| Temperature accelerated life test on commercial concentrator III–V triple‐junction solar cells and reliability analysis as a function of the operating temperature P Espinet‐González, C Algora, N Núñez, V Orlando, M Vázquez, ... Progress in Photovoltaics: Research and Applications 23 (5), 559-569, 2015 | 68 | 2015 |
| Reliability analysis of temperature step-stress tests on III–V high concentrator solar cells JR González, M Vázquez, N Núñez, C Algora, I Rey-Stolle, B Galiana Microelectronics Reliability 49 (7), 673-680, 2009 | 61 | 2009 |
| Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests M Vázquez, N Núñez, E Nogueira, A Borreguero Microelectronics Reliability 50 (9-11), 1559-1562, 2010 | 57 | 2010 |
| Evaluation of AlGaInP LEDs reliability based on accelerated tests E Nogueira, M Vázquez, N Núñez Microelectronics Reliability 49 (9-11), 1240-1243, 2009 | 51 | 2009 |
| Evaluation of the reliability of high concentrator GaAs solar cells by means of temperature accelerated aging tests N Núñez, JR González, M Vázquez, C Algora, P Espinet Progress in Photovoltaics: Research and Applications 21 (6), 1104_1113, 2012 | 43 | 2012 |
| High-power UV-LED degradation: Continuous and cycled working condition influence FJ Arques-Orobon, N Nuñez, M Vazquez, C Segura-Antunez, ... Solid-State Electronics 111, 111-117, 2015 | 33 | 2015 |
| Real‐time reliability test for a CPV module based on a power degradation model JR González, M Vázquez, C Algora, N Núñez Progress in Photovoltaics: Research and Applications 19 (1), 113-122, 2011 | 23 | 2011 |
| Novel accelerated testing method for III-V concentrator solar cells N Núñez, M Vázquez, JR González, C Algora, P Espinet Microelectronics Reliability 50 (9-11), 1880-1883, 2010 | 23 | 2010 |
| Degradation mechanism analysis in temperature stress tests on III–V ultra-high concentrator solar cells using a 3D distributed model P Espinet, C Algora, JR González, N Núñez, M Vázquez Microelectronics Reliability 50 (9-11), 1875-1879, 2010 | 19 | 2010 |
| Failure analysis on lattice matched GaInP/Ga (In) As/Ge commercial concentrator solar cells after temperature accelerated life tests V Orlando, M Gabás, B Galiana, P Espinet‐González, S Palanco, ... Progress in Photovoltaics: Research and Applications 25 (1), 97-112, 2017 | 17 | 2017 |
| Instrumentation for accelerated life tests of concentrator solar cells N Núñez, M Vázquez, JR González, FJ Jiménez, J Bautista Review of Scientific Instruments 82 (2), 2011 | 14 | 2011 |
| Warranty assessment of photovoltaic modules based on a degradation probabilistic model F Prieto‐Castrillo, N Núñez, M Vázquez Progress in Photovoltaics: Research and Applications 28 (12), 1308-1321, 2020 | 13 | 2020 |
| Reliability of commercial triple junction concentrator solar cells under real climatic conditions and its influence on electricity cost M Vazquez, J Tamayo‐Arriola, V Orlando, N Nunez, O Alburquerque, ... Progress in Photovoltaics: Research and Applications 25 (11), 905-918, 2017 | 13 | 2017 |
| Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT) P Espinet-González, C Algora, N Núñez, V Orlando, M Vázquez, ... AIP Conference Proceedings 1556 (1), 222-225, 2013 | 13 | 2013 |
| Strategy for certified reliability analysis of III-V high concentration solar cells JR González, C Algora, I Rey-Stolle, R Alvarez, M Vázquez, N Nunez, ... 2006 IEEE 4th World Conference on Photovoltaic Energy Conference 1, 702-705, 2006 | 13 | 2006 |
| Semi‐quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers N Nunez, M Vazquez, V Orlando, P Espinet‐González, C Algora Progress in Photovoltaics: Research and Applications 23 (12), 1857-1866, 2015 | 11 | 2015 |
| Estimation of activation energy and reliability figures of space lattice-matched GaInP/Ga (In) As/Ge triple junction solar cells from Temperature Accelerated Life Tests N Nuñez, M Vazquez, L Barrutia, J Bautista, I Lombardero, JC Zamorano, ... Solar Energy Materials and Solar Cells 230, 111211, 2021 | 10 | 2021 |
| UV LEDs reliability tests for fluoro-sensing sensor application FJ Arques-Orobon, N Núñez, M Vázquez, V González-Posadas Microelectronics Reliability 54 (9-10), 2154-2158, 2014 | 10 | 2014 |
| Lifetime analysis of commercial 3 w uv-a led FJ Arques-Orobon, M Vazquez, N Nuñez Crystals 10 (12), 1083, 2020 | 7 | 2020 |
| Temperature Accelerated Life Test and Failure Analysis on Upright Metamorphic Ga0.37In0.63P/Ga0.83In0.17As/Ge Triple Junction Solar Cells V Orlando, I Lombardero, M Gabás, N Nuñez, M Vázquez, ... Progress in Photovoltaics: Research and Applications 28 (2), 148-166, 2020 | 7 | 2020 |
Manuel VazquezProfesor Titular. Universidad Politécnica de MadridVerified email at upm.es
