Transmission-electron diffraction by MeV electron pulses Y Murooka, N Naruse, S Sakakihara, M Ishimaru, J Yang, K Tanimura Applied Physics Letters 98 (25), 2011 | 162 | 2011 |
Methodology of thermoelectric power factor enhancement by controlling nanowire interface T Ishibe, A Tomeda, K Watanabe, Y Kamakura, N Mori, N Naruse, Y Mera, ... ACS applied materials & interfaces 10 (43), 37709-37716, 2018 | 83 | 2018 |
Structural dynamics of laser-irradiated gold nanofilms SL Daraszewicz, Y Giret, N Naruse, Y Murooka, J Yang, DM Duffy, ... Physical review B 88 (18), 184101, 2013 | 72 | 2013 |
100-femtosecond MeV electron source for ultrafast electron diffraction J Yang, K Kan, N Naruse, Y Yoshida, K Tanimura, J Urakawa Radiation Physics and Chemistry 78 (12), 1106-1111, 2009 | 61 | 2009 |
Determination of transient atomic structure of laser-excited materials from time-resolved diffraction data Y Giret, N Naruse, SL Daraszewicz, Y Murooka, J Yang, DM Duffy, ... Applied Physics Letters 103 (25), 2013 | 50 | 2013 |
Thermoelectric power factor enhancement based on carrier transport physics in ultimately phonon-controlled Si nanostructures S Sakane, T Ishibe, T Taniguchi, N Naruse, Y Mera, T Fujita, MM Alam, ... Materials Today Energy 13, 56-63, 2019 | 46 | 2019 |
High thermoelectric power factor realization in Si-rich SiGe/Si superlattices by super-controlled interfaces T Taniguchi, T Ishibe, N Naruse, Y Mera, MM Alam, K Sawano, ... ACS applied materials & interfaces 12 (22), 25428-25434, 2020 | 45 | 2020 |
Giant enhancement of seebeck coefficient by deformation of silicene buckled structure in calcium‐intercalated layered silicene film T Terada, Y Uematsu, T Ishibe, N Naruse, K Sato, TQ Nguyen, ... Advanced Materials Interfaces 9 (1), 2101752, 2022 | 37 | 2022 |
Resistive switching memory performance in oxide hetero-nanocrystals with well-controlled interfaces T Ishibe, Y Maeda, T Terada, N Naruse, Y Mera, E Kobayashi, ... Science and Technology of Advanced Materials 21 (1), 195-204, 2020 | 37 | 2020 |
Self-Assembled Epitaxial Growth of High Density β-FeSi2 Nanodots on Si (001) and Their Spatially Resolved Optical Absorption Properties Y Nakamura, S Amari, N Naruse, Y Mera, K Maeda, M Ichikawa Crystal Growth and Design 8 (8), 3019-3023, 2008 | 36 | 2008 |
Phonon transport in the nano-system of Si and SiGe films with Ge nanodots and approach to ultralow thermal conductivity T Taniguchi, T Terada, Y Komatsubara, T Ishibe, K Konoike, A Sanada, ... Nanoscale 13 (9), 4971-4977, 2021 | 27 | 2021 |
Discrimination of areas infected with coffee leaf rust using a vegetation index N Katsuhama, M Imai, N Naruse, Y Takahashi Remote sensing letters 9 (12), 1186-1194, 2018 | 25 | 2018 |
Direct Imaging of the Surface: Evidence for Large Anisotropy of the Reconstruction TD Mishima, N Naruse, SP Cho, T Kadohira, T Osaka Physical review letters 89 (27), 276105, 2002 | 24 | 2002 |
Structures and electronic states of the InSb {1 1 1} A, B-(2× 2) surfaces T Eguchi, T Miura, SP Cho, T Kadohira, N Naruse, T Osaka Surface science 514 (1-3), 343-349, 2002 | 23 | 2002 |
Fourier-transform photoabsorption spectroscopy of quantum-confinement effects in individual GeSn nanodots N Naruse, Y Mera, Y Nakamura, M Ichikawa, K Maeda Applied Physics Letters 94 (9), 2009 | 22 | 2009 |
A compact ultrafast electron diffractometer with relativistic femtosecond electron pulses J Yang, K Gen, N Naruse, S Sakakihara, Y Yoshida Quantum Beam Science 4 (1), 4, 2020 | 16 | 2020 |
High thermoelectric performance in high crystallinity epitaxial Si films containing silicide nanodots with low thermal conductivity S Sakane, T Ishibe, T Hinakawa, N Naruse, Y Mera, M Mahfuz Alam, ... Applied Physics Letters 115 (18), 2019 | 16 | 2019 |
Resistive switching at the high quality metal/insulator interface in Fe3O4/SiO2/α-FeSi2/Si stacking structure T Ishibe, T Kurokawa, N Naruse, Y Nakamura Applied Physics Letters 113 (14), 2018 | 16 | 2018 |
Fourier transform photoabsorption spectroscopy based on scanning tunneling microscopy N Naruse, Y Mera, Y Fukuzawa, Y Nakamura, M Ichikawa, K Maeda Journal of Applied Physics 102 (11), 2007 | 13 | 2007 |
Response analysis for identifying the origin of photo-modulated current contrasts in scanning tunneling microscopic imaging semiconductor surfaces N Naruse, Y Mera, Y Hayashida, K Maeda Ultramicroscopy 107 (8), 568-574, 2007 | 11 | 2007 |