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Sheng-Tsaing Tseng
Sheng-Tsaing Tseng
Verified email at stat.nthu.edu.tw
Title
Cited by
Cited by
Year
Mis-specification analysis of linear degradation models
CY Peng, ST Tseng
IEEE Transactions on Reliability 58 (3), 444-455, 2009
4302009
Optimal design for step-stress accelerated degradation tests
CM Liao, ST Tseng
IEEE Transactions on Reliability 55 (1), 59-66, 2006
3032006
Optimal step-stress accelerated degradation test plan for gamma degradation processes
ST Tseng, N Balakrishnan, CC Tsai
IEEE Transactions on Reliability 58 (4), 611-618, 2009
2752009
Optimal design for degradation tests based on gamma processes with random effects
CC Tsai, ST Tseng, N Balakrishnan
IEEE Transactions on Reliability 61 (2), 604-613, 2012
1902012
Using degradation data to improve fluorescent lamp reliability
ST Tseng, M Hamada, CH Chiao
Journal of Quality Technology 27 (4), 363-369, 1995
1901995
Determination of burn‐in parameters and residual life for highly reliable products
ST Tseng, J Tang, IH Ku
Naval Research Logistics (NRL) 50 (1), 1-14, 2003
1672003
Optimal production run length for products sold with warranty
RH Yeh, WT Ho, ST Tseng
European Journal of Operational Research 120 (3), 575-582, 2000
1532000
Mis-specification analyses of gamma and Wiener degradation processes
CC Tsai, ST Tseng, N Balakrishnan
Journal of Statistical Planning and Inference 141 (12), 3725-3735, 2011
1502011
Step-stress accelerated degradation analysis for highly reliable products
ST Tseng, ZC Wen
Journal of Quality Technology 32 (3), 209-216, 2000
1422000
Optimal preventive maintenance policy for deteriorating production systems
ST Tseng
IIE transactions 28 (8), 687-694, 1996
1341996
Stochastic diffusion modeling of degradation data
ST Tseng, CY Peng
Journal of data Science 5 (3), 315-333, 2007
1082007
Designing a degradation experiment
HF Yu, ST Tseng
Naval Research Logistics (NRL) 46 (6), 689-706, 1999
1041999
A study on a multivariate EWMA controller
ST Tseng, RJ Chou, SP Lee
Iie Transactions 34 (6), 541-549, 2002
952002
Statistical lifetime inference with skew-Wiener linear degradation models
CY Peng, ST Tseng
IEEE Transactions on Reliability 62 (2), 338-350, 2013
882013
A study of variable EWMA controller
ST Tseng, AB Yeh, F Tsung, YY Chan
IEEE Transactions on Semiconductor Manufacturing 16 (4), 633-643, 2003
872003
A termination rule for degradation experiments
ST Tseng, HF Yu
IEEE Transactions on Reliability 46 (1), 130-133, 1997
871997
Optimal burn-in policy by using an integrated Wiener process
ST Tseng, CY Peng
Iie Transactions 36 (12), 1161-1170, 2004
862004
Progressive-stress accelerated degradation test for highly-reliable products
CY Peng, ST Tseng
IEEE Transactions on Reliability 59 (1), 30-37, 2010
842010
Optimal burn-in policy for highly reliable products using gamma degradation process
CC Tsai, ST Tseng, N Balakrishnan
IEEE Transactions on Reliability 60 (1), 234-245, 2010
812010
The effects of inspection errors to the imperfect EMQ model
MJ Liou, ST Tseng, TM Lin
IIE transactions 26 (2), 42-51, 1994
731994
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