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Co-authors
Young SunInstitute of Physics, Chinese Academy of Sciences, ChinaVerified email at iphy.ac.cn
Qi LiuFudan UniversityVerified email at ime.ac.cn
Yisheng ChaiChongqing UniversityVerified email at cqu.edu.cn
Zhongrui WangSouthern University of Science and TechnologyVerified email at sustech.edu.cn
Dou ChunmengIMECASVerified email at ime.ac.cn
Xumeng ZhangFrontier Institute of Chip and System, Fudan UniversityVerified email at fudan.edu.cn
Shaocong WangUniversity of Notre DameVerified email at nd.edu
Hangbing LvInstitute of Microelectronics, Chinese Academy of SciencesVerified email at ime.ac.cn
Chuansen YangInstitute of Physics, Chinese Academy of SciencesVerified email at ssc.iphy.ac.cn
Jianxin ShenPhD, Institution of Physics, Chinese Academy of SciencesVerified email at iphy.ac.cn
Zuheng WuSchool of Integrated Circuits, Anhui University, Hefei,Anhui,230601, P. R. ChinaVerified email at ahu.edu.cn
Yongqing Li (李永庆)Institute of Physics, Chinese Academy of SciencesVerified email at iphy.ac.cn