フォロー
Thiago Albuquerque de Assis
Thiago Albuquerque de Assis
Associate Professor
確認したメール アドレス: ufba.br - ホームページ
タイトル
引用先
引用先
Geometria fractal: propriedades e características de fractais ideais
TA Assis, JG Vivas Miranda, FB Mota, RFS Andrade, CMC Castilho
Revista Brasileira de ensino de física 30, 2304.1-2304.10, 2008
892008
Minimal domain size necessary to simulate the field enhancement factor numerically with specified precision
TA de Assis, FF Dall’Agnol
Journal of Vacuum Science & Technology B 37 (2), 2019
392019
Mechanically stable nanostructures with desirable characteristic field enhancement factors: a response from scale invariance in electrostatics
TA de Assis, FF Dall’Agnol
Nanotechnology 27 (44), 44LT01, 2016
322016
Dissolution of minerals with rough surfaces
TA de Assis, FDAA Reis
Geochimica et Cosmochimica Acta 228, 27-41, 2018
302018
Physics-based derivation of a formula for the mutual depolarization of two post-like field emitters
FF Dall’Agnol, TA De Assis, RG Forbes
Journal of Physics: Condensed Matter 30 (37), 375703, 2018
252018
The consequences of dependence between the formal area efficiency and the macroscopic electric field on linearity behavior in Fowler–Nordheim plots
TA De Assis, FF Dall’Agnol, RFS Andrade
Journal of Physics D: Applied Physics 49 (35), 355301, 2016
222016
Field emitter electrostatics: a review with special emphasis on modern high-precision finite-element modelling
TA de Assis, FF Dall’Agnol, RG Forbes
Journal of Physics: Condensed Matter 34 (49), 493001, 2022
202022
Universal trade-off between proximity and aspect-ratio in optimizing the field enhancement factor of large area field emitters
TA de Assis, FF Dall'Agnol, M Cahay
Applied Physics Letters 116 (20), 2020
202020
Evidence of universal inverse-third power law for the shielding-induced fractional decrease in apex field enhancement factor at large spacings: a response via accurate Laplace …
TA De Assis, FF Dall’Agnol
Journal of Physics: Condensed Matter 30 (19), 195301, 2018
202018
Trade-off between the electrostatic efficiency and mechanical stability of two-stage field emitter structures
TA de Assis, FF Dall'Agnol
Journal of Applied Physics 121 (1), 2017
192017
Close proximity electrostatic effect from small clusters of emitters
FF Dall’Agnol, TA De Assis
Journal of Physics: Condensed Matter 29 (40), 40LT01, 2017
182017
Dynamic scaling and temperature effects in thin film roughening
TA de Assis, FDAA Reis
Journal of Statistical Mechanics: Theory and Experiment 2015 (6), P06023, 2015
182015
Smoothening in thin-film deposition on rough substrates
TA De Assis, FDA Aarao Reis
Physical Review E 92 (5), 052405, 2015
162015
Improving the extraction of characteristic field enhancement factors from nonlinear Fowler–Nordheim plots: Call for experimental tests
TA de Assis
Journal of Vacuum Science & Technology B 33 (5), 2015
162015
The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots
TA De Assis
Scientific Reports 5 (1), 10175, 2015
162015
Determining the field enhancement factors of various field electron emitters with high numerical accuracy
FF Dall’Agnol, SV Filippov, EO Popov, AG Kolosko, TA de Assis
Journal of Vacuum Science & Technology B 39 (3), 2021
152021
Looped carbon nanotube fibers as cathodes with giant field enhancement factors
FF Dall'Agnol, TA de Assis, SB Fairchild, J Ludwick, G Tripathi, M Cahay
Applied Physics Letters 117 (25), 2020
142020
Statistics of adatom diffusion in a model of thin film growth
EEM Luis, ISS Carrasco, TA de Assis, FDAA Reis
Physical Review E 102 (1), 012805, 2020
142020
Optimal detrended fluctuation analysis as a tool for the determination of the roughness exponent of the mounded surfaces
EEM Luis, TA de Assis, SC Ferreira
Physical Review E 95 (4), 042801, 2017
142017
Influence of the distribution of local field enhancement factors on the shape of the current-voltage characteristics of carbon-nanotube-based large-area emitters
EO Popov, AG Kolosko, SV Filippov, TA de Assis
Vacuum 173, 109159, 2020
132020
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