Quantitative elemental mapping at atomic resolution using X-ray spectroscopy G Kothleitner, MJ Neish, NR Lugg, SD Findlay, W Grogger, F Hofer, ... Physical Review Letters 112 (8), 085501, 2014 | 145 | 2014 |
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images KE MacArthur, TJ Pennycook, E Okunishi, AJ D'Alfonso, NR Lugg, ... Ultramicroscopy 133, 109-119, 2013 | 105 | 2013 |
On the quantitativeness of EDS STEM NR Lugg, G Kothleitner, N Shibata, Y Ikuhara Ultramicroscopy 151, 150-159, 2015 | 87 | 2015 |
Direct observation of oxygen vacancy distribution across yttria-stabilized zirconia grain boundaries B Feng, NR Lugg, A Kumamoto, Y Ikuhara, N Shibata Acs Nano 11 (11), 11376-11382, 2017 | 76 | 2017 |
Picometer-scale atom position analysis in annular bright-field STEM imaging P Gao, A Kumamoto, R Ishikawa, N Lugg, N Shibata, Y Ikuhara Ultramicroscopy 184, 177-187, 2018 | 73 | 2018 |
Probing the internal atomic charge density distributions in real space G Sánchez-Santolino, NR Lugg, T Seki, R Ishikawa, SD Findlay, Y Kohno, ... ACS nano 12 (9), 8875-8881, 2018 | 54 | 2018 |
Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: a theoretical study SD Findlay, NR Lugg, N Shibata, LJ Allen, Y Ikuhara Ultramicroscopy 111 (8), 1144-1154, 2011 | 51 | 2011 |
Achromatic Elemental Mapping Beyond the Nanoscale in the<? format?> Transmission Electron Microscope KW Urban, J Mayer, JR Jinschek, MJ Neish, NR Lugg, LJ Allen Physical Review Letters 110 (18), 185507, 2013 | 47 | 2013 |
Chemical imaging at atomic resolution as a technique to refine the local structure of nanocrystals S Trasobares, M López‐Haro, M Kociak, K March, F de La Peña, ... Angewandte Chemie International Edition 4 (50), 868-872, 2011 | 37 | 2011 |
Elemental mapping in scanning transmission electron microscopy LJ Allen, AJ D'Alfonso, SD Findlay, JM LeBeau, NR Lugg, S Stemmer Journal of Physics: Conference Series 241, 012061, 2010 | 30 | 2010 |
Atomic resolution imaging using electron energy-loss phonon spectroscopy NR Lugg, BD Forbes, SD Findlay, LJ Allen Physical Review B 91 (14), 144108, 2015 | 28 | 2015 |
Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data NR Lugg, M Haruta, MJ Neish, SD Findlay, T Mizoguchi, K Kimoto, ... Applied Physics Letters 101 (18), 2012 | 28 | 2012 |
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging HG Brown, R Ishikawa, G Sánchez-Santolino, NR Lugg, Y Ikuhara, ... Ultramicroscopy 173, 76-83, 2017 | 26 | 2017 |
Detecting the direction of oxygen bonding in SrTiO MJ Neish, NR Lugg, SD Findlay, M Haruta, K Kimoto, LJ Allen Physical Review B—Condensed Matter and Materials Physics 88 (11), 115120, 2013 | 24 | 2013 |
Interfacial atomic structure of twisted few-layer graphene R Ishikawa, NR Lugg, K Inoue, H Sawada, T Taniguchi, N Shibata, ... Scientific reports 6 (1), 21273, 2016 | 23 | 2016 |
Atomic resolution chemical bond analysis of oxygen in La2CuO4 M Haruta, T Nagai, NR Lugg, MJ Neish, M Nagao, K Kurashima, LJ Allen, ... Journal of Applied Physics 114 (8), 2013 | 20 | 2013 |
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images MAKE EH, TJ Pennycook, E Okunishi, AJ DrAlfonso, NR Lugg, LJ Allen, ... Ultramicroscopy 133, 109-119, 2013 | 20 | 2013 |
Energy-filtered transmission electron microscopy based on inner-shell ionization NR Lugg, B Freitag, SD Findlay, LJ Allen Ultramicroscopy 110 (8), 981-990, 2010 | 18 | 2010 |
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystals NR Lugg, MJ Neish, SD Findlay, LJ Allen Microscopy and Microanalysis 20 (4), 1078-1089, 2014 | 15 | 2014 |
On the quantitativeness of grain boundary chemistry using STEM EDS: A ZrO2 Σ9 model grain boundary case study B Feng, NR Lugg, A Kumamoto, N Shibata, Y Ikuhara Ultramicroscopy 193, 33-38, 2018 | 10 | 2018 |