2020 | 7 | 2020 |
| A Study on Evaluation of Interface Defect Density on High-K/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy K Suzuki, K Yamasue, Y Cho 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | 7 | 2019 |
| Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs K Yamasue, Y Cho Microelectronics Reliability 114, 113829, 2020 | 6 | 2020 |
| Atomic-dipole-moment induced local surface potential on Si (111)-(7× 7) surface studied by non-contact scanning nonlinear dielectric microscopy K Yamasue, M Abe, Y Sugimoto, Y Cho Applied Physics Letters 105 (12), 2014 | 6 | 2014 |
| Observation of nanoscale ferroelectric domains using super-higher-order nonlinear dielectric microscopy N Chinone, K Yamasue, Y Hiranaga, Y Cho Japanese Journal of Applied Physics 51 (9S1), 09LE07, 2012 | 5 | 2012 |
| Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy K Yamasue, Y Cho Microelectronics Reliability 135, 114588, 2022 | 4 | 2022 |
| Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy J Hirota, K Yamasue, Y Cho Microelectronics Reliability 114, 113774, 2020 | 4 | 2020 |
