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Co-authors
Tadahiro KurodaKeio UniversityVerified email at kuroda.elec.keio.ac.jp
Takayasu SakuraiUniversity of TokyoVerified email at iis.u-tokyo.ac.jp
Yu-ichi HAYASHINara Institute of Science and TechnologyVerified email at is.naist.jp
Kiichi NiitsuNagoya UniversityVerified email at nuee.nagoya-u.ac.jp
Kazuo SakiyamaThe University of Electro-CommunicationsVerified email at uec.ac.jp
Naofumi HommaTohoku UniversityVerified email at riec.tohoku.ac.jp
Kohei MatsudaKobe UniversityVerified email at cs26.scitec.kobe-u.ac.jp
Shivam BhasinNTU SingaporeVerified email at ntu.edu.sg
Jean-Luc DangerLTCI, Télécom Paris, Institut Polytechnique de ParisVerified email at enst.fr
Hideharu AmanoKeio UniversityVerified email at am.ics.keio.ac.jp
Yusmeeraz YusofUniversiti Teknologi MalaysiaVerified email at utm.my
Hiroki MatsutaniDept of ICS, Keio UniversityVerified email at arc.ics.keio.ac.jp
Hayun ChungAssistant Professor of Electronics and Information Engineering, Korea UniversityVerified email at korea.ac.kr
Lan NanQualcomm Technologies Inc./ University of California, Los AngelesVerified email at ee.ucla.edu
Jakub BreierSenior Scientist (Embedded Security), Silicon Austria Labs, Graz, AustriaVerified email at silicon-austria.com
Zakaria NajmResearch Associate,NTU SingaporeVerified email at ntu.edu.sg
Won-Joo (Ryan) YunPrincipal Engineer, MicronVerified email at ieee.org