Follow
Yasuhisa Omura
Yasuhisa Omura
Kansai University, Academic Collaboration Associate
Verified email at kansai-u.ac.jp
Title
Cited by
Cited by
Year
Quantum-mechanical effects on the threshold voltage of ultrathin-SOI nMOSFETs
Y Omura, S Horiguchi, M Tabe, K Kishi
IEEE Electron Device Letters 14 (12), 569-571, 1993
3211993
0.1-mu m-gate, ultrathin-film CMOS devices using SIMOX substrate with 80-nm-thick buried oxide layer
Y Omura, S Nakashima, K Izumi, T Ishii
IEEE transactions on electron devices 40 (5), 1019-1022, 1993
1371993
Method of manufacturing SOI semiconductor element
Y Omura, Y Kunii, K Izumi
US Patent 5,188,973, 1993
921993
50-nm channel nMOSFET/SIMOX with an ultrathin 2-or 6-nm thick silicon layer and their significant features of operations
Y Omura, K Kurihara, Y Takahashi, T Ishiyama, Y Nakajima, K Izumi
IEEE Electron Device Letters 18 (5), 190-193, 1997
761997
Low-power 1/2 frequency dividers using 0.1-mu m CMOS circuits built with ultrathin SIMOX substrates
M Fujishima, K Asada, Y Omura, K Izumi
IEEE journal of solid-state circuits 28 (4), 510-512, 1993
591993
SIMOX technology and its application to CMOS LSIs
K Izumi, Y Ōmura, T Sakai
Journal of electronic materials 12, 845-861, 1983
551983
A 1-GHz/0.9-mW CMOS/SIMOX divide-by-128/129 dual-modulus prescaler using a divide-by-2/3 synchronous counter
Y Kado, M Suzuki, K Koike, Y Omura, K Izumi
IEICE transactions on electronics 76 (5), 853-857, 1993
541993
Proposal of a partial-ground-plane (PGP) silicon-on-insulator (SOI) MOSFET for deep sub-0.1-μm channel regime
SI Yanagi, A Nakakubo, Y Omura
IEEE Electron Device Letters 22 (6), 278-280, 2001
462001
A high-speed buried channel MOSFET isolated by an implanted silicon dioxide layer
K Ohwada, Y Omura, E Sano
IEEE Transactions on Electron Devices 28 (9), 1084-1087, 1981
391981
Physical basis and limitation of universal mobility behavior in fully depleted silicon-on-insulator Si inversion layers
M Shoji, Y Omura, M Tomizawa
Journal of applied physics 81 (2), 786-794, 1997
341997
A lateral, unidirectional, bipolar‐type insulated‐gate transistor—A novel semiconductor device
Y Ōmura
Applied Physics Letters 40 (6), 528-529, 1982
341982
Simplified analysis of body-contact effect for MOSFET/SOI
Y Omura, K Izumi
IEEE transactions on electron devices 35 (8), 1391-1393, 1988
331988
Temperature dependence of analog performance, linearity, and harmonic distortion for a ge-source tunnel FET
E Datta, A Chattopadhyay, A Mallik, Y Omura
IEEE Transactions on Electron Devices 67 (3), 810-815, 2020
322020
Quantum mechanical transport characteristics in ultimately miniaturized MOSFETs/SIMOX
Y Omura, T Ishiyama, M Shoji, K Izumi
Proceedings of the 10th International Symposium on SOI Technology and …, 1996
321996
MOS Devices for Low-voltage and Low-energy Applications
Y Omura, A Mallik, N Matsuo
John Wiley & Sons, 2017
312017
Impact of fin aspect ratio on short-channel control and drivability of multiple-gate SOI MOSFET's
Y Omura, H Konishi, K Yoshimoto
JSTS: Journal of Semiconductor Technology and Science 8 (4), 302-310, 2008
312008
Quantum mechanical influences on short-channel effects in ultra-thin MOSFET/SIMOX devices
Y Omura, K Izumi
IEEE Electron Device Letters 17 (6), 300-302, 1996
301996
Detailed investigation of geometrical factor for pseudo-MOS transistor technique
K Komiya, N Bresson, S Sato, S Cristoloveanu, Y Omura
IEEE transactions on electron devices 52 (3), 406-412, 2005
292005
Physical background of substrate current characteristics and hot-carrier immunity in short-channel ultrathin-film MOSFET's/SIMOX
Y Omura, K Izumi
IEEE transactions on electron devices 41 (3), 352-358, 1994
291994
Subfemtojoule deep submicrometer-gate CMOS built in ultra-thin Si film on SIMOX substrates
H Miki, T Ohmameuda, M Kumon, K Asada, T Sugano, Y Omura, K Izumi, ...
IEEE transactions on electron devices 38 (2), 373-377, 1991
291991
The system can't perform the operation now. Try again later.
Articles 1–20