| Spontaneous degradation of flexible poly-Si TFTs subject to dynamic bending stress W Jiang, M Wang, H Wang, D Zhang IEEE Transactions on Electron Devices 66 (5), 2214-2218, 2019 | 19 | 2019 |
| Mechanical reliability of flexible a-InGaZnO TFTs under dynamic stretch stress X Wang, M Wang, W Jiang, D Zhang, H Wang, Q Shan IEEE Transactions on Electron Devices 65 (7), 2863-2869, 2018 | 15 | 2018 |
| A Kinetic Model for the Generation and Annihilation of Thermally Induced Carrier Donors in a Semiconducting Metal‐Oxide Thin Film Y Wang, W Jiang, X Xie, Z Xia, M Wong Small 18 (41), 2203346, 2022 | 12 | 2022 |
| Origin of spontaneous degradation of flexible poly-Si TFTs after dynamic bending W Jiang, B Li, X Li, M Wang, H Wang, D Zhang IEEE Electron Device Letters 41 (8), 1205-1208, 2020 | 8 | 2020 |
| Degradation of flexible LTPS TFTs under repetitive bending stress W Jiang, Q Shan, H Wang, D Zhang, M Wang 2018 9th Inthernational Conference on Computer Aided Design for Thin-Film …, 2018 | 5 | 2018 |
| P‐3: Conductive Indium‐Tin‐Zinc Oxide Formed Using an Oxygen Plasma Treatment Through a Silicon Oxide Cover Layer X Xie, K Chen, Z Zhou, W Jiang, Y Wang, S Wang, Z Xia, M Wong SID Symposium Digest of Technical Papers 54 (1), 1786-1789, 2023 | 2 | 2023 |
| Reliability of Flexible LTPS TFTs under Dynamic Mechanical Stress B Li, X Yin, W Jiang, M Wang, D Zhang, H Wang 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit …, 2020 | 1 | 2020 |
| Comparator with Non-Uniform Parameter Compensation using Dual-Gate Thin-Film Transistors X Liu, R Shi, W Jiang, X Xie, M Wong IEEE Electron Device Letters, 2024 | | 2024 |
| Dependence of the Electrical Behavior of an Indium-Gallium-Zinc Oxide Thin-Film Transistor on the Process Condition of Plasma-Based Fluorination W Jiang, Z Xia, M Wong IEEE Transactions on Electron Devices, 2023 | | 2023 |
| P‐1.3: Application of a Kinetic Model to the Characterization of Donor‐Defects in a Fluorinated Metal‐Oxide Semiconductor Y Wang, W Jiang, Z Xia, M Wong SID Symposium Digest of Technical Papers 54, 445-447, 2023 | | 2023 |
| P‐1.5: The effects of the temperature of fluorination treatment on the reliability of an indium‐gallium‐zinc oxide thin‐film transistor W Jiang, Y Wang, S Wang, Z Xia, M Wong SID Symposium Digest of Technical Papers 54, 451-453, 2023 | | 2023 |
王文 (Man WONG)Department of Electronic and Computer Engneering, The Hong Kong University of Science and Technology確認したメール アドレス: ieee.org
