Nonequilibrium fluctuation relations in a quantum coherent conductor S Nakamura, Y Yamauchi, M Hashisaka, K Chida, K Kobayashi, T Ono, ... Physical review letters 104 (8), 080602, 2010 | 132 | 2010 |
Power generator driven by Maxwell’s demon K Chida, S Desai, K Nishiguchi, A Fujiwara Nature communications 8 (1), 15301, 2017 | 117 | 2017 |
Evolution of the Kondo effect in a quantum dot probed by shot noise Y Yamauchi, K Sekiguchi, K Chida, T Arakawa, S Nakamura, K Kobayashi, ... Physical review letters 106 (17), 176601, 2011 | 97 | 2011 |
Fluctuation theorem and microreversibility in a quantum coherent conductor S Nakamura, Y Yamauchi, M Hashisaka, K Chida, K Kobayashi, T Ono, ... Physical Review B—Condensed Matter and Materials Physics 83 (15), 155431, 2011 | 68 | 2011 |
Sub-Poissonian shot noise in CoFeB/MgO/CoFeB-based magnetic tunneling junctions T Arakawa, K Sekiguchi, S Nakamura, K Chida, Y Nishihara, D Chiba, ... Applied Physics Letters 98 (20), 2011 | 36 | 2011 |
Low-frequency and shot noises in CoFeB/MgO/CoFeB magnetic tunneling junctions T Arakawa, T Tanaka, K Chida, S Matsuo, Y Nishihara, D Chiba, ... Physical Review B—Condensed Matter and Materials Physics 86 (22), 224423, 2012 | 34 | 2012 |
Universality of bias-and temperature-induced dephasing in ballistic electronic interferometers Y Yamauchi, M Hashisaka, S Nakamura, K Chida, S Kasai, T Ono, ... Physical Review B—Condensed Matter and Materials Physics 79 (16), 161306, 2009 | 32 | 2009 |
Thermal-noise suppression in nano-scale Si field-effect transistors by feedback control based on single-electron detection K Chida, K Nishiguchi, G Yamahata, H Tanaka, A Fujiwara Applied Physics Letters 107 (7), 2015 | 29 | 2015 |
Noise measurement system at electron temperature down to 20 mK with combinations of the low pass filters M Hashisaka, Y Yamauchi, K Chida, S Nakamura, K Kobayashi, T Ono Review of Scientific Instruments 80 (9), 2009 | 27 | 2009 |
Experimental proof of universal conductance fluctuation in quasi-one-dimensional epitaxial BiSe wires S Matsuo, K Chida, D Chiba, T Ono, K Slevin, K Kobayashi, T Ohtsuki, ... Physical Review B—Condensed Matter and Materials Physics 88 (15), 155438, 2013 | 26 | 2013 |
Observation of full shot noise in CoFeB/MgO/CoFeB-based magnetic tunneling junctions K Sekiguchi, T Arakawa, Y Yamauchi, K Chida, M Yamada, H Takahashi, ... Applied Physics Letters 96 (25), 2010 | 24 | 2010 |
Avalanche electron bunching in a Corbino disk in the quantum Hall effect breakdown regime K Chida, T Hata, T Arakawa, S Matsuo, Y Nishihara, T Tanaka, T Ono, ... Physical Review B 89 (23), 235318, 2014 | 17 | 2014 |
Shot noise induced by electron-nuclear spin-flip scattering in a nonequilibrium quantum wire K Chida, M Hashisaka, Y Yamauchi, S Nakamura, T Arakawa, T Machida, ... Physical Review B—Condensed Matter and Materials Physics 85 (4), 041309, 2012 | 16 | 2012 |
Signature of coherent transport in epitaxial spinel-based magnetic tunnel junctions probed by shot noise measurement T Tanaka, T Arakawa, K Chida, Y Nishihara, D Chiba, K Kobayashi, T Ono, ... Applied Physics Express 5 (5), 053003, 2012 | 11 | 2012 |
Giant Fano factor and bistability in a Corbino disk in the quantum Hall effect breakdown regime T Hata, T Arakawa, K Chida, S Matsuo, K Kobayashi Journal of Physics: Condensed Matter 28 (5), 055801, 2016 | 10 | 2016 |
Observation of finite excess noise in the voltage-biased quantum Hall regime as a precursor for breakdown K Chida, T Arakawa, S Matsuo, Y Nishihara, T Tanaka, D Chiba, T Ono, ... Physical Review B—Condensed Matter and Materials Physics 87 (15), 155313, 2013 | 10 | 2013 |
Single-electron manipulation in an attofarad-capacitor DRAM K Nishiguchi, K Chida, A Fujiwara ECS Transactions 104 (4), 33, 2021 | 4 | 2021 |
Single-Electron-Resolution Noise Analysis and Application Using High-Sensitivity Charge Sensor. K NISHIGUCHI, K CHIDA, A FUJIWARA AAPPS Bulletin 29 (3), 2019 | 3 | 2019 |
Noise-to-energy conversion in a nanometer-scale dot observed with electron counting statistics K Chida, A Fujiwara, K Nishiguchi Applied Physics Letters 122 (21), 2023 | 2 | 2023 |
Seebeck effect in a nanometer-scale dot in a Si nanowire observed with electron counting statistics K Chida, A Fujiwara, K Nishiguchi Applied Physics Letters 121 (18), 2022 | 2 | 2022 |