Xiaobin Zhang
Xiaobin Zhang
Shibaura Institute of Technology
確認したメール アドレス: surface.phys.titech.ac.jp
タイトル
引用先
引用先
A stable lithium-rich surface structure for lithium-rich layered cathode materials
S Kim, W Cho, X Zhang, Y Oshima, JW Choi
Nature communications 7 (1), 1-8, 2016
1052016
Template conversion of covalent organic frameworks into 2D conducting nanocarbons for catalyzing oxygen reduction reaction
Q Xu, Y Tang, X Zhang, Y Oshima, Q Chen, D Jiang
Advanced Materials 30 (15), 1706330, 2018
802018
N-doped defective carbon with trace Co for efficient rechargeable liquid electrolyte-/all-solid-state Zn-air batteries
Z Chen, Q Wang, X Zhang, Y Lei, W Hu, Y Luo, Y Wang
Science Bulletin 63 (9), 548-555, 2018
662018
Variable stars in the open cluster NGC 6811
YP Luo, XB Zhang, CQ Luo, LC Deng, ZQ Luo
New Astronomy 14 (6), 584-589, 2009
252009
Variable stars in the field of the old open cluster NGC 188
XB Zhang, L Deng, X Zhou, Y Xin
Monthly Notices of the Royal Astronomical Society 355 (4), 1369-1377, 2004
252004
NSVS4484038, A contact binary system at the short-period cutoff
XB Zhang, LC Deng, K Wang, ZZ Yan, JF Tian, YJ Peng, Y Pan, ZQ Luo, ...
The Astronomical Journal 148 (3), 40, 2014
192014
Flip-flop Activity on the W UMa-type Binary System HH UMa
K Wang, X Zhang, L Deng, C Luo, Y Luo, J Zhang
The Astrophysical Journal 805 (1), 22, 2015
162015
COF‐Derived N, P Co‐Doped Carbon as a Metal‐Free Catalyst for Highly Efficient Oxygen Reduction Reaction
C Yang, S Maenosono, J Duan, X Zhang
ChemNanoMat 5 (7), 957-963, 2019
102019
Experimental evaluation of spatial resolution in phase maps retrieved by transport of intensity equation
X Zhang, Y Oshima
Microscopy 64 (6), 395-400, 2015
92015
Compressive surface strained atomic-layer Cu 2 O on Cu@ Ag Nanoparticles
X Zhu, H Rong, X Zhang, Q Di, H Shang, B Bai, J Liu, J Liu, M Xu, W Chen, ...
Nano Research 12 (5), 1187-1192, 2019
82019
High-performance quantum dots with synergistic doping and oxide shell protection synthesized by cation exchange conversion of ternary-composition nanoparticles
Q Di, X Zhu, J Liu, X Zhang, H Shang, W Chen, J Liu, H Rong, M Xu, ...
The journal of physical chemistry letters 10 (10), 2606-2615, 2019
72019
Practical procedure for retrieval of quantitative phase map for two-phase interface using the transport of intensity equation
X Zhang, Y Oshima
Ultramicroscopy 158, 49-55, 2015
62015
Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy
X Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, P Wang, PD Nellist, ...
Journal of electron microscopy 61 (3), 159-169, 2012
62012
Interaction study of nitrogen ion beam with silicon
ME Schmidt, X Zhang, Y Oshima, LT Anh, A Yasaka, T Kanzaki, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2017
42017
Three-dimensional characterization of Guinier–Preston zones in an Al–Cu alloy using depth-sectioning technique
T Hamaoka, CY Jao, X Zhang, Y Oshima, M Takeguchi
Microscopy 66 (2), 78-88, 2017
32017
Improvement of depth resolution of ADF-SCEM by deconvolution: effects of electron energy loss and chromatic aberration on depth resolution
X Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, M Tezuka, M Shimojo
Microscopy and Microanalysis 18 (3), 603, 2012
32012
Atomic resolved phase map of monolayer MoS 2 retrieved by spherical aberration-corrected transport of intensity equation
X Zhang, Y Oshima
Journal of Electron Microscopy 65 (5), 422-428, 2016
22016
Scanning confocal electron microscopy (SCEM) combined with deconvolution technique
M Takeguchi, A Hashimoto, K Mitsuishi, X Zhang, M Shimojo, P Wang, ...
Microscopy and Microanalysis 18 (S2), 332, 2012
2012
Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy
X Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, M Shimojo
Microscopy and Microanalysis 16 (S2), 290-291, 2010
2010
Three dimensional characterization of a silica hollow sphere with an iron oxide core by annular dark field scanning confocal electron microscopy
M Takeguchi, M Okuda, A Hashimoto, K Mitsuishi, M Shimojo, X Zhang, ...
Microscopy and Microanalysis 16 (S2), 1836-1837, 2010
2010
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論文 1–20