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Dae Hwan Kim
Dae Hwan Kim
未知所在单位机构
在 kookmin.ac.kr 的电子邮件经过验证
标题
引用次数
引用次数
年份
High performance amorphous oxide thin film transistors with self-aligned top-gate structure
JC Park, SW Kim, SI Kim, H Yin, JH Hur, SH Jeon, SH Park, IH Song, ...
2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009
6222009
Extraction of subgap density of states in amorphous InGaZnO thin-film transistors by using multifrequency capacitance–voltage characteristics
S Lee, S Park, S Kim, Y Jeon, K Jeon, JH Park, J Park, I Song, CJ Kim, ...
IEEE electron device letters 31 (3), 231-233, 2010
1822010
Highly stable transparent amorphous oxide semiconductor thinfilm transistors having doublestacked active layers
JC Park, S Kim, S Kim, C Kim, I Song, Y Park, UI Jung, DH Kim, JS Lee
Advanced Materials 22 (48), 5512-5516, 2010
1632010
Transparent, flexible strain sensor based on a solution-processed carbon nanotube network
J Lee, M Lim, J Yoon, MS Kim, B Choi, DM Kim, DH Kim, I Park, SJ Choi
ACS applied materials & interfaces 9 (31), 26279-26285, 2017
1572017
Traps in AlGaN∕ GaN∕ SiC heterostructures studied by deep level transient spectroscopy
ZQ Fang, DC Look, DH Kim, I Adesida
Applied Physics Letters 87 (18), 2005
1352005
Effect of channel thickness on density of states in amorphous InGaZnO thin film transistor
SY Lee, DH Kim, E Chong, YW Jeon, DH Kim
Applied Physics Letters 98 (12), 2011
1342011
Origin of the improved mobility and photo-bias stability in a double-channel metal oxide transistor
HY Jung, Y Kang, AY Hwang, CK Lee, S Han, DH Kim, JU Bae, WS Shin, ...
Scientific reports 4 (1), 3765, 2014
1312014
Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics
K Jeon, C Kim, I Song, J Park, S Kim, S Kim, Y Park, JH Park, S Lee, ...
Applied Physics Letters 93 (18), 2008
1252008
Instability of amorphous oxide semiconductors via carriermediated structural transition between disorder and peroxide state
HH Nahm, YS Kim, DH Kim
physica status solidi (b) 249 (6), 1277-1281, 2012
1242012
Study on the photoresponse of amorphous In–Ga–Zn–O and zinc oxynitride semiconductor devices by the extraction of sub-gap-state distribution and device simulation
JT Jang, J Park, BD Ahn, DM Kim, SJ Choi, HS Kim, DH Kim
ACS applied materials & interfaces 7 (28), 15570-15577, 2015
932015
Synaptic plasticity selectively activated by polarization-dependent energy-efficient ion migration in an ultrathin ferroelectric tunnel junction
C Yoon, JH Lee, S Lee, JH Jeon, JT Jang, DH Kim, YH Kim, BH Park
Nano Letters 17 (3), 1949-1955, 2017
922017
Improvement in both mobility and bias stability of ZnSnO transistors by inserting ultra-thin InSnO layer at the gate insulator/channel interface
JI Kim, K Hwan Ji, H Yoon Jung, S Yeob Park, R Choi, M Jang, H Yang, ...
Applied Physics Letters 99 (12), 2011
862011
ZnO composite nanolayer with mobility edge quantization for multi-value logic transistors
L Lee, J Hwang, JW Jung, J Kim, HI Lee, S Heo, M Yoon, S Choi, ...
Nature communications 10 (1), 1998, 2019
822019
Subgap density-of-states-based amorphous oxide thin film transistor simulator (DeAOTS)
YW Jeon, S Kim, S Lee, DM Kim, DH Kim, J Park, CJ Kim, I Song, Y Park, ...
IEEE Transactions on Electron Devices 57 (11), 2988-3000, 2010
822010
Simulation study on discrete charge effects of SiNW biosensors according to bound target position using a 3D TCAD simulator
IY Chung, H Jang, J Lee, H Moon, SM Seo, DH Kim
Nanotechnology 23 (6), 065202, 2012
802012
Density of states-based design of metal oxide thin-film transistors for high mobility and superior photostability
HS Kim, JS Park, HK Jeong, KS Son, TS Kim, JB Seon, E Lee, JG Chung, ...
ACS applied materials & interfaces 4 (10), 5416-5421, 2012
752012
Amorphous InGaZnO thin-film transistors—Part I: Complete extraction of density of states over the full subband-gap energy range
Y Kim, M Bae, W Kim, D Kong, HK Jung, H Kim, S Kim, DM Kim, DH Kim
IEEE transactions on electron devices 59 (10), 2689-2698, 2012
752012
Silicon single-electron transistors with sidewall depletion gates and their application to dynamic single-electron transistor logic
DH Kim, SK Sung, KR Kim, JD Lee, BG Park, BH Choi, SW Hwang, D Ahn
IEEE Transactions on Electron Devices 49 (4), 627-635, 2002
752002
Comprehensive evaluation of early retention (fast charge loss within a few seconds) characteristics in tube-type 3-D NAND flash memory
B Choi, SH Jang, J Yoon, J Lee, M Jeon, Y Lee, J Han, J Lee, DM Kim, ...
2016 IEEE Symposium on VLSI Technology, 1-2, 2016
742016
Cation composition effects on electronic structures of In-Sn-Zn-O amorphous semiconductors
JY Noh, H Kim, HH Nahm, YS Kim, D Hwan Kim, BD Ahn, JH Lim, ...
Journal of Applied Physics 113 (18), 2013
742013
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