フォロー
Cheng Xue
Cheng Xue
確認したメール アドレス: qti.qualcomm.com
タイトル
引用先
引用先
DREAMS: DFM rule EvAluation using manufactured silicon
RD Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 99-106, 2013
272013
DFM evaluation using IC diagnosis data
RDS Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
122016
Test-set reordering for improving diagnosability
C Xue, RD Blanton
2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017
102017
A one-pass test-selection method for maximizing test coverage
C Xue, RD Shawn
2015 33rd IEEE International Conference on Computer Design (ICCD), 621-628, 2015
82015
Predicting IC defect level using diagnosis
C Xue, RDS Blanton
2014 IEEE 23rd Asian Test Symposium, 113-118, 2014
72014
Optimizing IC Testing for Diagnosability, Effectiveness and Efficiency
C Xue
Carnegie Mellon University, 2016
2016
Delay Fault Model Evaluation Using Tester Response Data
C Xue, RD Blanton
International Symposium for Testing and Failure Analysis 39791, 532-537, 2012
2012
現在システムで処理を実行できません。しばらくしてからもう一度お試しください。
論文 1–7