| Template conversion of covalent organic frameworks into 2D conducting nanocarbons for catalyzing oxygen reduction reaction Q Xu, Y Tang, X Zhang, Y Oshima, Q Chen, D Jiang Advanced Materials 30 (15), 1706330, 2018 | 196 | 2018 |
| A stable lithium-rich surface structure for lithium-rich layered cathode materials S Kim, W Cho, X Zhang, Y Oshima, JW Choi Nature communications 7 (1), 1-8, 2016 | 179 | 2016 |
| N-doped defective carbon with trace Co for efficient rechargeable liquid electrolyte-/all-solid-state Zn-air batteries Z Chen, Q Wang, X Zhang, Y Lei, W Hu, Y Luo, Y Wang Science Bulletin 63 (9), 548-555, 2018 | 127 | 2018 |
| COF‐Derived N, P Co‐Doped Carbon as a Metal‐Free Catalyst for Highly Efficient Oxygen Reduction Reaction C Yang, S Maenosono, J Duan, X Zhang ChemNanoMat 5 (7), 957-963, 2019 | 33 | 2019 |
| Compressive surface strained atomic-layer Cu2O on Cu@Ag nanoparticles X Zhu, H Rong, X Zhang, Q Di, H Shang, B Bai, J Liu, J Liu, M Xu, W Chen, ... Nano Research 12, 1187-1192, 2019 | 20 | 2019 |
| High-performance quantum dots with synergistic doping and oxide shell protection synthesized by cation exchange conversion of ternary-composition nanoparticles Q Di, X Zhu, J Liu, X Zhang, H Shang, W Chen, J Liu, H Rong, M Xu, ... The Journal of Physical Chemistry Letters 10 (10), 2606-2615, 2019 | 18 | 2019 |
| Origin of nonlinear current-voltage curves for suspended zigzag edge graphene nanoribbons C Liu, J Zhang, M Muruganathan, H Mizuta, Y Oshima, X Zhang Carbon 165, 476-483, 2020 | 13 | 2020 |
| Experimental evaluation of spatial resolution in phase maps retrieved by transport of intensity equation X Zhang, Y Oshima Microscopy 64 (6), 395-400, 2015 | 10 | 2015 |
| Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy X Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, P Wang, PD Nellist, ... Journal of electron microscopy 61 (3), 159-169, 2012 | 8 | 2012 |
| Interaction study of nitrogen ion beam with silicon ME Schmidt, X Zhang, Y Oshima, A Yasaka, T Kanzaki, M Muruganathan, ... Journal of Vacuum Science & Technology B 35 (3), 2017 | 7 | 2017 |
| Three-dimensional characterization of Guinier–Preston zones in an Al–Cu alloy using depth-sectioning technique T Hamaoka, CY Jao, X Zhang, Y Oshima, M Takeguchi Microscopy 66 (2), 78-88, 2017 | 6 | 2017 |
| Practical procedure for retrieval of quantitative phase map for two-phase interface using the transport of intensity equation X Zhang, Y Oshima Ultramicroscopy 158, 49-55, 2015 | 6 | 2015 |
| Improvement of depth resolution of ADF-SCEM by deconvolution: effects of electron energy loss and chromatic aberration on depth resolution X Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, M Tezuka, M Shimojo Microscopy and Microanalysis 18 (3), 603-611, 2012 | 3 | 2012 |
| In-situ electrical conductance measurement of suspended ultra-narrow graphene nanoribbons observed via transmission electron microscopy C Liu, J Zhang, X Zhang, M Muruganathan, H Mizuta, Y Oshima Nanotechnology 32 (2), 025710, 2020 | 2 | 2020 |
| Atomic resolved phase map of monolayer MoS 2 retrieved by spherical aberration-corrected transport of intensity equation X Zhang, Y Oshima Journal of Electron Microscopy 65 (5), 422-428, 2016 | 2 | 2016 |
| Atomic Resolved Phase Map of MoS2 Monolayer Sheet Retrieved by Spherical Aberration Corrected Transport of Intensity Equation X Zhang, Y Oshima Microscopy and Microanalysis 21 (S3), 429-430, 2015 | | 2015 |
| Scanning confocal electron microscopy (SCEM) combined with deconvolution technique M Takeguchi, A Hashimoto, K Mitsuishi, X Zhang, M Shimojo, P Wang, ... Microscopy and Microanalysis 18 (S2), 332-333, 2012 | | 2012 |
| Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy X Zhang, M Takeguchi, A Hashimoto, K Mitsuishi, M Shimojo Microscopy and Microanalysis 16 (S2), 290-291, 2010 | | 2010 |
| Three dimensional characterization of a silica hollow sphere with an iron oxide core by annular dark field scanning confocal electron microscopy M Takeguchi, M Okuda, A Hashimoto, K Mitsuishi, M Shimojo, X Zhang, ... Microscopy and Microanalysis 16 (S2), 1836-1837, 2010 | | 2010 |
Yoshifumi OshimaJapan Advanced Institute of Science and Technology (JAIST)確認したメール アドレス: jaist.ac.jp
