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Co-authors
- Noriharu SuematsuProfessor, Tohoku UniversityVerified email at riec.tohoku.ac.jp
- Hiroshi OGUMANational Institute of Technology, Toyama College, Dep. of Electronics and Computer EngineeringVerified email at nc-toyama.ac.jp
- Satoshi YoshidaRyukoku universityVerified email at rins.ryukoku.ac.jp
- Kohei AkimotoDepartment of Communications Engineering, School of engineering, Tohoku UniversityVerified email at riec.tohoku.ac.jp
- Yukimasa NagaiMERLVerified email at merl.com
- Daliso BandaThe University of ZambiaVerified email at unza.zm
- Kazuya MasuTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Hideki FukudomeTohoku UniversityVerified email at riec.tohoku.ac.jp
- Tomohiko ShibataDOWA Electronics MaterialsVerified email at dowa.co.jp
- Fumiyuki AdachiSpecially Appointed Research Fellow, Tohoku U., International Research Institute of Disaster ScienceVerified email at ecei.tohoku.ac.jp
- Kazuya MasuTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Kazuaki KunihiroTokyo Institute of TechnologyVerified email at ssc.pe.titech.ac.jp
- Yoshihito HiranoTechnical Adviser, Mitsubishi ElectricVerified email at dh.MitsubishiElectric.co.jp
- Qiang ChenTohoku University
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Suguru Kameda
Research Institute for Nanodevices, Hiroshima University
Verified email at hiroshima-u.ac.jp - Homepage