フォロー
Talha Chohan
Talha Chohan
NaMLab gGmbH
確認したメール アドレス: namlab.com
タイトル
引用先
引用先
Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO2-Based FeFETs for In-Memory-Computing Applications
Y Raffel, S De, M Lederer, RR Olivo, R Hoffmann, S Thunder, L Pirro, ...
ACS Applied Electronic Materials 4 (11), 5292-5300, 2022
232022
Al2O3-TiO2 Nanolaminates for Conductive Silicon Surface Passivation
I Dirnstorfer, T Chohan, PM Jordan, M Knaut, DK Simon, JW Bartha, ...
IEEE Journal of Photovoltaics 6 (1), 86-91, 2015
202015
Interfacial layer engineering to enhance noise immunity of fefets for imc applications
Y Raffel, S Thunder, M Lederer, R Olivo, R Hoffmann, L Pirro, S Beyer, ...
2022 International Conference on IC Design and Technology (ICICDT), 8-11, 2022
172022
ALD Al2O3 based nanolaminates for solar cell applications
DK Simon, PM Jordan, M Knaut, T Chohan, T Mikolajick, I Dirnstorfer
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 1-6, 2015
122015
Impact of hot carrier stress on small-signal parameters of FD-SOI NMOSFETs
T Chohan, S Slesazeck, J Trommer, M Pesic, S Lehmann, A Pakfar, ...
2017 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2017
92017
Off-state impact on FDSOI ring oscillator degradation under high voltage stress
J Trommer, V Havel, T Chohan, F Mehmood, S Slesazeck, G Krause, ...
2018 International Integrated Reliability Workshop (IIRW), 1-5, 2018
82018
Demonstration of Large Polarization in Si-doped HfO2 Metal–Ferroelectric–Insulator-Semiconductor Capacitors with Good Endurance and Retention
JH Hsuen, M Lederer, L Kerkhofs, Y Raffel, L Pirro, T Chohan, K Seidel, ...
2023 International VLSI Symposium on Technology, Systems and Applications …, 2023
72023
Three level charge pumping on dielectric hafnium oxide gate
Y Raffel, M Drescher, R Olivo, M Lederer, R Hoffmann, L Pirro, T Chohan, ...
2022 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2022
72022
22FDSOI device towards RF and mmWave applications
Z Zhao, S Lehmann, WL Oo, AK Sahoo, S Syed, QH Le, DK Huynh, ...
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021
72021
1f-1t array: Current limiting transistor cascoded fefet memory array for variation tolerant vector-matrix multiplication operation
MR Sk, S Thunder, F Müller, N Laleni, Y Raffel, M Lederer, L Pirro, ...
IEEE Transactions on Nanotechnology, 2023
62023
Implication of self-heating effect on device reliability characterization of multi-finger n-MOSFETs on 22FDSOI
T Chohan, Z Zhao, S Lehmann, W Arfaoui, G Bossu, J Trommer, ...
IEEE Transactions on Device and Materials Reliability 22 (3), 387-395, 2022
62022
Impact of BTI stress on RF small signal parameters of FDSOI MOSFETs
T Chohan, S Slesazeck, J Trommer, G Krause, G Bossu, S Lehmann, ...
2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019
42019
IPCEI subcontracts contributing to 22-FDX Add-On Functionalities at GF
S Kolodinski, C Mart, W Weinreich, V Sessi, J Trommer, T Chohan, ...
ESSDERC 2019-49th European Solid-State Device Research Conference (ESSDERC …, 2019
32019
SOTF-BTI-an S-Parameters based on-the-fly Bias Temperature Instability Characterization Method
T Chohan, S Slesazeck, G Krause, J Trommer, S Lehmann, T Mikolajick
2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020
22020
Design of Variation-Tolerant 1F-1T Memory Array for Neuromorphic Computing
MSK Rana, S Thunder, F Müller, N Laleni, Y Raffel, M Lederer, L Pirro, ...
Authorea Preprints, 2023
12023
RF small-signal modeling of HCI degradation in FDSOI NMOSFET using BSIM-IMG
FAV Gonzalez, A Lange, T Chohan, T Mikolajick
2021 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2021
12021
Efficient Characterization Methodology for Low-Frequency Noise Monitoring
L Pirro, T Chohan, P Liebscher, M Juettner, F Holzmueller, R Jain, ...
2024 IEEE 36th International Conference on Microelectronic Test Structures …, 2024
2024
Spike-Time Dependent Plasticity in HfO₂-Based Ferroelectric FET Synapses
SM Rana, S Roy, M Lederer, Y Raffel, L Pirro, T Chohan, K Seidel, S De, ...
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024
2024
Impact of High-K Deposition Process on the Noise Immunity of FeFETs and their Applicability Towards In-Memory-Computing
Y Raffel, R Olivo, M Lederer, L Pirro, V Parmar, T Chohan, D Lehninger, ...
2023 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2023
2023
Reliability Investigations of MOSFETs using RF Small Signal Characterization
T Chohan
2023
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論文 1–20